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2023
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2015 Symposium on VLSI Technology (VLSI Technology), 2015, p.T48-T49
- Batude, P.
- Fenouillet-Beranger, C.
- Pasini, L.
- Lu, V.
- Deprat, F.
- Brunet, L.
- Sklenard, B.
- Piegas-Luce, F.
- Casse, M.
- Mathieu, B.
- Billoint, O.
- Cibrario, G.
- Turkyilmaz, O.
- Sarhan, H.
- Thuries, S.
- Hutin, L.
- Sollier, S.
- Widiez, J.
- Hortemel, L.
- Tabone, C.
- Samson, M.-P
- Previtali, B.
- Rambal, N.
- Ponthenier, F.
- Mazurier, J.
- Beneyton, R.
- Bidaud, M.
- Josse, E.
- Petitprez, E.
- Rozeau, O.
- Rivoire, M.
- Euvard-Colnat, C.
- Seignard, A.
- Fournel, F.
- Benaissa, L.
- Coudrain, P.
- Leduc, P.
- Hartmann, J.-M
- Besson, P.
- Kerdiles, S.
- Bout, C.
- Nemouchi, F.
- Royer, A.
- Agraffeil, C.
- Ghibaudo, G.
- Signamarcheix, T.
- Haond, M.
- Clermidy, F.
- Faynot, O.
- Vinet, M.
2015
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2015 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015, p.1192-1196
2015
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2023 International Electron Devices Meeting (IEDM), 2023, p.1-4
2023
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2021 IEEE International Memory Workshop (IMW), 2021, p.1-4
- Grenouillet, L.
- Castellani, N.
- Persico, A.
- Meli, V.
- Martin, S.
- Billoint, O.
- Segaud, R.
- Bernasconi, S.
- Pellissier, C.
- Jahan, C.
- Charpin-Nicolle, C.
- Dezest, P.
- Carabasse, C.
- Besombes, P.
- Ricavy, S.
- Tran, N.-P.
- Magalhaes-Lucas, A.
- Roman, A.
- Boixaderas, C.
- Magis, T.
- Bedjaoui, M.
- Tessaire, M.
- Seignard, A.
- Mazen, F.
- Landis, S.
- Vianello, E.
- Molas, G.
- Gaillard, F.
- Arcamone, J.
- Nowak, E.
2021
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Ingénierie et recherche biomédicale, 2009, Vol.30 (5), p.226-233
2009
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2019 IEEE International Electron Devices Meeting (IEDM), 2019, p.30.5.1-30.5.4
2019
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2019 International 3D Systems Integration Conference (3DIC), 2019, p.1-5
2019
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2020 IEEE International Memory Workshop (IMW), 2020, p.1-4
2020
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2021 IEEE International Interconnect Technology Conference (IITC), 2021, p.1-1
- Batude, P.
- Brunet, L.
- Fenouillet-Beranger, C.
- Lattard, D.
- Andrieu, F.
- Vinet, M.
- Brevard, L.
- Ribotta, M.
- Previtali, B.
- Tabone, C.
- Ponthenier, F.
- Rambal, N.
- Sideris, P.
- Garros, X.
- Casse, M.
- Theodorou, C.
- Sklenard, B.
- Lacord, J.
- Besson, P.
- Fournel, F.
- Kerdiles, S.
- Acosta-Alba, P.
- Mazzocchi, V.
- Hartmann, J-M.
- Mazen, F.
- Thuries, S.
- Billoint, O.
- Vivet, P.
- Sicard, G.
- Cibrario, G.
- Mouhdach, M.
- Giraud, B.
- Ribotta, CM
- Lapras, V.
2021
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2021 IEEE International Electron Devices Meeting (IEDM), 2021, p.3.2.1-3.2.4
- Batude, P.
- Billoint, O.
- Thuries, S.
- Malinge, P.
- Fenouillet-Beranger, C.
- Peizerat, A.
- Sicard, G.
- Vivet, P.
- Reboh, S.
