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Traceable Characterization of Nanomaterials by X-ray Spectrometry Using Calibrated Instrumentation

Nanomaterials (Basel, Switzerland), 2022-06, Vol.12 (13), p.2255

Beckhoff, Burkhard

2022

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Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy

Optics express, 2014-07, Vol.22 (15), p.17948-17958

2014

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A quarter-century of metrology using synchrotron radiation by PTB in Berlin

physica status solidi (b), 2009-07, Vol.246 (7), p.1415-1434

2009

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Summary of ISO standard 20289: Total reflection X‐ray fluorescence analysis of water

Surface and interface analysis, 2020-03, Vol.52 (3), p.119-123

2020

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Reference-free X-ray spectrometry based on metrology using synchrotron radiation

Journal of analytical atomic spectrometry, 2008, Vol.23 (6), p.845-853

Beckhoff, Burkhard

2008

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Quantitative surface characterization of silicon spheres by combined XRF and XPS analysis for the determination of the Avogadro constant

Metrologia, 2017-10, Vol.54 (5), p.653-662

2017

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Quantification of Element Mass Concentrations in Ambient Aerosols by Combination of Cascade Impactor Sampling and Mobile Total Reflection X-ray Fluorescence Spectroscopy

Atmosphere, 2021-03, Vol.12 (3), p.309

2021

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Reaction mechanisms for atomic layer deposition of aluminum oxide on semiconductor substrates

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2012-01, Vol.30 (1), p.01A127-01A127-10

2012

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Chemical speciation at buried interfaces in high-temperature processed polycrystalline silicon thin-film solar cells on ZnO:Al

Journal of applied physics, 2013-01, Vol.113 (4)

2013

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Resonant X-ray Emission of Hexagonal Boron Nitride

Physical review. B, 2017-11, Vol.96 (20), Article 205116

2017

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Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples

Nanomaterials (Basel, Switzerland), 2022-10, Vol.12 (21), p.3766

2022

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Reinhold Klockenkämper and Alex von Bohlen: Total-reflection X-ray fluorescence analysis and related methods, 2nd ed

Analytical and Bioanalytical Chemistry, 2016, Vol.408 (3), p.667-669

Beckhoff, Burkhard

2016

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Nondestructive Speciation Depth Profiling of Complex TiOx Nanolayer Structures by Grazing Incidence X-ray Fluorescence Analysis and Near Edge X-ray Absorption Fine Structure Spectroscopy

Analytical chemistry (Washington), 2015-08, Vol.87 (15), p.7705-7711

2015

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Thickness determination for Cu and Ni nanolayers: Comparison of completely reference-free fundamental parameter-based X-ray fluorescence analysis and X-ray reflectometry

Spectrochimica acta. Part B: Atomic spectroscopy, 2005-04, Vol.60 (4), p.505-510

2005

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In Situ Electric-Field Study of Surface Effects in Domain Engineered Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 Relaxor Crystals by Grazing Incidence Diffraction

Crystals (Basel), 2020-09, Vol.10 (9), p.728

2020

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The present and future of microcalorimeter X-ray detectors for fundamental X-ray parameters

Radiation physics and chemistry (Oxford, England : 1993), 2024-05, Vol.218, p.111576, Article 111576

2024

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Fabrication of FeNi hydroxides double-shell nanotube arrays with enhanced performance for oxygen evolution reaction

Applied catalysis. B, Environmental, 2020-02, Vol.261, p.118193, Article 118193

2020

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Experimental determination of tantalum L-shell fluorescence yields and Coster–Kronig transition probabilities

Journal of analytical atomic spectrometry, 2023-01, Vol.38 (1), p.197-203

2023

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Experimental determination of ruthenium L-shell fluorescence yields and Coster-Kronig transition probabilities

Journal of analytical atomic spectrometry, 2023-06, Vol.38 (6), p.131-136

2023

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Nondestructive Speciation Depth Profiling of Complex TiO x Nanolayer Structures by Grazing Incidence X‑ray Fluorescence Analysis and Near Edge X‑ray Absorption Fine Structure Spectroscopy

