UB Paderborn / Katalog / Suche / in CDI

XPS comparative study of ceria/zirconia mixed oxides: powders and thin film characterisation

Journal of electron spectroscopy and related phenomena, 1998-03, Vol.88, p.951-956

1998

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C 60/metal surfaces: adsorption and decomposition

Surface science, 1999-08, Vol.437 (1), p.249-260

1999

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Investigation of metal–GaN and metal–AlGaN contacts by XPS depth profiles and by electrical measurements

Journal of crystal growth, 2001-09, Vol.230 (3), p.558-563

2001

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High-resolution electron-energy-loss spectroscopy of thin films of C60 on Si(100)

Physical review letters, 1991-10, Vol.67 (16), p.2171-2174

1991

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XPS/AFM study of the PET surface modified by oxygen and carbon dioxide plasmas: Al/PET adhesion

Journal of adhesion science and technology, 1998-01, Vol.12 (9), p.999-1023

1998

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Etching and functionalization of a fluorocarbon polymer by UV laser treatment

Applied surface science, 1996-04, Vol.96-98 (1-4), p.586-590

1996

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Polymerization of N-Vinyl-2-Pyrrolidone under Anodic Polarization: Characterization of the Modified Electrode and Study of the Grafting Mechanism

Langmuir, 1997-09, Vol.13 (18), p.4898-4905

1997

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The aluminium/sapphire interface formation at high temperature: an AES and LEED study

Surface science, 1995-01, Vol.323 (1), p.175-187

1995

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Photoemission study of pristine and potassium intercalated benzylic amide catenane films

Surface science, 2001-03, Vol.474 (1), p.37-46

2001

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Self-assembly of mechanically interlocked and threaded rings: a HREELS and XPS study of thiol-functionalised catenane and rotaxane molecules on Au(111)

Surface science, 2000-05, Vol.454, p.112-117

2000

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Synthesis and characterization of conductive titanium monoxide films. Diffusion of silicon in titanium monoxide films

Vacuum, 1998-10, Vol.51 (2), p.153-155

1998

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Effect of potassium intercalation on the electronic and vibrational properties of benzylic amide [2]catenane films

Surface science, 2002-08, Vol.515 (1), p.45-52

2002

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STM study of the Te/Si(100) interface

Applied surface science, 1999-04, Vol.142 (1), p.475-480

1999

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Formation of nanotubes in low pressure hydrocarbon flames

Carbon (New York), 1996, Vol.34 (3), p.427-429

1996

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Vibrational study of C60 overlayers on H/Si(111)-(1×1)

Surface science, 1996, Vol.368 (1-3), p.330-336

1996

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Growth and characterization of benzylic amide [2]catenane thin films

Thin solid films, 1998-08, Vol.327, p.321-325

1998

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XPS study of the PET film surface modified by CO2 plasma: effects of the plasma parameters and ageing

Journal of adhesion science and technology, 1997-01, Vol.11 (5), p.735-751

1997

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Study of the CdTe/As/Si(111) interface by scanning tunneling microscopy and X-ray photoelectron spectroscopy

Surface science, 2000-05, Vol.454, p.818-822

2000

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C60/metal surfaces: adsorption and decomposition

Surface science, 1999-08, Vol.437 (1-2), p.249-260

1999

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Structural origin of surface morphological modifications developed on poly(ethylene terephthalate) by excimer laser photoablation

Journal of applied physics, 1988-07, Vol.64 (1), p.365-370

1988

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Identification of the adsorption sites of molecular oxygen on Si(111) using XPS

Progress in surface science, 1995-12, Vol.50 (1), p.315-324

1995

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The Al/Al2O3 Interface Formation as Studied by Electron Spectroscopies

Surface science, 1990-09, Vol.235 (1), p.5-14

1990

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The aluminium-polyimide interface: an electron-induced vibrational spectroscopy approach

The Journal of chemical physics, 1988-03, Vol.88 (5), p.3353-3362

1988

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Self-assembled monolayers of alkanethiols on nickel surfaces for low level electrical contact applications

IEEE transactions on components and packaging technologies, 1999-03, Vol.22 (1), p.79-84

1999

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Chemical interactions at the interface between aluminium nitride and iron oxide determined by XPS

Surface science, 1995-06, Vol.330 (1), p.75-85

1995

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XPS comparative study of ceria/zirconia mixed oxides: powders and thin film characterisation

C 60/metal surfaces: adsorption and decomposition

Investigation of metal–GaN and metal–AlGaN contacts by XPS depth profiles and by electrical measurements

High-resolution electron-energy-loss spectroscopy of thin films of C60 on Si(100)

XPS/AFM study of the PET surface modified by oxygen and carbon dioxide plasmas: Al/PET adhesion

Etching and functionalization of a fluorocarbon polymer by UV laser treatment

Polymerization of N-Vinyl-2-Pyrrolidone under Anodic Polarization: Characterization of the Modified Electrode and Study of the Grafting Mechanism

The aluminium/sapphire interface formation at high temperature: an AES and LEED study

Photoemission study of pristine and potassium intercalated benzylic amide catenane films

Self-assembly of mechanically interlocked and threaded rings: a HREELS and XPS study of thiol-functionalised catenane and rotaxane molecules on Au(111)

Synthesis and characterization of conductive titanium monoxide films. Diffusion of silicon in titanium monoxide films

Effect of potassium intercalation on the electronic and vibrational properties of benzylic amide [2]catenane films

STM study of the Te/Si(100) interface

Formation of nanotubes in low pressure hydrocarbon flames

Vibrational study of C60 overlayers on H/Si(111)-(1×1)

Growth and characterization of benzylic amide [2]catenane thin films

XPS study of the PET film surface modified by CO2 plasma: effects of the plasma parameters and ageing

Study of the CdTe/As/Si(111) interface by scanning tunneling microscopy and X-ray photoelectron spectroscopy

C60/metal surfaces: adsorption and decomposition

Structural origin of surface morphological modifications developed on poly(ethylene terephthalate) by excimer laser photoablation

Identification of the adsorption sites of molecular oxygen on Si(111) using XPS

The Al/Al2O3 Interface Formation as Studied by Electron Spectroscopies

The aluminium-polyimide interface: an electron-induced vibrational spectroscopy approach

Self-assembled monolayers of alkanethiols on nickel surfaces for low level electrical contact applications

Chemical interactions at the interface between aluminium nitride and iron oxide determined by XPS

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