- Cavalcante, C.
- Brunet, L.
- Ribotta, M.
- Brevard, L.
- Garros, X.
- Frutuoso, T. Mota
- Sklenard, B.
- Lacord, J.
- Kanyandekwe, J.
- Kerdiles, S.
- Sideris, P.
- Theodorou, C.
- Lapras, V.
- Mouhdach, M.
- Gaudin, G.
- Besnard, G.
- Radu, I.
- Ponthenier, F.
- Farcy, A.
- Jesse, E.
- Guyader, F.
- Matheret, T.
- Brunet, P.
- Milesi, F.
- Van-Jodin, L. Le
- Sarrazin, A.
- Perrin, B.
- Moulin, C.
- Maitrejean, S.
- Alepidis, M.
- Ionica, I.
- Cristoloveanu, S.
- Gaillard, F.
- Vinet, M.
- Andrieu, F.
- Arcamone, J.
- Ollier, E.
2021
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2014 SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2014, p.1-3
2014
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ECS transactions, 2014, Vol.64 (5), p.381-390
- Brunet, Laurent
- Batude, Perrine
- Fournel, Frank
- Benaissa, Lamine
- Fenouillet-Beranger, Claire
- Pasini, Luca
- Deprat, Fabien
- Previtali, Bernard
- Ponthenier, Fabienne
- Seignard, Aurélien
- Euvrard-Colnat, Catherine
- Rivoire, Maurice
- Besson, Pascal
- Arvet, Christian
- Beche, Elodie
- Rozeau, Olivier
- Billoint, Olivier
- Turkyilmaz, Ogun
- Clermidy, Fabien
- Signamarcheix, Thomas
- Vinet, Maud
2014
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2017 IEEE International Electron Devices Meeting (IEDM), 2017, p.20.3.1-20.3.4
2017
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Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015, p.1192-1196
2015
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2016 46th European Solid-State Device Research Conference (ESSDERC), 2016, p.218-221
2016
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2016 IEEE International Electron Devices Meeting (IEDM), 2016, p.35.1.1-35.1.4
2016
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Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013, p.1-4
2013
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2024 IEEE International Memory Workshop (IMW), 2024, p.1-4
2024
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2016 International Conference on IC Design and Technology (ICICDT), 2016, p.1-4
2016
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2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013, p.613-618
2013
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Conference proceedings (IEEE Engineering in Medicine and Biology Society. Conf.), 2007, Vol.2007, p.171
2007
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2010 Annual International Conference of the IEEE Engineering in Medicine and Biology, 2010-01, Vol.2010, p.1804-1807
2010
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2023 IEEE International Memory Workshop (IMW), 2023, p.1-4
2023
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2007 29th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, 2007, Vol.2007, p.6069-6072
2007
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Thema
- Engineering
- Science & Technology
- Technology
- Three-Dimensional Displays
- Engineering, Electrical & Electronic
- Logic Gates
- Random Access Memory
- Computer Science
- Engineering Sciences
- Performance Evaluation
- Annealing
- Cmos
- Computer Science, Hardware & Architecture
- Nonvolatile Memory
- Silicon
- Transistors
- Arrays
- Engineering, Biomedical
- Microelectrodes
- Microelectronics
Kollektion
Zeitschrift / Serie
- Conference Proceedings
- 2007 Annual International Conference Of The Ieee Engineering In Medicine And Biology Society, Vols 1-16
- 2010 Annual International Conference Of The Ieee Engineering In Medicine And Biology
- 2010 Annual International Conference Of The Ieee Engineering In Medicine And Biology Society
- 2010 Annual International Conference Of The Ieee Engineering In Medicine And Biology Society, Embc'10
- Annual International Conference Of The Ieee Engineering In Medicine And Biology - Proceedings
- Annual International Conference Of The Ieee Engineering In Medicine And Biology Society. Ieee Engineering In Medicine And Biology Society. Annual International Conference
- Ingénierie Et Recherche Biomédicale