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Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films

Journal of synchrotron radiation, 2003-03, Vol.10 (2), p.137-143

2003

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High spatial resolution grain orientation and strain mapping in thin films using polychromatic submicron x-ray diffraction

Applied physics letters, 2002-05, Vol.80 (20), p.3724-3726

2002

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Local plasticity of Al thin films as revealed by x-ray microdiffraction

Physical review letters, 2003-03, Vol.90 (9), p.096102-096102, Article 096102

2003

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X-ray microdiffraction: local stress distributions in polycrystalline and epitaxial thin films

Microelectronic engineering, 2004-07, Vol.75 (1), p.117-126

2004

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Songbirds do not create long–term stores of calcium in their legs prior to laying: results from high–resolution radiography

Proceedings of the Royal Society. B, Biological sciences, 1997-02, Vol.264 (1379), p.239-244

1997

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Electromigration-induced plastic deformation in passivated metal lines

Applied physics letters, 2002-11, Vol.81 (22), p.4168-4170

2002

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Submicron X-ray diffraction

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2001-07, Vol.467, p.936-943

2001

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Depth-controlled grazing-incidence diffraction of synchrotron X radiation

Physical review letters, 1986-03, Vol.56 (11), p.1144-1147

1986

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Early stage of plastic deformation in thin films undergoing electromigration

Journal of applied physics, 2003-09, Vol.94 (6), p.3757-3761

2003

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Magnetic X-ray-scattering study of interfacial magnetism in a Gd-Y superlattice

Physical review letters, 1986-02, Vol.56 (7), p.757-760

1986

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Shear at twin domain boundaries in YBa2Cu3O7-x

Physical review letters, 2004-05, Vol.92 (21), p.216105-216105

2004

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Measurement of the silicon (111) surface contraction

Physical review letters, 1986-01, Vol.56 (3), p.236-239

1986

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High‐flux x‐ray undulator radiation from proposed B factory storage rings at Cornell University

Review of Scientific Instruments, 1992, Vol.63 (1), p.1590-1593

1992

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Determination of phase using multiple-beam effects

Acta crystallographica. Section A, Foundations of crystallography, 1986-11, Vol.42 (6), p.510-514

1986

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Entering a new phase

Nature (London), 1987, Vol.329 (6136), p.201-201

Batterman, B. W

1987

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Determination of magnitude, phase, and temperature dependence of forbidden reflections in silicon and germanium

Physical review. B, Condensed matter, 1984-01, Vol.30 (12), p.7060-7066

1984

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X-Ray Study of Order in the Alloy CuAu3

Journal of applied physics, 1957-05, Vol.28 (5), p.556-561

Batterman, B. W.

1957

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Crystallography. Entering a new phase

Nature (London), 1987-09, Vol.329 (6136), p.201-201

Batterman, B W

1987

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Crystallographic Study of the Low-Temperature Phase Transformation in V3Si and Nb3Sn

Journal of applied physics, 1970-08, Vol.41 (9), p.3610-3614

1970

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Synchrotron-radiation measurements of forbidden reflections in silicon and germanium

Physical review. B, Condensed matter, 1980-01, Vol.22 (6), p.2887-2897

1980

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Design of beam line components for the high power wiggler beam line at CHESS

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 1994-08, Vol.347 (1), p.609-614

1994

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Effect of Stress on the Low-Temperature Phase Transformation in V3Si

Journal of applied physics, 1966-08, Vol.37 (9), p.3447-3449

1966

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Bonding-Electron Distributions, Anharmonicity, and the Temperature Dependence of the Forbidden Si(442) Reflection

Physical review. B, Solid state, 1972-01, Vol.6 (10), p.3659-3666

1972

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Observations Related to the Order of the Low Temperature Structural Transformation in V3Si and Nb3Sn

physica status solidi (b), 1969, Vol.32 (1), p.K67-K69

1969

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Shear at Twin Domain Boundaries in YBa 2 Cu 3 O 7 − x

Physical review letters, 2004-05, Vol.92 (21), Article 216105

2004

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Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films

High spatial resolution grain orientation and strain mapping in thin films using polychromatic submicron x-ray diffraction

Local plasticity of Al thin films as revealed by x-ray microdiffraction

X-ray microdiffraction: local stress distributions in polycrystalline and epitaxial thin films

Songbirds do not create long–term stores of calcium in their legs prior to laying: results from high–resolution radiography

Electromigration-induced plastic deformation in passivated metal lines

Submicron X-ray diffraction

Depth-controlled grazing-incidence diffraction of synchrotron X radiation

Early stage of plastic deformation in thin films undergoing electromigration

Magnetic X-ray-scattering study of interfacial magnetism in a Gd-Y superlattice

Shear at twin domain boundaries in YBa2Cu3O7-x

Measurement of the silicon (111) surface contraction

High‐flux x‐ray undulator radiation from proposed B factory storage rings at Cornell University

Determination of phase using multiple-beam effects

Entering a new phase

Determination of magnitude, phase, and temperature dependence of forbidden reflections in silicon and germanium

X-Ray Study of Order in the Alloy CuAu3

Crystallography. Entering a new phase

Crystallographic Study of the Low-Temperature Phase Transformation in V3Si and Nb3Sn

Synchrotron-radiation measurements of forbidden reflections in silicon and germanium

Design of beam line components for the high power wiggler beam line at CHESS

Effect of Stress on the Low-Temperature Phase Transformation in V3Si

Bonding-Electron Distributions, Anharmonicity, and the Temperature Dependence of the Forbidden Si(442) Reflection

Observations Related to the Order of the Low Temperature Structural Transformation in V3Si and Nb3Sn

Shear at Twin Domain Boundaries in YBa 2 Cu 3 O 7 − x

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