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Diffraction anomalous fine structure : a new X-ray structural technique

Physical review letters, 1992-11, Vol.69 (21), p.3064-3067

1992

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Surface extended-X-ray-absorption fine structure and scanning tunneling microscopy of Si(001) 2×1-Sb

Physical review letters, 1990-12, Vol.65 (27), p.3417-3420

1990

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Parallel calculation of electron multiple scattering using Lanczos algorithms

Physical review. B, Condensed matter, 2002-03, Vol.65 (10), Article 104107

2002

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Thermal expansion coefficients of low-k dielectric films from Fourier analysis of x-ray reflectivity

Journal of applied physics, 2000-07, Vol.88 (2), p.691-695

2000

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Incipient amorphous-to-crystalline transition in Ge

Physical review. B, Condensed matter, 1983-05, Vol.27 (10), p.6557-6560

1983

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X-ray standing-wave determination of the clean InP(110) surface reconstruction

Physical review letters, 1992-01, Vol.68 (3), p.341-344

1992

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Structural unit in icosahedral MnAlSi and MnAl

Physical review letters, 1986-09, Vol.57 (13), p.1611-1614

1986

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Local structure at Mn sites in icosahedral Mn-Al quasicrystals

Physical review letters, 1985-11, Vol.55 (20), p.2172-2175

1985

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Edge separation using diffraction anomalous fine structure

Journal of synchrotron radiation, 1999-05, Vol.6 (3), p.338-340

1999

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Strontium-induced oxygen defect structure and hole doping in La2-xSrxCuO4

Physical review letters, 1990-05, Vol.64 (22), p.2715-2718

1990

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Sample-angle feedback for diffraction anomalous fine-structure spectroscopy

Journal of synchrotron radiation, 1998-05, Vol.5 (3), p.911-913

1998

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Extended x-ray absorption fine structure study of AlxGa(1−x)N films

Applied physics letters, 1997-04, Vol.70 (16), p.2108-2110

1997

Volltextzugriff (PDF)

Silicon photodiode detector for a glancing‐emergence‐angle EXAFS technique

Review of scientific instruments, 1992-06, Vol.63 (6), p.3298-3302

1992

Volltextzugriff (PDF)

Silicon photodiode detector for fluorescence EXAFS

Review of scientific instruments, 1987-10, Vol.58 (10), p.1891-1894

1987

Volltextzugriff (PDF)

Iron impurities in Si3N4 processing

Journal of materials science, 1985-05, Vol.20 (5), p.1807-1814

1985

Volltextzugriff (PDF)

Correcting for x‐ray energy calibration error caused by misalignment of a right‐angle linkage monochromator

Review of scientific instruments, 1991-04, Vol.62 (4), p.982-985

1991

Volltextzugriff (PDF)

Analysis of DAFS fine structure and background

Physica. B, Condensed matter, 1995-03, Vol.208, p.145-147

1995

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Direct separation of short range order in intermixed nanocrystalline and amorphous phases

Physical review letters, 2002-12, Vol.89 (28 Pt 1), p.285503-285503, Article 285503

2002

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Inclusion of local structure effects in theoretical x-ray resonant scattering amplitudes using ab initio x-ray-absorption spectra calculations

Physical review. B, Condensed matter, 1998-11, Vol.58 (17), p.11215-11225

1998

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Determination of the Sb/Si(111) interfacial structure by back-reflection x-ray standing waves and surface extended x-ray-absorption fine structure

Physical review. B, Condensed matter, 1991-08, Vol.44 (7), p.3475-3478

1991

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Silicide formation and structural evolution in Fe-, Co-, and Ni-implanted silicon

Physical review. B, Condensed matter, 1992-08, Vol.46 (7), p.4077-4085

1992

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Gold-induced germanium crystallization

Physical review. B, Condensed matter, 1992-10, Vol.46 (15), p.9505-9510

1992

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Local bonding structure of Sb on Si(111) by surface extended x-ray-absorption fine structure and photoemission

Physical review. B, Condensed matter, 1991-02, Vol.43 (5), p.4331-4339

1991

Volltextzugriff (PDF)

Conversion-electron extended x-ray-absorption fine-structure measurements of ion-damaged GaAs

Physical review. B, Condensed matter, 1987-01, Vol.35 (3), p.1429-1432

1987

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Structural relaxation in ion-damaged amorphous germanium

Physical review. B, Condensed matter, 1991-09, Vol.44 (11), p.5492-5496

1991

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Diffraction anomalous fine structure : a new X-ray structural technique

Surface extended-X-ray-absorption fine structure and scanning tunneling microscopy of Si(001) 2×1-Sb

Parallel calculation of electron multiple scattering using Lanczos algorithms

Thermal expansion coefficients of low-k dielectric films from Fourier analysis of x-ray reflectivity

Incipient amorphous-to-crystalline transition in Ge

X-ray standing-wave determination of the clean InP(110) surface reconstruction

Structural unit in icosahedral MnAlSi and MnAl

Local structure at Mn sites in icosahedral Mn-Al quasicrystals

Edge separation using diffraction anomalous fine structure

Strontium-induced oxygen defect structure and hole doping in La2-xSrxCuO4

Sample-angle feedback for diffraction anomalous fine-structure spectroscopy

Extended x-ray absorption fine structure study of AlxGa(1−x)N films

Silicon photodiode detector for a glancing‐emergence‐angle EXAFS technique

Silicon photodiode detector for fluorescence EXAFS

Iron impurities in Si3N4 processing

Correcting for x‐ray energy calibration error caused by misalignment of a right‐angle linkage monochromator

Analysis of DAFS fine structure and background

Direct separation of short range order in intermixed nanocrystalline and amorphous phases

Inclusion of local structure effects in theoretical x-ray resonant scattering amplitudes using ab initio x-ray-absorption spectra calculations

Determination of the Sb/Si(111) interfacial structure by back-reflection x-ray standing waves and surface extended x-ray-absorption fine structure

Silicide formation and structural evolution in Fe-, Co-, and Ni-implanted silicon

Gold-induced germanium crystallization

Local bonding structure of Sb on Si(111) by surface extended x-ray-absorption fine structure and photoemission

Conversion-electron extended x-ray-absorption fine-structure measurements of ion-damaged GaAs

Structural relaxation in ion-damaged amorphous germanium

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