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Two-Step Fowler-Stephens Orchiopexy for Intra-Abdominal Testes: A 28-Year Single Institution Experience

The Journal of urology, 2013-10, Vol.190 (4), p.1371-1376

2013

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Robot-assisted retroperitoneal lymph node dissection (RA-RPLND) in the adolescent population

Journal of pediatric urology, 2017-04, Vol.13 (2), p.223-224

2017

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Is glans penis width a risk factor for complications after hypospadias repair?

Journal of pediatric urology, 2016-08, Vol.12 (4), p.202.e1-202.e5

2016

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Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging

Journal of crystal growth, 2011-03, Vol.318 (1), p.1157-1163

2011

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Outcomes of externalized pyeloureteral versus internal ureteral stent in pediatric robotic-assisted laparoscopic pyeloplasty

Journal of pediatric urology, 2018-10, Vol.14 (5), p.450.e1-450.e6

2018

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Tunica vaginalis flap for salvaging testicular torsion: A matched cohort analysis

Journal of pediatric urology, 2018-08, Vol.14 (4), p.329.e1-329.e7

2018

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X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers

Powder diffraction, 2013-06, Vol.28 (2), p.95-99

2013

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"Reproducability in X-Ray reflectometry : results from the first reflectivity round robin"

Journal of applied crystallography, 2008, Vol.41, p.143-15

2008

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Osteoblast intracellular localization of Nmp4 proteins

Bone (New York, N.Y.), 2002-06, Vol.30 (6), p.931-936

2002

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Gloss and Surface Topography

CIRP annals, 1994, Vol.43 (2), p.541-549

1994

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Advanced X-ray scattering techniques for the characterization of semiconducting materials

Journal of crystal growth, 1993, Vol.126 (1), p.1-18

1993

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Micro calibration of surfaces

Journal of the Japan Society of Precision Engineering, 1985, Vol.51 (9), p.1663-1668

1985

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Measurement of Surface Roughnesses and Topography at Nanometer Levels by Diffuse X-Ray Scattering

CIRP annals, 1994, Vol.43 (1), p.497-500

1994

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Ellipsoid X-ray focussing for synchrotron-radiation microprobe analysis at the SRS, Daresbury, UK

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1990-07, Vol.292 (3), p.719-727

1990

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Grazing Incidence X-Ray Reflectance Measurement of Surface and Interface Roughness on the Sub-Nanometre Scale

MRS proceedings, 1994, Vol.332, Article 525

1994

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The synchrotron radiation microprobe at the SRS, daresbury (UK) and its applications

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1990-04, Vol.49 (1), p.544-550

1990

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{224} Plane X-Ray Diffraction Study of GaAs on Si Wafers Using a Conventional Double Crystal Diffractometer

MRS proceedings, 1987, Vol.91, Article 193

1987

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Strain relaxation in Si−xGex layers on Si(001)

Journal of crystal growth, 1992-02, Vol.116 (3-4), p.260-270

1992

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Strain relaxation in Si − x Ge x layers on Si(001)

Journal of crystal growth, 1992, Vol.116 (3), p.260-270

1992

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Characterization of Sub-Surface Structures by Double Crystal X-Ray Diffraction

MRS proceedings, 1986, Vol.82, Article 447

1986

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The use of color in image enhancement of X-ray microtomographs

Journal of X-ray science and technology, 1989-01, Vol.1 (2), p.171-189

1989

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A method for improving digital image comparison in X-ray topographs

Materials letters, 1987-05, Vol.5 (5), p.227-231

1987

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Sub-nanometre transducer characterization by X-ray interferometry

Precision engineering, 1990, Vol.12 (3), p.165-171

1990

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Elemental boron and antimony doping of MBE Si and SiGe structures grown at temperatures below 600°C

Journal of crystal growth, 1991-05, Vol.111 (1), p.907-911

1991

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Experimental comparison of synchrotron radiation with other modes of excitation of X rays for trace element analysis

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1984-01, Vol.3 (1), p.232-240

1984

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Two-Step Fowler-Stephens Orchiopexy for Intra-Abdominal Testes: A 28-Year Single Institution Experience

Robot-assisted retroperitoneal lymph node dissection (RA-RPLND) in the adolescent population

Is glans penis width a risk factor for complications after hypospadias repair?

Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging

Outcomes of externalized pyeloureteral versus internal ureteral stent in pediatric robotic-assisted laparoscopic pyeloplasty

Tunica vaginalis flap for salvaging testicular torsion: A matched cohort analysis

X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers

"Reproducability in X-Ray reflectometry : results from the first reflectivity round robin"

Osteoblast intracellular localization of Nmp4 proteins

Gloss and Surface Topography

Advanced X-ray scattering techniques for the characterization of semiconducting materials

Micro calibration of surfaces

Measurement of Surface Roughnesses and Topography at Nanometer Levels by Diffuse X-Ray Scattering

Ellipsoid X-ray focussing for synchrotron-radiation microprobe analysis at the SRS, Daresbury, UK

Grazing Incidence X-Ray Reflectance Measurement of Surface and Interface Roughness on the Sub-Nanometre Scale

The synchrotron radiation microprobe at the SRS, daresbury (UK) and its applications

{224} Plane X-Ray Diffraction Study of GaAs on Si Wafers Using a Conventional Double Crystal Diffractometer

Strain relaxation in Si−xGex layers on Si(001)

Strain relaxation in Si − x Ge x layers on Si(001)

Characterization of Sub-Surface Structures by Double Crystal X-Ray Diffraction

The use of color in image enhancement of X-ray microtomographs

A method for improving digital image comparison in X-ray topographs

Sub-nanometre transducer characterization by X-ray interferometry

Elemental boron and antimony doping of MBE Si and SiGe structures grown at temperatures below 600°C

Experimental comparison of synchrotron radiation with other modes of excitation of X rays for trace element analysis

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