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Charge Trapping in Dielectrics

Microscopy and microanalysis, 2004-12, Vol.10 (6), p.691-696

Bonnelle, C.

2004

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Valence state of Tm in TmX (X = S, Se, Te) investigated by resonant inelastic x-ray scattering

Physical review. B, Condensed matter and materials physics, 2005-08, Vol.72 (7), p.075122.1-075122.7

2005

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Satellite lines induced by electrons of near-threshold energy in the x-ray emission band spectra of 3d, 4d, and 5d transition metals

Physical review. B, Condensed matter and materials physics, 2005-04, Vol.71 (15), p.155107.1-155107.12

2005

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Advances in X-Ray Spectroscopy: Contributions in Honour of Professor Y. Cauchois

1, 1982

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Dynamics of charge trapping by electron-irradiated alumina

Physical review. B, Condensed matter and materials physics, 2010-08, Vol.82 (7), Article 075132

2010

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Advances in X-Ray Spectroscopy: Contributions in Honour of Professor Y. Cauchois

2013

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Ansatz for the evaluation of the relativistic contributions to core ionization energies in complex molecules involving heavy atoms

International journal of quantum chemistry, 2005-09, Vol.104 (4), p.397-410

2005

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SOLEX: a tunable monochromatic X-ray source in the 1–20 keV energy range for metrology

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2004-01, Vol.516 (2), p.594-601

2004

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Analyse spatiale d'une source X à l'aide d'un spectromètre à cristal convexe

X-ray spectrometry, 1995-09, Vol.24 (5), p.260-266

1995

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Modulation of x-ray line intensity emitted by a periodic structure under electron excitation

Applied physics letters, 2002-08, Vol.81 (8), p.1524-1526

2002

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Tunable and bright EUV sources using the interaction of medium–energy electron beams with periodic multilayer targets

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2003-02, Vol.498 (1), p.532-538

2003

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X-ray Raman scattering with Bragg diffraction in a La-based superlattice

Optics communications, 2005-11, Vol.255 (4-6), p.267-271

2005

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Insulator gap states at the Cu/MgO(001) interface by X-ray emission spectroscopy

Surface science, 1999-08, Vol.436 (1), p.L724-L728

1999

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X-ray emission induced by low energy electrons

Microscopy and microanalysis, 2002-08, Vol.8 (S02), p.436-437

2002

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Investigation of an Mo/SiO2 interface by electron-induced x-ray emission spectroscopy

Surface and interface analysis, 2000-04, Vol.29 (4), p.255-259

2000

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Multiphonon-induced charge trapping-detrapping and damage in insulators

Physical review. B, Condensed matter and materials physics, 2010-02, Vol.81 (5), Article 054307

Bonnelle, C.

2010

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Amplification de Bragg de la raie Si Kα émise par une multicouche Mo/Si irradiée par un faisceau d'électrons : vers un laser X à rétroaction distribuée ?

Journal de Physique IV (Proceedings), 2003, Vol.108, p.211-214

2003

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Characterization of silicon oxynitride thin films by infrared reflection absorption spectroscopy

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1996-07, Vol.14 (4), p.2488-2492

1996

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Instrument for research on interfaces and surfaces

Review of scientific instruments, 1994-11, Vol.65 (11), p.3466-3471

1994

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IntriX: a numerical model for electron probe analysis at high depth resolution. Part II-tests and confrontation with experiments

X-ray spectrometry, 1998-01, Vol.27 (1), p.58-66

1998

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Hybridization of Al and O states in alpha- and gamma-alumina

Journal of physics. Condensed matter, 1993-11, Vol.5 (45), p.8629-8642

1993

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Distributions électroniques aux interfaces solide-solide

Journal de chimie physique et de physicochimie biologique, 1987, Vol.84, p.187-195

1987

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Study of the adhesion between a-CH films and TA6V substrates by electron-induced X-ray emission spectroscopy (EXES)

Thin solid films, 1997-08, Vol.306 (1), p.119-123

1997

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X-ray emissions in 3d, 4d, and 5d ranges for uranium ions

Physical review. A, Atomic, molecular, and optical physics, 1997-05, Vol.55 (5), p.3422-3432

1997

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Electron trapping in α-alumina observed by electron-induced x-ray emission

Journal of applied physics, 1996-03, Vol.79 (6), p.2909-2912

1996

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Charge Trapping in Dielectrics

Valence state of Tm in TmX (X = S, Se, Te) investigated by resonant inelastic x-ray scattering

Satellite lines induced by electrons of near-threshold energy in the x-ray emission band spectra of 3d, 4d, and 5d transition metals

Advances in X-Ray Spectroscopy: Contributions in Honour of Professor Y. Cauchois

Dynamics of charge trapping by electron-irradiated alumina

Advances in X-Ray Spectroscopy: Contributions in Honour of Professor Y. Cauchois

Ansatz for the evaluation of the relativistic contributions to core ionization energies in complex molecules involving heavy atoms

SOLEX: a tunable monochromatic X-ray source in the 1–20 keV energy range for metrology

Analyse spatiale d'une source X à l'aide d'un spectromètre à cristal convexe

Modulation of x-ray line intensity emitted by a periodic structure under electron excitation

Tunable and bright EUV sources using the interaction of medium–energy electron beams with periodic multilayer targets

X-ray Raman scattering with Bragg diffraction in a La-based superlattice

Insulator gap states at the Cu/MgO(001) interface by X-ray emission spectroscopy

X-ray emission induced by low energy electrons

Investigation of an Mo/SiO2 interface by electron-induced x-ray emission spectroscopy

Multiphonon-induced charge trapping-detrapping and damage in insulators

Amplification de Bragg de la raie Si Kα émise par une multicouche Mo/Si irradiée par un faisceau d'électrons : vers un laser X à rétroaction distribuée ?

Characterization of silicon oxynitride thin films by infrared reflection absorption spectroscopy

Instrument for research on interfaces and surfaces

IntriX: a numerical model for electron probe analysis at high depth resolution. Part II-tests and confrontation with experiments

Hybridization of Al and O states in alpha- and gamma-alumina

Distributions électroniques aux interfaces solide-solide

Study of the adhesion between a-CH films and TA6V substrates by electron-induced X-ray emission spectroscopy (EXES)

X-ray emissions in 3d, 4d, and 5d ranges for uranium ions

Electron trapping in α-alumina observed by electron-induced x-ray emission

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