UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

[OP.LB03.04] FIRST IN MAN MEASUREMENT OF ARTERIAL STIFFNESS USING A CONNECTED BATHROOM SCALE: CALIBRATION AGAINST SPHYGMOCOR

Journal of hypertension, 2016-09, Vol.34 Suppl 2 - ESH 2016 Abstract Book (Supplement 2), p.e112-e112

2016

Volltextzugriff (PDF)

Culture médiatique et presse numérisée: Médiasphère des feuilletons-nouvelles de Marie Aycard (1794-1859)

Buard, Jean-Luc

2019

Volltextzugriff (PDF)

Experimental Demonstration of Pattern Influence on DRAM SEU and SEFI Radiation Sensitivities

IEEE transactions on nuclear science, 2011-06, Vol.58 (3), p.1032-1039

2011

Volltextzugriff (PDF)

Microprocessor Soft Error Rate Prediction Based on Cache Memory Analysis

IEEE transactions on nuclear science, 2012-08, Vol.59 (4), p.980-987

2012

Volltextzugriff (PDF)

Neutron-induced SEU in bulk SRAMs in terrestrial environment: Simulations and experiments

IEEE transactions on nuclear science, 2004-12, Vol.51 (6), p.3435-3441

2004

Volltextzugriff (PDF)

Laser Validation of a Non-Destructive Test Methodology for the Radiation Sensitivity Assessment of Power Devices

IEEE transactions on nuclear science, 2011-06, Vol.58 (3), p.813-819

2011

Volltextzugriff (PDF)

Use of Laser to Explain Heavy Ion Induced SEFIs in SDRAMs

IEEE transactions on nuclear science, 2010-02, Vol.57 (1), p.272-278

2010

Volltextzugriff (PDF)

Characterization of Single-Event Burnout in Power MOSFET Using Backside Laser Testing

IEEE transactions on nuclear science, 2006-12, Vol.53 (6), p.3145-3152

2006

Volltextzugriff (PDF)

Probing SET Sensitive Volumes in Linear Devices Using Focused Laser Beam at Different Wavelengths

IEEE transactions on nuclear science, 2008-08, Vol.55 (4), p.2007-2012

2008

Volltextzugriff (PDF)

Analysis of Quasi-Monoenergetic Neutron and Proton SEU Cross Sections for Terrestrial Applications

IEEE transactions on nuclear science, 2006-08, Vol.53 (4), p.1890-1896

2006

Volltextzugriff (PDF)

Backside SEU laser testing for commercial off-the-shelf SRAMs

IEEE transactions on nuclear science, 2002-12, Vol.49 (6), p.2977-2983

2002

Volltextzugriff (PDF)

Neutron Induced Energy Deposition in a Silicon Diode

IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.3146-3150

2008

Volltextzugriff (PDF)

Effects of beam spot size on the correlation between laser and heavy ion SEU testing

IEEE transactions on nuclear science, 2004-12, Vol.51 (6), p.3708-3715

2004

Volltextzugriff (PDF)

High-Energy Heavy Ion Irradiation-Induced Structural Modifications: A Potential Physical Understanding of Latent Defects

IEEE transactions on nuclear science, 2008-12, Vol.55 (6), p.2970-2974

2008

Volltextzugriff (PDF)

Neutron-induced SEU in SRAMs: Simulations with n-Si and n-O interactions

IEEE transactions on nuclear science, 2005-12, Vol.52 (6), p.2332-2339

2005

Volltextzugriff (PDF)

DASIE Analytical Version: A Predictive Tool for Neutrons, Protons and Heavy Ions Induced SEU Cross Section

IEEE transactions on nuclear science, 2006-08, Vol.53 (4), p.1876-1882

2006

Volltextzugriff (PDF)

Laser Mapping of SRAM Sensitive Cells: A Way to Obtain Input Parameters for DASIE Calculation Code

IEEE transactions on nuclear science, 2006-08, Vol.53 (4), p.1863-1870

2006

Volltextzugriff (PDF)

Sensitive Volume and Triggering Criteria of SEB in Classic Planar VDMOS

IEEE transactions on nuclear science, 2010-08, Vol.57 (4), p.1900-1907

2010

Volltextzugriff (PDF)

Layout-Aware Multi-Cell Upsets Effects Analysis on TMR Circuits Implemented on SRAM-Based FPGAs

IEEE transactions on nuclear science, 2011-10, Vol.58 (5), p.2325-2332

2011

Volltextzugriff (PDF)

Low-cost backside laser test method to pre-characterize the COTS IC’s sensitivity to Single Event Effects

Microelectronics and reliability, 2003-09, Vol.43 (9), p.1615-1619

2003

Volltextzugriff (PDF)

Neutron-induced SEU in bulk and SOI SRAMS in terrestrial environment

2004 IEEE International Reliability Physics Symposium. Proceedings, 2004, p.677-678

2004

Volltextzugriff (PDF)

Novel DRAM mitigation technique

2009 15th IEEE International On-Line Testing Symposium, 2009, p.109-113

2009

Volltextzugriff (PDF)

Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks?

