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IEEE transactions on electron devices, 2016-01, Vol.63 (1), p.326-332
2016
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Applied physics letters, 2015-05, Vol.106 (21)
2015
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IEEE transactions on electron devices, 2023-06, Vol.70 (6), p.1-6
2023
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Microelectronics and reliability, 2022-11, Vol.138, p.114735, Article 114735
2022
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Physica status solidi. A, Applications and materials science, 2018-04, Vol.215 (8), p.n/a
2018
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Semiconductor science and technology, 2022, Vol.37 (3)
2022
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Microelectronics and reliability, 2012-09, Vol.52 (9-10), p.2144-2148
2012
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IEEE electron device letters, 2016-09, Vol.37 (9), p.1197-1200
2016
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Microelectronics and reliability, 2015-12, Vol.55 (12), p.2493-2498
2015
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IEEE transactions on electron devices, 2020-07, Vol.67 (7), p.2765-2770
2020
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Physica status solidi. C, 2009-06, Vol.6 (S2), p.S976-S979
2009
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IEEE transactions on electron devices, 2017-05, Vol.64 (5), p.2155-2160
2017
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2022 IEEE International Reliability Physics Symposium (IRPS), 2022, p.11B.4-1-11B.4-6
2022
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Physica status solidi. C, 2014-02, Vol.11 (3-4), p.940-944
2014
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International journal of microwave and wireless technologies, 2010-02, Vol.2 (1), p.21-32
2010
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Semiconductor science and technology, 2022-03, Vol.37 (3), p.35011
2022
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2022 17th European Microwave Integrated Circuits Conference (EuMIC), 2022, p.99-102
2022
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2022 IEEE Topical Conference on RF/Microwave Power Amplifiers for Radio and Wireless Applications (PAWR), 2022, p.1-4
2022
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2021 16th European Microwave Integrated Circuits Conference (EuMIC), 2022, p.233-236
2022
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2000 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium Digest of Papers (Cat. No.00CH37096), 2000, p.279-282
2000
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2015 10th European Microwave Integrated Circuits Conference (EuMIC), 2015, p.196-198
2015
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2013 European Microwave Integrated Circuit Conference, 2013, p.500-503
2013
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2013 European Microwave Conference, 2013, p.1471-1474
2013
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Japanese journal of applied physics, 1997, Vol.36 (1A), p.175-180
1997
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2000 IEEE MTT-S International Microwave Symposium Digest (Cat. No.00CH37017), 2000, Vol.1, p.413-416 vol.1
2000
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