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The development of SIMS and international SIMS conferences: a personal retrospective view

Surface and interface analysis, 2011-01, Vol.43 (1-2), p.2-11

Benninghoven, A.

2011

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Secondary ion emission from polymer surfaces under Ar+, Xe+ and SF5+ ion bombardment

Applied surface science, 1998-05, Vol.133 (1-2), p.47-57

1998

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Secondary ion emission from polymer surfaces under Ar +, Xe + and SF 5+ ion bombardment

Applied surface science, 1998, Vol.133 (1), p.47-57

1998

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Surface analysis by Secondary Ion Mass Spectrometry (SIMS)

Surface science, 1994, Vol.299 (1-3), p.246-260

Benninghoven, A

1994

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Application of atomic and molecular primary ions for TOF–SIMS analysis of additive containing polymer surfaces

Applied surface science, 2001-04, Vol.174 (3), p.261-270

2001

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Secondary ion emission from polymethacrylate LB-layers under 0.5–11 keV atomic and molecular primary ion bombardment

Applied surface science, 2000-05, Vol.158 (3-4), p.362-374

2000

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Optimized time-of-flight secondary ion mass spectroscopy depth profiling with a dual beam technique

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1997-05, Vol.15 (3), p.460-464

1997

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Nonresonant Laser–SNMS and TOF–SIMS analysis of sub-μm structures

Applied surface science, 2003-01, Vol.203, p.238-243

2003

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Secondary ion emission from arachidic acid LB-layers under Ar +, Xe +, Ga + and SF 5+ primary ion bombardment

Applied surface science, 1999, Vol.140 (1), p.156-167

1999

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Secondary ion emission from arachidic acid LB-layers under Ar+, Xe+, Ga+ and SF5+ primary ion bombardment

Applied surface science, 1999-02, Vol.140 (1-2), p.156-167

1999

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Secondary ion emission from phosphatidic acid sandwich films under atomic and molecular primary ion bombardment

Applied surface science, 2001-11, Vol.183 (3), p.301-303

2001

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Correction of dead time effects in time-of-flight mass spectrometry

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1994-03, Vol.12 (2), p.405-410

1994

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Molecular secondary particle emission from molecular overlayers under 10 keV Ar + primary ion bombardment

Surface science, 2001-01, Vol.471 (1), p.170-184

2001

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Detection and Quantification of Metals in Organic Materials by Laser-SNMS with Nonresonant Multiphoton Ionization

Analytical chemistry (Washington), 2000-09, Vol.72 (18), p.4289-4295

2000

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Time-of-flight secondary ion mass spectrometry investigations of self-assembled monolayers of organic thiols, sulfides, and disulfides on gold surfaces

Langmuir, 1993-07, Vol.9 (7), p.1622-1624

1993

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Molecular secondary ion emission from adenine overlayers in dependence on the primary ion species and substrate material

Surface science, 2003-03, Vol.526 (3), p.351-355

2003

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Secondary ion emission from molecular overlayers: Thiols on gold

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2000-03, Vol.18 (2), p.312-319

2000

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Antioxidant segregation and crystallisation at polyester surfaces studied by ToF-SIMS

Applied surface science, 2003-01, Vol.203, p.571-574

2003

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Imaging Time-of-Flight Secondary Ion Mass Spectrometry Allows Visualization and Analysis of Coexisting Phases in Langmuir−Blodgett Films

Langmuir, 1996-04, Vol.12 (7), p.1708-1711

1996

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Combined ToF-SIMS/XPS study of plasma modification and metallization of polyimide

Surface and interface analysis, 1999-07, Vol.27 (7), p.609-617

1999

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Study of molecular surface diffusion by imaging static secondary ion mass spectrometry (SIMS): polymers on Ag-surfaces

Applied surface science, 1998-09, Vol.134 (1), p.271-274

1998

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TOF-SIMS depth profiling of SIMON

Applied surface science, 2003-01, Vol.203, p.441-444

2003

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An improved method for quantification of cholesterol and cholesteryl esters in human monocyte-derived macrophages by high performance liquid chromatography with identification of unassigned cholesteryl ester species by means of secondary ion mass spectrometry

Journal of lipid research, 1997-02, Vol.38 (2), p.401-409

1997

Volltextzugriff (PDF)

In situ ToF-SIMS/XPS investigation of nitrogen plasma-modified polystyrene surfaces

Surface and interface analysis, 1994-05, Vol.21 (5), p.274-282

1994

Volltextzugriff (PDF)

Developments in secondary ion mass spectroscopy and applications to surface studies

Surface science, 1975-01, Vol.53 (1), p.596-625

Benninghoven, A.

1975

Volltextzugriff (PDF)

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The development of SIMS and international SIMS conferences: a personal retrospective view

Secondary ion emission from polymer surfaces under Ar+, Xe+ and SF5+ ion bombardment

Secondary ion emission from polymer surfaces under Ar +, Xe + and SF 5+ ion bombardment

Surface analysis by Secondary Ion Mass Spectrometry (SIMS)

Application of atomic and molecular primary ions for TOF–SIMS analysis of additive containing polymer surfaces

Secondary ion emission from polymethacrylate LB-layers under 0.5–11 keV atomic and molecular primary ion bombardment

Optimized time-of-flight secondary ion mass spectroscopy depth profiling with a dual beam technique

Nonresonant Laser–SNMS and TOF–SIMS analysis of sub-μm structures

Secondary ion emission from arachidic acid LB-layers under Ar +, Xe +, Ga + and SF 5+ primary ion bombardment

Secondary ion emission from arachidic acid LB-layers under Ar+, Xe+, Ga+ and SF5+ primary ion bombardment

Secondary ion emission from phosphatidic acid sandwich films under atomic and molecular primary ion bombardment

Correction of dead time effects in time-of-flight mass spectrometry

Molecular secondary particle emission from molecular overlayers under 10 keV Ar + primary ion bombardment

Detection and Quantification of Metals in Organic Materials by Laser-SNMS with Nonresonant Multiphoton Ionization

Time-of-flight secondary ion mass spectrometry investigations of self-assembled monolayers of organic thiols, sulfides, and disulfides on gold surfaces

Molecular secondary ion emission from adenine overlayers in dependence on the primary ion species and substrate material

Secondary ion emission from molecular overlayers: Thiols on gold

Antioxidant segregation and crystallisation at polyester surfaces studied by ToF-SIMS

Imaging Time-of-Flight Secondary Ion Mass Spectrometry Allows Visualization and Analysis of Coexisting Phases in Langmuir−Blodgett Films

Combined ToF-SIMS/XPS study of plasma modification and metallization of polyimide

Study of molecular surface diffusion by imaging static secondary ion mass spectrometry (SIMS): polymers on Ag-surfaces

TOF-SIMS depth profiling of SIMON

An improved method for quantification of cholesterol and cholesteryl esters in human monocyte-derived macrophages by high performance liquid chromatography with identification of unassigned cholesteryl ester species by means of secondary ion mass spectrometry

In situ ToF-SIMS/XPS investigation of nitrogen plasma-modified polystyrene surfaces

Developments in secondary ion mass spectroscopy and applications to surface studies

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