13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007, p.63-70

2007

Volltextzugriff (PDF)

Determination of the deposited energy in a silicon volumeby n - Si nuclear interaction

Journal of applied physics, 2006-06, Vol.99 (12), p.124916-124916-5

2006

Volltextzugriff (PDF)

Determination of the deposited energy in a silicon volume by n-Si nuclear interaction

Journal of applied physics, 2006-06, Vol.99 (12), p.124916.1-124916.5

2006

Volltextzugriff (PDF)

1 – 25 von 104

Suche als RSS-Feed

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(60)
Mit Volltextzugriff
(86)

Publikationsform

Sprache

Erscheinungsjahr

n.n

Thema

Science & Technology
(36)
Technology
(27)
Engineering
(24)
Engineering, Electrical & Electronic
(24)
Nuclear Science & Technology
(19)
Random Access Memory
(19)
Neutrons
(15)
Single Event Upset
(15)
Engineering Sciences
(14)
Aerospace Electronics
(12)
Silicon
(12)
Electronics
(11)
Error Analysis
(11)
Life Sciences & Biomedicine
(10)
Protons
(10)
Testing
(10)
Lasers
(9)
Humans
(8)
Laser Theory
(8)
Life Sciences
(8)

15 weitere anzeigen...

Weniger anzeigen...

Zeitschrift / Serie

5 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

[OP.LB03.04] FIRST IN MAN MEASUREMENT OF ARTERIAL STIFFNESS USING A CONNECTED BATHROOM SCALE: CALIBRATION AGAINST SPHYGMOCOR

Culture médiatique et presse numérisée: Médiasphère des feuilletons-nouvelles de Marie Aycard (1794-1859)

Experimental Demonstration of Pattern Influence on DRAM SEU and SEFI Radiation Sensitivities

Microprocessor Soft Error Rate Prediction Based on Cache Memory Analysis

Neutron-induced SEU in bulk SRAMs in terrestrial environment: Simulations and experiments

Laser Validation of a Non-Destructive Test Methodology for the Radiation Sensitivity Assessment of Power Devices

Use of Laser to Explain Heavy Ion Induced SEFIs in SDRAMs

Characterization of Single-Event Burnout in Power MOSFET Using Backside Laser Testing

Probing SET Sensitive Volumes in Linear Devices Using Focused Laser Beam at Different Wavelengths

Analysis of Quasi-Monoenergetic Neutron and Proton SEU Cross Sections for Terrestrial Applications

Backside SEU laser testing for commercial off-the-shelf SRAMs

Neutron Induced Energy Deposition in a Silicon Diode

Effects of beam spot size on the correlation between laser and heavy ion SEU testing

High-Energy Heavy Ion Irradiation-Induced Structural Modifications: A Potential Physical Understanding of Latent Defects

Neutron-induced SEU in SRAMs: Simulations with n-Si and n-O interactions

DASIE Analytical Version: A Predictive Tool for Neutrons, Protons and Heavy Ions Induced SEU Cross Section

Laser Mapping of SRAM Sensitive Cells: A Way to Obtain Input Parameters for DASIE Calculation Code

Sensitive Volume and Triggering Criteria of SEB in Classic Planar VDMOS

Layout-Aware Multi-Cell Upsets Effects Analysis on TMR Circuits Implemented on SRAM-Based FPGAs

Low-cost backside laser test method to pre-characterize the COTS IC’s sensitivity to Single Event Effects

Neutron-induced SEU in bulk and SOI SRAMS in terrestrial environment

Novel DRAM mitigation technique

Latchup effect in CMOS IC: a solution for crypto-processors protection against fault injection attacks?

Determination of the deposited energy in a silicon volumeby n - Si nuclear interaction

Determination of the deposited energy in a silicon volume by n-Si nuclear interaction

Suchergebnisse filtern