Analytical chemistry (Washington), 2015-08, Vol.87 (15), p.7705-7711

2015

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Experimental determination of tantalum L-shell fluorescence yields and CosterKronig transition probabilities

Journal of analytical atomic spectrometry, 2023-01, Vol.38 (1), p.197-23

2023

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Quantitative depth profiling of boron and arsenic ultra low energy implants by pulsed rf-GD-ToFMS

Journal of analytical atomic spectrometry, 2011-01, Vol.26 (3), p.542-549

2011

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A multi-edge study: investigating Co oxidation states of pristine LiNiMnCoO cathode materials by high energy-resolution X-ray spectrometry

Physical chemistry chemical physics : PCCP, 2024-04, Vol.26 (14), p.1599-169

2024

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A multi-edge study: investigating Co oxidation states of pristine LiNi x Mn y Co 1- x - y O 2 cathode materials by high energy-resolution X-ray spectrometry

Physical chemistry chemical physics : PCCP, 2024-04, Vol.26 (14), p.10599-10609

2024

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A multi-edge study: investigating Co oxidation states of pristine LiNixMnyCo1−x−yO2 cathode materials by high energy-resolution X-ray spectrometry

Physical chemistry chemical physics : PCCP, 2024-04, Vol.26 (14), p.10599-10609

2024

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Traceable Characterization of Nanomaterials by X-ray Spectrometry Using Calibrated Instrumentation

Characterization of semiconductor materials using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy

A quarter-century of metrology using synchrotron radiation by PTB in Berlin

Summary of ISO standard 20289: Total reflection X‐ray fluorescence analysis of water

Reference-free X-ray spectrometry based on metrology using synchrotron radiation

Quantitative surface characterization of silicon spheres by combined XRF and XPS analysis for the determination of the Avogadro constant

Quantification of Element Mass Concentrations in Ambient Aerosols by Combination of Cascade Impactor Sampling and Mobile Total Reflection X-ray Fluorescence Spectroscopy

Reaction mechanisms for atomic layer deposition of aluminum oxide on semiconductor substrates

Chemical speciation at buried interfaces in high-temperature processed polycrystalline silicon thin-film solar cells on ZnO:Al

Resonant X-ray Emission of Hexagonal Boron Nitride

Scan-Free GEXRF in the Soft X-ray Range for the Investigation of Structured Nanosamples

Reinhold Klockenkämper and Alex von Bohlen: Total-reflection X-ray fluorescence analysis and related methods, 2nd ed

Nondestructive Speciation Depth Profiling of Complex TiOx Nanolayer Structures by Grazing Incidence X-ray Fluorescence Analysis and Near Edge X-ray Absorption Fine Structure Spectroscopy

Thickness determination for Cu and Ni nanolayers: Comparison of completely reference-free fundamental parameter-based X-ray fluorescence analysis and X-ray reflectometry

In Situ Electric-Field Study of Surface Effects in Domain Engineered Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3 Relaxor Crystals by Grazing Incidence Diffraction

The present and future of microcalorimeter X-ray detectors for fundamental X-ray parameters

Fabrication of FeNi hydroxides double-shell nanotube arrays with enhanced performance for oxygen evolution reaction

Experimental determination of tantalum L-shell fluorescence yields and Coster–Kronig transition probabilities

Experimental determination of ruthenium L-shell fluorescence yields and Coster-Kronig transition probabilities

Nondestructive Speciation Depth Profiling of Complex TiO x Nanolayer Structures by Grazing Incidence X‑ray Fluorescence Analysis and Near Edge X‑ray Absorption Fine Structure Spectroscopy

Experimental determination of tantalum L-shell fluorescence yields and CosterKronig transition probabilities

Quantitative depth profiling of boron and arsenic ultra low energy implants by pulsed rf-GD-ToFMS

A multi-edge study: investigating Co oxidation states of pristine LiNiMnCoO cathode materials by high energy-resolution X-ray spectrometry

A multi-edge study: investigating Co oxidation states of pristine LiNi x Mn y Co 1- x - y O 2 cathode materials by high energy-resolution X-ray spectrometry

A multi-edge study: investigating Co oxidation states of pristine LiNixMnyCo1−x−yO2 cathode materials by high energy-resolution X-ray spectrometry

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