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IEEE journal of solid-state circuits, 2012-02, Vol.47 (2), p.454-463
2012
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IEEE transactions on instrumentation and measurement, 2009-07, Vol.58 (7), p.2264-2274
2009
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IEEE transactions on instrumentation and measurement, 2012-02, Vol.61 (2), p.513-520
2012
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IEEE transactions on circuits and systems. II, Express briefs, 2009-11, Vol.56 (11), p.825-829
2009
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IEEE transactions on circuits and systems. II, Express briefs, 2008-08, Vol.55 (8), p.728-732
2008
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IEEE journal of solid-state circuits, 2008-02, Vol.43 (2), p.361-370
2008
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IEEE journal of solid-state circuits, 2008-02, Vol.43 (2), p.361-370
2008
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Tumori, 2017-05, Vol.103 (3), p.279-285
2017
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IEEE journal of solid-state circuits, 2023-01, Vol.58 (1), p.1-12
2023
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SID International Symposium Digest of technical papers, 2020-08, Vol.51 (1), p.603-606
2020
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Analog integrated circuits and signal processing, 2010-04, Vol.63 (1), p.101-106
2010
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2022 IEEE International Solid- State Circuits Conference (ISSCC), 2022, Vol.65, p.504-506
2022
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Analog integrated circuits and signal processing, 2010-08, Vol.64 (2), p.173-182
2010
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Analog integrated circuits and signal processing, 2010-08, Vol.64 (2), p.173-182
2010
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International journal of electronics, 2010-06, Vol.97 (6), p.663-676
2010
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IEEE transactions on instrumentation and measurement, 2009-01, Vol.58 (7)
2009
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IEEE journal of solid-state circuits, 2008-02, Vol.43 (2), p.361-370
2008
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IEEE transactions on circuits and systems. II, Express briefs, 2009-01, Vol.56 (11)
2009
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4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008), 2008, p.75-78
2008
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2009 IEEE 8th International Conference on ASIC, 2009, p.447-450
2009
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2008 3rd International Design and Test Workshop, 2008, p.104-108
2008
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Annals of the New York Academy of Sciences, 1994-10, Vol.739 (1), p.334-336
1994
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Metals (Basel ), 2024-06, Vol.14 (6), p.618
2024
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