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ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC), 2022, p.233-236
2022
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Applied Optics, 2006-11, Vol.45 (32), p.8186-8193
2006
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Journal of non-crystalline solids, 2007-01, Vol.353 (1), p.69-76
2007
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Applied surface science, 2014-06, Vol.303
2014
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Microelectronic engineering, 2013-07, Vol.107, p.156-160
2013
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2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers, 2014, p.1-2
- Weber, O.
- Josse, E.
- Andrieu, F.
- Cros, A.
- Richard, E.
- Perreau, P.
- Baylac, E.
- Degors, N.
- Gallon, C.
- Perrin, E.
- Chhun, S.
- Petitprez, E.
- Delmedico, S.
- Simon, J.
- Druais, G.
- Lasserre, S.
- Mazurier, J.
- Guillot, N.
- Bernard, E.
- Bianchini, R.
- Parmigiani, L.
- Gerard, X.
- Pribat, C.
- Gourhant, O.
- Abbate, F.
- Gaumer, C.
- Beugin, V.
- Gouraud, P.
- Maury, P.
- Lagrasta, S.
- Barge, D.
- Loubet, N.
- Beneyton, R.
- Benoit, D.
- Zoll, S.
- Chapon, J.-D.
- Babaud, L.
- Bidaud, M.
- Gregoire, M.
- Monget, C.
- Le-Gratiet, B.
- Brun, P.
- Mellier, M.
- Pofelski, A.
- Clement, L.R.
- Bingert, R.
- Puget, S.
- Kruck, J.-F.
- Hoguet, D.
- Scheer, P.
- Poiroux, T.
- Manceau, J.-P.
- Rafik, M.
- Rideau, D.
- Jaud, M.-A.
- Lacord, J.
- Monsieur, F.
- Grenouillet, L.
- Vinet, M.
- Liu, Q.
- Doris, B.
- Celik, M.
- Fetterolf, S.P.
- Faynot, O.
- Haond, M.
2014
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2016 IEEE Symposium on VLSI Technology, 2016, p.1-2
2016
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2009 59th Electronic Components and Technology Conference, 2009, p.46-53
2009
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2017 IEEE International Electron Devices Meeting (IEDM), 2017, p.3.1.1-3.1.4
- Batude, P.
- Brunet, L.
- Fenouillet-Beranger, C.
- Andrieu, F.
- Colinge, J.-P
- Lattard, D.
- Vianello, E.
- Thuries, S.
- Billoint, O.
- Vivet, P.
- Santos, C.
- Mathieu, B.
- Sklenard, B.
- Lu, C.-M V.
- Micout, J.
- Deprat, F.
- Mercado, E. Avelar
- Ponthenier, F.
- Rambal, N.
- Samson, M.-P
- Casse, M.
- Hentz, S.
- Arcamone, J.
- Sicard, G.
- Hutin, L.
- Pasini, L.
- Ayres, A.
- Rozeau, O.
- Berthelon, R.
- Nemouchi, F.
- Rodriguez, P.
- Pin, J.-B
- Larmagnac, D.
- Duboust, A.
- Ripoche, V.
- Barraud, S.
- Allouti, N.
- Barnola, S.
- Vizioz, C.
- Hartmann, J.-M
- Kerdiles, S.
- Alba, P. Acosta
- Beaurepaire, S.
- Beugin, V.
- Fournel, F.
- Besson, P.
- Loup, V.
- Gassilloud, R.
- Martin, F.
- Garros, X.
- Mazen, F.
- Previtali, B.
- Euvrard-Colnat, C.
- Balan, V.
- Comboroure, C.
- Zussy, M.
- Mazzocchi
- Faynot, O.
- Vinet, M.
2017
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2019 IEEE 11th International Memory Workshop (IMW), 2019, p.1-4
2019
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2019 IEEE 11th International Memory Workshop (IMW), 2019, p.1-4
2019
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2019 Electron Devices Technology and Manufacturing Conference (EDTM), 2019, p.249-251
2019
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2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2016, p.1-3
- Fenouillet-Beranger, C.
- Batude, P.
- Brunet, L.
- Mazzocchi, V.
- Lu, C.-M V.
- Deprat, F.
- Micout, J.
- Samson, M.-P
- Previtali, B.
- Besombes, P.
- Rambal, N.
- Lapras, V.
- Andrieu, F.
- Billoint, O.
- Brocard, M.
- Thuries, S.
- Cibrario, G.
- Acosta-Alba, P.
- Mathieu, B.
- Kerdiles, S.
- Nemouchi, F.
- Arvet, C.
- Besson, P.
- Loup, V.
- Gassilloud, R.
- Garros, X.
- Leroux, C.
- Beugin, V.
- Guerin, C.
- Benoit, D.
- Pasini, L.
- Hartmann, J.-M
- Vinet, M.
2016
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2003 8th International Symposium Plasma- and Process-Induced Damage, 2003, p.85-88
2003
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2004 IEEE International Conference on Industrial Technology, 2004. IEEE ICIT '04, 2004, Vol.1, p.258-261 Vol. 1
2004
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