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PVD hard coatings applied for the wear protection of drawing dies

Surface & coatings technology, 2005-10, Vol.200 (1-4), p.133-136

2005

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Evidence of annealing effects on a high-density Si/SiO2 interfacial layer

Applied physics letters, 1997-06, Vol.70 (23), p.3119-3121

1997

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Structurally induced optical transitions in Ge-Si superlattices

Physical review letters, 1987-02, Vol.58 (7), p.729-732

1987

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Boron diffusion in strained Si1-xGex epitaxial layers

Physical review letters, 1993-08, Vol.71 (6), p.883-886

1993

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Channeling of low-energy implanted ions through the poly-Si gate

IEEE electron device letters, 1999-07, Vol.20 (7), p.357-359

1999

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Raman Microprobe Analysis of Elastic Strain and Fracture in Electrophoretically Deposited CdSe Nanocrystal Films

Nano letters, 2006-02, Vol.6 (2), p.175-180

2006

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Anomalous increase in strength of in situ formed Cu-Nb multifilamentary composites

Journal of applied physics, 1978-12, Vol.49 (12), p.6031-6038

1978

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Ge-Si layered structures : artificial crystals and complex cell ordered superlattices

Applied physics letters, 1986-08, Vol.49 (5), p.286-288

1986

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Native oxidation of the Si(001) surface : evidence for an interfacial phase

Applied physics letters, 1991-03, Vol.58 (10), p.1044-1046

1991

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Influence of surface reconstruction on the orientation of homoepitaxial silicon films

Physical review letters, 1990-08, Vol.65 (9), p.1128-1131

1990

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Low-temperature homoepitaxy on Si(111)

Applied physics letters, 1991-07, Vol.59 (2), p.204-206

1991

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Seventy-two tesla non-destructive pulsed magnetic fields at AT&T Bell Laboratories

Physica. B, Condensed matter, 1994-07, Vol.201, p.560-564

1994

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Strain in ultrathin epitaxial films of Ge/Si(100) measured by ion scattering and channeling

Physical review letters, 1987-08, Vol.59 (6), p.664-667

1987

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Normal-State Resistivity of In Situ-Formed Ultrafine Filamentary Cu/Nb Composites

Journal of applied physics, 1981-03, Vol.52 (3-I), p.1370-1375

1981

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Structure and optical properties of Ge-Si ordered superlattices

Applied physics letters, 1987-03, Vol.50 (12), p.760-762

1987

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Effect of processing on the structure of the Si/SiO2 interface

Applied physics letters, 1988-08, Vol.53 (9), p.743-745

1988

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Superconducting and Mechanical Properties of In Situ Formed Multifilamentary Cu/Nb3Sn Composites

Journal of applied physics, 1977-12, Vol.48 (12), p.5180-5187

1977

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X-ray scattering studies of the SiO2/Si(001) interfacial structure

Applied physics letters, 1991-08, Vol.59 (6), p.706-708

1991

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Core-level photoemission measurements of valence-band offsets in highly strained heterojunctions: Si-Ge system

Physical review. B, Condensed matter, 1989-01, Vol.39 (2), p.1235-1241

1989

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X-ray reflectivity studies of SiO2/Si(001)

Applied physics letters, 1991-12, Vol.59 (26), p.3422-3424

1991

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Microstructural Changes in W-Polycide Gates Capped with A Thin Polysilicon Layer

MRS proceedings, 1998, Vol.523, Article 109

1998

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An X-ray scattering study of SiOx/Si/Ge(001)

Applied surface science, 1995-02, Vol.84 (2), p.179-185

1995

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The Si(001)/SiO2 interface

Applied surface science, 1990-01, Vol.41-42, p.365-371

1990

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Isoelectronic bound exciton emission from Si-rich silicon-germanium alloys

Applied physics letters, 1990-09, Vol.57 (10), p.954-956

1990

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High magnetic field transport properties of liquid quenched Nb3Al and Nb3Al(Si,Ge) superconducting compounds

Applied physics letters, 1985-09, Vol.47 (6), p.640-642

1985

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PVD hard coatings applied for the wear protection of drawing dies

Evidence of annealing effects on a high-density Si/SiO2 interfacial layer

Structurally induced optical transitions in Ge-Si superlattices

Boron diffusion in strained Si1-xGex epitaxial layers

Channeling of low-energy implanted ions through the poly-Si gate

Raman Microprobe Analysis of Elastic Strain and Fracture in Electrophoretically Deposited CdSe Nanocrystal Films

Anomalous increase in strength of in situ formed Cu-Nb multifilamentary composites

Ge-Si layered structures : artificial crystals and complex cell ordered superlattices

Native oxidation of the Si(001) surface : evidence for an interfacial phase

Influence of surface reconstruction on the orientation of homoepitaxial silicon films

Low-temperature homoepitaxy on Si(111)

Seventy-two tesla non-destructive pulsed magnetic fields at AT&T Bell Laboratories

Strain in ultrathin epitaxial films of Ge/Si(100) measured by ion scattering and channeling

Normal-State Resistivity of In Situ-Formed Ultrafine Filamentary Cu/Nb Composites

Structure and optical properties of Ge-Si ordered superlattices

Effect of processing on the structure of the Si/SiO2 interface

Superconducting and Mechanical Properties of In Situ Formed Multifilamentary Cu/Nb3Sn Composites

X-ray scattering studies of the SiO2/Si(001) interfacial structure

Core-level photoemission measurements of valence-band offsets in highly strained heterojunctions: Si-Ge system

X-ray reflectivity studies of SiO2/Si(001)

Microstructural Changes in W-Polycide Gates Capped with A Thin Polysilicon Layer

An X-ray scattering study of SiOx/Si/Ge(001)

The Si(001)/SiO2 interface

Isoelectronic bound exciton emission from Si-rich silicon-germanium alloys

High magnetic field transport properties of liquid quenched Nb3Al and Nb3Al(Si,Ge) superconducting compounds

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