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Fundamentals of Mesostructuring Through Evaporation-Induced Self-Assembly

Advanced functional materials, 2004-04, Vol.14 (4), p.309-322

2004

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Highly Organized Mesoporous Titania Thin Films Showing Mono-Oriented 2D Hexagonal Channels

Advanced materials (Weinheim), 2001-07, Vol.13 (14), p.1085-1090

2001

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Latex-Templated Silica Films: Tailoring Porosity to Get a Stable Low-Refractive Index

Chemistry of materials, 2010-05, Vol.22 (9), p.2822-2828

2010

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Change of TO and LO mode frequency of evaporated SiO2 films during aging in air

Journal of applied physics, 2000-05, Vol.87 (10), p.7303-7309

2000

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Optical properties of sputtered hydrogenated amorphous carbon

Journal of non-crystalline solids, 2000-05, Vol.266, p.778-782

2000

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Determination of pore size distribution in thin organized mesoporous silica films by spectroscopic ellipsometry in the visible and infrared range

Thin solid films, 2004, Vol.447, p.46-50

2004

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Mesoporous 3D-hexagonal organosilicate films: Post-synthesis grafting vs. direct synthesis

Thin solid films, 2006-01, Vol.495 (1), p.175-179

2006

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A first insight in the mechanisms involved in the self-assembly of 2D-hexagonal templated SiO2 and TiO2 mesostructured films during dip-coating

Journal of sol-gel science and technology, 2003, Vol.26 (1-3), p.561-565

2003

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Reactivity of 3D hexagonal mesoporous silica films to environment studied by infrared ellipsometry

Thin solid films, 2004, Vol.447, p.51-55

2004

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An in situ study of mesostructured CTAB-silica film formation using infrared ellipsometry: evolution of water content

Thin solid films, 2004-05, Vol.455, p.656-660

2004

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Infrared ellipsometry study of evaporated SiO2 films: Matrix densification, porosity, water sorption

Journal of applied physics, 1997-08, Vol.82 (3), p.1330-1335

1997

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Description of the porosity of inhomogeneous porous low- k films using solvent adsorption studied by spectroscopic ellipsometry in the visible range

Thin solid films, 2004-05, Vol.455, p.366-369

2004

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Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity

Thin solid films, 2000-12, Vol.377-378, p.57-61

2000

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An in Situ Study of Mesostructured CTAB−Silica Film Formation during Dip Coating Using Time-Resolved SAXS and Interferometry Measurements

Chemistry of materials, 2002-02, Vol.14 (2), p.931-939

2002

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Ordered mesoporous organosilica films

Studies in Surface Science and Catalysis, 2005, Vol.156, p.327-334

2005

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Ellipsometric investigation of the Si/SiO2 interface formation for application to highly reflective dielectric mirrors

Thin solid films, 2000-12, Vol.377-378, p.62-67

2000

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Mesoporous silica films with varying porous volume fraction: Direct correlation between ortho-positronium annihilation decay and escape yield into vacuum

Applied physics letters, 2009-09, Vol.95 (12)

2009

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Visible and infrared ellipsometry study of ion assisted SiO2 films

Thin solid films, 1998-02, Vol.313-314, p.676-681

1998

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Reactivity of 3D hexagonal mesoporous silica films to environment studied by infrared ellipsometry

Thin solid films, 2003-12

Brunet-Bruneau, A

2003

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Mesoporous silica films with varying porous volume fraction:Direct correlation between ortho-positronium annihilation decayand escape yield into vacuum

Applied physics letters, 2009-09, Vol.95 (12), p.124103-124103-3

2009

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SiO 2 – TiO 2 interfaces studied by ellipsometry and x-ray photoemission spectroscopy

Journal of applied physics, 2002-08, Vol.92 (4), p.1922-1928

2002

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SiO2-TiO2 interfaces studied by ellipsometry and X-ray photoemission spectroscopy

Journal of applied physics, 2002, Vol.92 (4)

2002

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Adsorption and Desorption Isotherms at Ambient Temperature Obtained by Ellipsometric Porosimetry to Probe Micropores in Ordered Mesoporous Silica Films

Adsorption : journal of the International Adsorption Society, 2005-01, Vol.11 (S1), p.195-199

2005

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Adsorption and Desorption Isotherms at Ambient Temperature Obtained by Ellipsometric Porosimetry to Probe Micropores in Ordered Mesoporous Silica

Adsorption : journal of the International Adsorption Society, 2005, Vol.11 (1)

2005

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Highly ordered CTAB-templated organosilicate films

Journal of materials chemistry, 2005-01, Vol.15 (44), p.4741-4745

2005

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Fundamentals of Mesostructuring Through Evaporation-Induced Self-Assembly

Highly Organized Mesoporous Titania Thin Films Showing Mono-Oriented 2D Hexagonal Channels

Latex-Templated Silica Films: Tailoring Porosity to Get a Stable Low-Refractive Index

Change of TO and LO mode frequency of evaporated SiO2 films during aging in air

Optical properties of sputtered hydrogenated amorphous carbon

Determination of pore size distribution in thin organized mesoporous silica films by spectroscopic ellipsometry in the visible and infrared range

Mesoporous 3D-hexagonal organosilicate films: Post-synthesis grafting vs. direct synthesis

A first insight in the mechanisms involved in the self-assembly of 2D-hexagonal templated SiO2 and TiO2 mesostructured films during dip-coating

Reactivity of 3D hexagonal mesoporous silica films to environment studied by infrared ellipsometry

An in situ study of mesostructured CTAB-silica film formation using infrared ellipsometry: evolution of water content

Infrared ellipsometry study of evaporated SiO2 films: Matrix densification, porosity, water sorption

Description of the porosity of inhomogeneous porous low- k films using solvent adsorption studied by spectroscopic ellipsometry in the visible range

Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity

An in Situ Study of Mesostructured CTAB−Silica Film Formation during Dip Coating Using Time-Resolved SAXS and Interferometry Measurements

Ordered mesoporous organosilica films

Ellipsometric investigation of the Si/SiO2 interface formation for application to highly reflective dielectric mirrors

Mesoporous silica films with varying porous volume fraction: Direct correlation between ortho-positronium annihilation decay and escape yield into vacuum

Visible and infrared ellipsometry study of ion assisted SiO2 films

Reactivity of 3D hexagonal mesoporous silica films to environment studied by infrared ellipsometry

Mesoporous silica films with varying porous volume fraction:Direct correlation between ortho-positronium annihilation decayand escape yield into vacuum

SiO 2 – TiO 2 interfaces studied by ellipsometry and x-ray photoemission spectroscopy

SiO2-TiO2 interfaces studied by ellipsometry and X-ray photoemission spectroscopy

Adsorption and Desorption Isotherms at Ambient Temperature Obtained by Ellipsometric Porosimetry to Probe Micropores in Ordered Mesoporous Silica Films

Adsorption and Desorption Isotherms at Ambient Temperature Obtained by Ellipsometric Porosimetry to Probe Micropores in Ordered Mesoporous Silica

Highly ordered CTAB-templated organosilicate films

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