UB Paderborn / Katalog / Suche / in CDI

The Beauty and Clarity of a Well Designed Experiment

Microscopy and microanalysis, 2022-08, Vol.28 (S1), p.2738-2740

Batson, P.E.

2022

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Sub-ångstrom resolution using aberration corrected electron optics

Nature (London), 2002-08, Vol.418 (6898), p.617-620

2002

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Formation of nanopores in a SiN∕SiO2 membrane with an electron beam

Applied physics letters, 2005-09, Vol.87 (11)

2005

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Probing Phonon and Infrared-Plasmons in Nanoscale Interfaces

Microscopy and microanalysis, 2019-08, Vol.25 (S2), p.598-599

2019

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Simultaneous STEM imaging and electron energy-loss spectroscopy with atomic-column sensitivity

Nature (London), 1993-12, Vol.366 (6457), p.727-728

Batson, P. E

1993

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Direct Determination of Local Lattice Polarity in Crystals

Science (American Association for the Advancement of Science), 2006-06, Vol.312 (5778), p.1354-1354

2006

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Progress in aberration-corrected scanning transmission electron microscopy

Journal of electron microscopy, 2001-01, Vol.50 (3), p.177-185

2001

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Control of Parasitic Aberrations in Multipole Corrector Optics

Microscopy and microanalysis, 2008-08, Vol.14 (S2), p.830-831

Batson, PE

2008

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Aberration correction results in the IBM STEM instrument

Ultramicroscopy, 2003-09, Vol.96 (3), p.239-249

Batson, P.E.

2003

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High Resolution EELS in the IBM Sub-Angstrom STEM

Microscopy and microanalysis, 2006-08, Vol.12 (S02), p.1336-1337

Batson, PE

2006

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Advanced spatially resolved EELS in the STEM

Ultramicroscopy, 1999-06, Vol.78 (1), p.33-42

Batson, P.E

1999

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Plasmon Driven Nanoparticle Movement in the Electron Beam

Microscopy and microanalysis, 2010-07, Vol.16 (S2), p.1766-1767

2010

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Artifacts in aberration-corrected ADF-STEM imaging

Ultramicroscopy, 2003-09, Vol.96 (3), p.275-284

2003

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Carbon 1s near-edge-absorption fine structure in graphite

Physical review. B, Condensed matter, 1993-07, Vol.48 (4), p.2608-2610

BATSON, P. E

1993

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Electron energy loss spectroscopy of single silicon nanocrystals : the conduction band

Physical review letters, 1993-08, Vol.71 (6), p.911-914

1993

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Atomic resolution EELS analysis of a misfit dislocation at a GeSi/Si interface

Physica. B, Condensed matter, 1999-12, Vol.273-274, p.593-597

Batson, P.E

1999

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Measurement and models of electron-energy-loss spectroscopy core-level shifts in nickel aluminum intermetallics

Physical review. B, Condensed matter, 1998-11, Vol.58 (18), p.11970-11981

1998

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Near atomic scale studies of electronic structure at grain boundaries in Ni3Al

Physical review letters, 1995-12, Vol.75 (26), p.4744-4747

1995

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Symmetry-selected electron-energy-loss scattering in diamond

Physical review letters, 1993-03, Vol.70 (12), p.1822-1825

BATSON, P. E

1993

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Surface Plasmon Coupling in Clusters of Small Spheres

Physical review letters, 1982-01, Vol.49 (13), p.936-940

Batson, P. E.

1982

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Near‐atomic‐resolution EELS in silicon‐germanium alloys

Journal of microscopy (Oxford), 1995-12, Vol.180 (3), p.204-210

BATSON, P. E.

1995

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High‐energy resolution electron spectrometer for 1‐nm spatial analysis

Review of scientific instruments, 1986-01, Vol.57 (1), p.43-48

Batson, P. E.

1986

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Dynamic screening of the core exciton by swift electrons in electron-energy-loss scattering

Physical review letters, 1991-07, Vol.67 (3), p.350-353

1991

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Spatial resolution in electron energy loss spectroscopy

Ultramicroscopy, 1992, Vol.47 (1), p.133-144

Batson, P.E.

1992

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Conduction band structure of GexSi1-x using spatially resolved electron energy-loss scattering

Applied physics letters, 1991-12, Vol.59 (25), p.3285-3287

1991

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The Beauty and Clarity of a Well Designed Experiment

Sub-ångstrom resolution using aberration corrected electron optics

Formation of nanopores in a SiN∕SiO2 membrane with an electron beam

Probing Phonon and Infrared-Plasmons in Nanoscale Interfaces

Simultaneous STEM imaging and electron energy-loss spectroscopy with atomic-column sensitivity

Direct Determination of Local Lattice Polarity in Crystals

Progress in aberration-corrected scanning transmission electron microscopy

Control of Parasitic Aberrations in Multipole Corrector Optics

Aberration correction results in the IBM STEM instrument

High Resolution EELS in the IBM Sub-Angstrom STEM

Advanced spatially resolved EELS in the STEM

Plasmon Driven Nanoparticle Movement in the Electron Beam

Artifacts in aberration-corrected ADF-STEM imaging

Carbon 1s near-edge-absorption fine structure in graphite

Electron energy loss spectroscopy of single silicon nanocrystals : the conduction band

Atomic resolution EELS analysis of a misfit dislocation at a GeSi/Si interface

Measurement and models of electron-energy-loss spectroscopy core-level shifts in nickel aluminum intermetallics

Near atomic scale studies of electronic structure at grain boundaries in Ni3Al

Symmetry-selected electron-energy-loss scattering in diamond

Surface Plasmon Coupling in Clusters of Small Spheres

Near‐atomic‐resolution EELS in silicon‐germanium alloys

High‐energy resolution electron spectrometer for 1‐nm spatial analysis

Dynamic screening of the core exciton by swift electrons in electron-energy-loss scattering

Spatial resolution in electron energy loss spectroscopy

Conduction band structure of GexSi1-x using spatially resolved electron energy-loss scattering

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