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Growth and interaction of dendritic equiaxed grains: In situ characterization by synchrotron X-ray radiography

Acta materialia, 2013-02, Vol.61 (4), p.1303-1315

2013

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In situ investigation of the structural defect generation and evolution during the directional solidification of 〈110〉 seeded growth Si

Acta materialia, 2016-08, Vol.115, p.210-223

2016

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{111} facet growth laws and grain competition during silicon crystallization

Journal of crystal growth, 2017-12, Vol.479, p.1-8

2017

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Analysis by synchrotron X-ray radiography of convection effects on the dynamic evolution of the solid–liquid interface and on solute distribution during the initial transient of solidification

Acta materialia, 2011-06, Vol.59 (11), p.4356-4365

2011

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Mono-like silicon ingots grown on low angle misoriented seeds: Defect characterization by synchrotron X-ray diffraction imaging

Acta materialia, 2015-04, Vol.88, p.112-120

2015

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Formation mechanism and properties of twinned structures in (111) seeded directionally solidified solar grade silicon

Acta materialia, 2016-12, Vol.121, p.24-36

2016

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Influence of natural convection during upward directional solidification: A comparison between in situ X-ray radiography and direct simulation of the grain structure

Acta materialia, 2013-08, Vol.61 (13), p.4765-4777

2013

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On the implementation of computed laminography using synchrotron radiation

Review of scientific instruments, 2011-06, Vol.82 (6), p.063702-063702-8

2011

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Combining Borrmann and weak‐beam diffraction images to study defects in a high‐quality CdTe(Zn) crystal

Journal of applied crystallography, 2023-04, Vol.56 (2), p.401-408

2023

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Growth undercooling in multi-crystalline pure silicon and in silicon containing light impurities (C and O)

Journal of crystal growth, 2017-05, Vol.466, p.64-70

2017

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Segregation, precipitation and dislocation generation between seeds in directionally solidified mono-like silicon for photovoltaic applications

Journal of crystal growth, 2014-09, Vol.401, p.397-403

2014

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Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications

Journal of applied crystallography, 2017-04, Vol.50 (2), p.561-569

2017

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Characterization of defects in mono-like silicon for photovoltaic applications using X-ray Bragg diffraction imaging

Journal of applied crystallography, 2015-06, Vol.48 (3), p.645-654

2015

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High-resolution three-dimensional imaging of flat objects by synchrotron-radiation computed laminography

Applied physics letters, 2005-02, Vol.86 (7)

2005

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A method to extract quantitative information in analyzer-based x-ray phase contrast imaging

Applied physics letters, 2003-05, Vol.82 (20), p.3421-3423

2003

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Cellular dislocations patterns in monolike silicon: Influence of stress, time under stress and impurity doping

Journal of crystal growth, 2018-05, Vol.489, p.42-50

2018

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Origin of scattering defect observed in large diameter Ti:Al2O3 crystals grown by the Kyropoulos technique

Journal of crystal growth, 2020-04, Vol.535, p.125530, Article 125530

2020

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Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x rays

Applied physics letters, 1999-11, Vol.75 (19), p.2912-2914

1999

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In Situ Investigation of Dendrite Deformation During Upward Solidification of Al-7wt.%Si

JOM (1989), 2014-08, Vol.66 (8), p.1408-1414

2014

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Bragg Diffraction Imaging of CdZnTe Single Crystals

Journal of electronic materials, 2020-08, Vol.49 (8), p.4550-4556

2020

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In situ and real-time analysis of TGZM phenomena by synchrotron X-ray radiography

Journal of crystal growth, 2008-05, Vol.310 (11), p.2906-2914

2008

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Inception and movement of a `subgrain boundary precursor' in ice under an applied stress, observed by X-ray synchrotron radiation Bragg imaging

Journal of applied crystallography, 2015-06, Vol.48 (3), p.672-678

2015

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Optimization of phase contrast imaging using hard x rays

Review of scientific instruments, 2005-07, Vol.76 (7), p.073705-073705-7

2005

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In-Situ and Real-Time Analysis of the Formation of Strains and Microstructure Defects during Solidification of Al-3.5 Wt Pct Ni Alloys

Metallurgical and materials transactions. A, Physical metallurgy and materials science, 2008-04, Vol.39 (4), p.865-874

2008

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Quantitative phase and absorption tomography with an X-ray grating interferometer and synchrotron radiation

Physica status solidi. A, Applications and materials science, 2011-11, Vol.208 (11), p.2526-2532

2011

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Growth and interaction of dendritic equiaxed grains: In situ characterization by synchrotron X-ray radiography

In situ investigation of the structural defect generation and evolution during the directional solidification of 〈110〉 seeded growth Si

{111} facet growth laws and grain competition during silicon crystallization

Analysis by synchrotron X-ray radiography of convection effects on the dynamic evolution of the solid–liquid interface and on solute distribution during the initial transient of solidification

Mono-like silicon ingots grown on low angle misoriented seeds: Defect characterization by synchrotron X-ray diffraction imaging

Formation mechanism and properties of twinned structures in (111) seeded directionally solidified solar grade silicon

Influence of natural convection during upward directional solidification: A comparison between in situ X-ray radiography and direct simulation of the grain structure

On the implementation of computed laminography using synchrotron radiation

Combining Borrmann and weak‐beam diffraction images to study defects in a high‐quality CdTe(Zn) crystal

Growth undercooling in multi-crystalline pure silicon and in silicon containing light impurities (C and O)

Segregation, precipitation and dislocation generation between seeds in directionally solidified mono-like silicon for photovoltaic applications

Synchrotron Bragg diffraction imaging characterization of synthetic diamond crystals for optical and electronic power device applications

Characterization of defects in mono-like silicon for photovoltaic applications using X-ray Bragg diffraction imaging

High-resolution three-dimensional imaging of flat objects by synchrotron-radiation computed laminography

A method to extract quantitative information in analyzer-based x-ray phase contrast imaging

Cellular dislocations patterns in monolike silicon: Influence of stress, time under stress and impurity doping

Origin of scattering defect observed in large diameter Ti:Al2O3 crystals grown by the Kyropoulos technique

Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x rays

In Situ Investigation of Dendrite Deformation During Upward Solidification of Al-7wt.%Si

Bragg Diffraction Imaging of CdZnTe Single Crystals

In situ and real-time analysis of TGZM phenomena by synchrotron X-ray radiography

Inception and movement of a `subgrain boundary precursor' in ice under an applied stress, observed by X-ray synchrotron radiation Bragg imaging

Optimization of phase contrast imaging using hard x rays

In-Situ and Real-Time Analysis of the Formation of Strains and Microstructure Defects during Solidification of Al-3.5 Wt Pct Ni Alloys

Quantitative phase and absorption tomography with an X-ray grating interferometer and synchrotron radiation

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