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Atypical secondary electron emission yield curves of very thin SiO2 layers: Experiments and modeling

Journal of applied physics, 2021-10, Vol.130 (13)

2021

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Influence of dielectric layer thickness on charge injection, accumulation and transport phenomena in thin silicon oxynitride layers: a nanoscale study

Nanotechnology, 2021-02, Vol.32 (6), p.065706-065706

2021

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Methodology for extraction of space charge density profiles at nanoscale from Kelvin probe force microscopy measurements

Nanotechnology, 2017-12, Vol.28 (50), p.505701-505701

2017

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Charge injection in thin dielectric layers by atomic force microscopy: influence of geometry and material work function of the AFM tip on the injection process

Nanotechnology, 2016-06, Vol.27 (24), p.245702-245702

2016

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Silver nanoparticles as a key feature of a plasma polymer composite layer in mitigation of charge injection into polyethylene under dc stress

Journal of physics. D, Applied physics, 2016-01, Vol.49 (1), p.15304-15316

2016

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Nanoscale dielectric properties of TiO2 in SiO2 nanocomposite deposited by hybrid PECVD method

Nano express, 2024-03, Vol.5 (1), p.015010

2024

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Charge injection phenomena at the metal/dielectric interface investigated by Kelvin probe force microscopy

Journal of physics. D, Applied physics, 2017-05, Vol.50 (17), p.175302

2017

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Management of osteoporosis in fracture liaison service associated with long-term adherence to treatment

Osteoporosis international, 2011-07, Vol.22 (7), p.2099-2106

2011

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Analysis of the charging kinetics in silver nanoparticles-silica nanocomposite dielectrics at different temperatures

Nano express, 2021-12, Vol.2 (4), p.44001

2021

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Atomic force microscopy developments for probing space charge at sub-micrometer scale in thin dielectric films

IEEE transactions on dielectrics and electrical insulation, 2016-04, Vol.23 (2), p.713-720

2016

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Dielectric charging by AFM in tip-to-sample space mode: overview and challenges in revealing the appropriate mechanisms

Nanotechnology, 2015-07, Vol.26 (29), p.295704-295704

2015

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Towards 3D charge localization by a method derived from atomic force microscopy: the electrostatic force distance curve

Journal of physics. D, Applied physics, 2014-11, Vol.47 (45), p.455302-8

2014

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Dissociating space charge processes from orientation polarization in poly(ethylene naphthalate) films

Journal of physics. D, Applied physics, 2014-11, Vol.47 (45), p.455306-8

2014

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Implementation of polarization processes in a charge transport model applied on poly(ethylene naphthalate) films

Journal of applied physics, 2016-06, Vol.119 (22)

2016

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Dielectric layers for RF-MEMS switches: Design and study of appropriate structures preventing electrostatic charging

IEEE transactions on dielectrics and electrical insulation, 2012-08, Vol.19 (4), p.1195-1202

2012

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Space charge, conduction and photoluminescence measurements in gamma irradiated poly (ethylene-2,6-naphthalate)

Radiation physics and chemistry (Oxford, England : 1993), 2014-08, Vol.101, p.73-80

2014

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Effect of trapped space charge on mechanical deformation induced by electric field

IEEE transactions on dielectrics and electrical insulation, 2011-10, Vol.18 (5), p.1416-1422

2011

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Modelling polarization and conduction processes in poly(ethylene naphthalate)

Materials research express, 2017-08, Vol.4 (8), p.85304

2017

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Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation

Microelectronics and reliability, 2008-08, Vol.48 (8), p.1248-1252

2008

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Influence of temperature on low-density polyethylene films through conduction measurement

Journal of physics. D, Applied physics, 2002-07, Vol.35 (13), p.1555-1561, Article 317

2002

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Thermally stimulated depolarization current and space charge measurements on low-density polyethylene: Influence of the presence of antioxidant

Journal of applied polymer science, 2008-09, Vol.109 (5), p.2768-2773

2008

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A new approach to describe the electrical ageing by considering the distributed nature of processes in polymeric materials

Journal of non-crystalline solids, 2010-04, Vol.356 (11), p.652-656

2010

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Charging-Effects in RF capacitive switches influence of insulating layers composition

Microelectronics and reliability, 2006-09, Vol.46 (9), p.1700-1704

2006

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Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches

Microelectronics and reliability, 2008-08, Vol.48 (8), p.1232-1236

2008

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TiO2-SiO2 mixed oxide deposited by low pressure PECVD: Insights on optical and nanoscale electrical properties

Applied surface science, 2021-03, Vol.541, p.148510, Article 148510

2021

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Atypical secondary electron emission yield curves of very thin SiO2 layers: Experiments and modeling

Influence of dielectric layer thickness on charge injection, accumulation and transport phenomena in thin silicon oxynitride layers: a nanoscale study

Methodology for extraction of space charge density profiles at nanoscale from Kelvin probe force microscopy measurements

Charge injection in thin dielectric layers by atomic force microscopy: influence of geometry and material work function of the AFM tip on the injection process

Silver nanoparticles as a key feature of a plasma polymer composite layer in mitigation of charge injection into polyethylene under dc stress

Nanoscale dielectric properties of TiO2 in SiO2 nanocomposite deposited by hybrid PECVD method

Charge injection phenomena at the metal/dielectric interface investigated by Kelvin probe force microscopy

Management of osteoporosis in fracture liaison service associated with long-term adherence to treatment

Analysis of the charging kinetics in silver nanoparticles-silica nanocomposite dielectrics at different temperatures

Atomic force microscopy developments for probing space charge at sub-micrometer scale in thin dielectric films

Dielectric charging by AFM in tip-to-sample space mode: overview and challenges in revealing the appropriate mechanisms

Towards 3D charge localization by a method derived from atomic force microscopy: the electrostatic force distance curve

Dissociating space charge processes from orientation polarization in poly(ethylene naphthalate) films

Implementation of polarization processes in a charge transport model applied on poly(ethylene naphthalate) films

Dielectric layers for RF-MEMS switches: Design and study of appropriate structures preventing electrostatic charging

Space charge, conduction and photoluminescence measurements in gamma irradiated poly (ethylene-2,6-naphthalate)

Effect of trapped space charge on mechanical deformation induced by electric field

Modelling polarization and conduction processes in poly(ethylene naphthalate)

Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation

Influence of temperature on low-density polyethylene films through conduction measurement

Thermally stimulated depolarization current and space charge measurements on low-density polyethylene: Influence of the presence of antioxidant

A new approach to describe the electrical ageing by considering the distributed nature of processes in polymeric materials

Charging-Effects in RF capacitive switches influence of insulating layers composition

Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches

TiO2-SiO2 mixed oxide deposited by low pressure PECVD: Insights on optical and nanoscale electrical properties

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