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Pulsed characterisation of trapping dynamics in AlGaN/GaN HEMTs

Electronics letters, 2013-10, Vol.49 (22), p.1406-1407

2013

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Power amplifier characterization: an active load-pull system based on six-port reflectometer using complex modulated carrier

IEEE transactions on microwave theory and techniques, 2006-06, Vol.54 (6), p.2707-2712

2006

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Measurements Under Pulsed-RF and Complex Modulated Signals Using Six-Port Reflectometers

IEEE transactions on instrumentation and measurement, 2007-12, Vol.56 (6), p.2164-2168

2007

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Multiharmonic source-pull/load-pull active setup based on six-port reflectometers: influence of the second harmonic source impedance on RF performances of power transistors

IEEE transactions on microwave theory and techniques, 2004-04, Vol.52 (4), p.1118-1124

2004

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A new automobile radar based on the six-port phase/frequency discriminator

IEEE transactions on vehicular technology, 2000-07, Vol.49 (4), p.1416-1423

2000

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A new robust method for six-port reflectometer calibration

IEEE transactions on instrumentation and measurement, 1999-10, Vol.48 (5), p.927-931

1999

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Non-linear modeling of RF thermistor, application to bolometer mount calibration

CPEM 2010, 2010, p.698-699

2010

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Noise and power optimization of a MMIC quasi-circulator

IEEE transactions on microwave theory and techniques, 1997-09, Vol.45 (9), p.1572-1577

1997

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Automated characterization of HF power transistors by source-pull and multiharmonic load-pull measurements based on six-port techniques

IEEE transactions on microwave theory and techniques, 1998-12, Vol.46 (12), p.2068-2073

1998

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New structure for a six-port reflectometer in monolithic microwave integrated-circuit technology

IEEE transactions on instrumentation and measurement, 1997-04, Vol.46 (2), p.527-530

1997

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MMIC impedance matching system

Electronics letters, 2000-08, Vol.36 (16), p.1393-1394

2000

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Development and verification of a new non-linear MOSFET model

2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278), 2002, Vol.1, p.597-599 vol.1

2002

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An active millimeter load-pull measurement system using two six-port reflectometers operating in the W-frequency band

IEEE transactions on instrumentation and measurement, 2002-06, Vol.51 (3), p.408-412

2002

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Nonlinear Modeling of RF Thermistor: Application to Bolometer Mount Calibration

IEEE transactions on instrumentation and measurement, 2011-07, Vol.60 (7), p.2445-2448

2011

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On-wafer calibration of a double six-port reflectometer including constants for absolute power measurements

IEEE transactions on instrumentation and measurement, 1997-10, Vol.46 (5), p.1111-1114

1997

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Experimental comparison of load-pull measurement systems for nonlinear power transistor characterization

IEEE transactions on instrumentation and measurement, 1997-12, Vol.46 (6), p.1251-1255

1997

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A new structure for a six-port reflectometer using a silicon MOSFET for power measurement

1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282), 1999, Vol.4, p.1647-1650 vol.4

1999

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Development and verification of a new non-linear MOSFET model

2002 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium. Digest of Papers (Cat. No.02CH37280), 2002, p.487-489

2002

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A new calculation approach of transistor noise parameters as a function of gatewidth and bias current

IEEE transactions on microwave theory and techniques, 1997-03, Vol.45 (3), p.338-344, Article 338

1997

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Characterization of diode detectors used in six-port reflectometers

IEEE transactions on instrumentation and measurement, 1991-12, Vol.40 (6), p.1041-1043

1991

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A simple impedance correction for on-wafer TAN calibration techniques

2008 Conference on Precision Electromagnetic Measurements Digest, 2008, p.418-419

2008

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Millimetric network analyser using a single six-port reflectometer

Electronics letters, 1993, Vol.29 (3), p.256-258

1993

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Etalonnage TRA amélioré pour des mesures traçables de paramètres S sous pointes

Revue Française de Métrologie, 2010 (23), p.21-25

2010

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A national intercomparison between automatic network analyzers

IEEE transactions on instrumentation and measurement, 1993-04, Vol.42 (2), p.511-515

1993

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A six-port reflectometer calibration using Schottky diodes operating in AC detection mode

IEEE transactions on instrumentation and measurement, 1993-04, Vol.42 (2), p.505-510

1993

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Pulsed characterisation of trapping dynamics in AlGaN/GaN HEMTs

Power amplifier characterization: an active load-pull system based on six-port reflectometer using complex modulated carrier

Measurements Under Pulsed-RF and Complex Modulated Signals Using Six-Port Reflectometers

Multiharmonic source-pull/load-pull active setup based on six-port reflectometers: influence of the second harmonic source impedance on RF performances of power transistors

A new automobile radar based on the six-port phase/frequency discriminator

A new robust method for six-port reflectometer calibration

Non-linear modeling of RF thermistor, application to bolometer mount calibration

Noise and power optimization of a MMIC quasi-circulator

Automated characterization of HF power transistors by source-pull and multiharmonic load-pull measurements based on six-port techniques

New structure for a six-port reflectometer in monolithic microwave integrated-circuit technology

MMIC impedance matching system

Development and verification of a new non-linear MOSFET model

An active millimeter load-pull measurement system using two six-port reflectometers operating in the W-frequency band

Nonlinear Modeling of RF Thermistor: Application to Bolometer Mount Calibration

On-wafer calibration of a double six-port reflectometer including constants for absolute power measurements

Experimental comparison of load-pull measurement systems for nonlinear power transistor characterization

A new structure for a six-port reflectometer using a silicon MOSFET for power measurement

Development and verification of a new non-linear MOSFET model

A new calculation approach of transistor noise parameters as a function of gatewidth and bias current

Characterization of diode detectors used in six-port reflectometers

A simple impedance correction for on-wafer TAN calibration techniques

Millimetric network analyser using a single six-port reflectometer

Etalonnage TRA amélioré pour des mesures traçables de paramètres S sous pointes

A national intercomparison between automatic network analyzers

A six-port reflectometer calibration using Schottky diodes operating in AC detection mode

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