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Time‐of‐flight secondary ion mass spectrometry and X‐ray photoelectron spectroscopy protocol for the analysis of organic multilayers

Surface and interface analysis, 2024-03, Vol.56 (3), p.129-135

2024

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Accelerating the development of phase‐change random access memory with in‐fab plasma profiling time‐of‐flight mass spectrometry

Surface and interface analysis, 2020-12, Vol.52 (12), p.895-899

2020

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Two-step cycling process alternating implantation and remote plasma etching for topographically selective etching: Application to Si3N4 spacer etching

Journal of applied physics, 2019-12, Vol.126 (24)

2019

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Role of the chemical composition and structure on the electrical properties of a solid state electrolyte: Case of a highly conductive LiPON

Electrochimica acta, 2018-01, Vol.259, p.742-751

2018

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Identifying exposition to low oxygen environment in human macrophages using secondary ion mass spectrometry and multivariate analysis

Rapid communications in mass spectrometry, 2017-10, Vol.31 (19), p.1623-1632

2017

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Multitechnique elemental depth profiling of InAlGaN and InAlN films

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2018-05, Vol.36 (3)

2018

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Halide Perovskite Precursors Dope PEDOT:PSS

Advanced electronic materials, 2021-09, Vol.7 (9), p.n/a

2021

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Investigation of sidewall damage induced by reactive ion etching on AlGaInP MESA for micro-LED application

Journal of luminescence, 2021-06, Vol.234, p.117937, Article 117937

2021

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Anisotropic and low damage III-V/Ge heterostructure etching for multijunction solar cell fabrication with passivated sidewalls

Micro and Nano Engineering, 2021-06, Vol.11, p.100083, Article 100083

2021

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A novel PFIB sample preparation protocol for correlative 3D X-ray CNT and FIB-TOF-SIMS tomography

Ultramicroscopy, 2017-02, Vol.173, p.10-13

2017

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Elemental Characterization of Al Nanoparticles Buried under a Cu Thin Film: TOF-SIMS vs STEM/EDX

Analytical chemistry (Washington), 2020-09, Vol.92 (18), p.12518-12527

2020

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Unifying natural and laboratory chemical weathering with interfacial dissolution–reprecipitation: A study based on the nanometer-scale chemistry of fluid–silicate interfaces

Chemical geology, 2012-02, Vol.294-295, p.203-216

2012

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Dopant profiling of focused ion beam milled semiconductors using off-axis electron holography; reducing artifacts, extending detection limits and reducing the effects of gallium implantation

Ultramicroscopy, 2010-04, Vol.110 (5), p.383-389

2010

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3D Imaging of Nanoparticles in an Inorganic Matrix Using TOF-SIMS Validated with STEM and EDX

Analytical chemistry (Washington), 2019-09, Vol.91 (18), p.11834-11839

2019

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Quantitative analysis of Si/SiGeC superlattices using atom probe tomography

Ultramicroscopy, 2015-12, Vol.159, p.223-231

2015

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Ionic migrations during poling process in lanthanum aluminate investigated by time of flight-secondary ions mass spectrometry and piezoresponse force microscopy combined methodology

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2020-05, Vol.38 (3)

2020

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M-Plane Core–Shell InGaN/GaN Multiple-Quantum-Wells on GaN Wires for Electroluminescent Devices

Nano letters, 2011-11, Vol.11 (11), p.4839-4845

2011

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Suppression of self-organized surface nanopatterning on GaSb/InAs multilayers induced by low energy oxygen ion bombardment by using simultaneously sample rotation and oxygen flooding

Applied surface science, 2018-05, Vol.441, p.218-222

2018

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Combined ToF-SIMS and AFM protocol for accurate 3D chemical analysis and data visualization

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2018-05, Vol.36 (3), p.324-327

2018

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Combining plasma profiling TOFMS with TOF-SIMS depth profiling for microelectronic applications

Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2016-05, Vol.34 (3)

2016

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Preparation and Analysis of Atom Probe Tips by Xenon Focused Ion Beam Milling

Microscopy and microanalysis, 2016-06, Vol.22 (3), p.576-582

2016

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Nanofibrillated cellulose surface grafting in ionic liquid

Soft matter, 2012-01, Vol.8 (32), p.8338-8349

2012

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Impact of growth conditions on AlN/GaN heterostructures with in-situ SiN capping layer

Journal of crystal growth, 2019-06, Vol.515, p.48-52

2019

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VAMAS TWA2 interlaboratory comparison: Surface analysis of TiO2 nanoparticles using ToF-SIMS

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2023-09, Vol.41 (5)

2023

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Bright and efficient inverted organic light-emitting diodes with improved solution-processed electron-transport interlayers

Organic electronics, 2017-09, Vol.48, p.377-381

2017

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Time‐of‐flight secondary ion mass spectrometry and X‐ray photoelectron spectroscopy protocol for the analysis of organic multilayers

Accelerating the development of phase‐change random access memory with in‐fab plasma profiling time‐of‐flight mass spectrometry

Two-step cycling process alternating implantation and remote plasma etching for topographically selective etching: Application to Si3N4 spacer etching

Role of the chemical composition and structure on the electrical properties of a solid state electrolyte: Case of a highly conductive LiPON

Identifying exposition to low oxygen environment in human macrophages using secondary ion mass spectrometry and multivariate analysis

Multitechnique elemental depth profiling of InAlGaN and InAlN films

Halide Perovskite Precursors Dope PEDOT:PSS

Investigation of sidewall damage induced by reactive ion etching on AlGaInP MESA for micro-LED application

Anisotropic and low damage III-V/Ge heterostructure etching for multijunction solar cell fabrication with passivated sidewalls

A novel PFIB sample preparation protocol for correlative 3D X-ray CNT and FIB-TOF-SIMS tomography

Elemental Characterization of Al Nanoparticles Buried under a Cu Thin Film: TOF-SIMS vs STEM/EDX

Unifying natural and laboratory chemical weathering with interfacial dissolution–reprecipitation: A study based on the nanometer-scale chemistry of fluid–silicate interfaces

Dopant profiling of focused ion beam milled semiconductors using off-axis electron holography; reducing artifacts, extending detection limits and reducing the effects of gallium implantation

3D Imaging of Nanoparticles in an Inorganic Matrix Using TOF-SIMS Validated with STEM and EDX

Quantitative analysis of Si/SiGeC superlattices using atom probe tomography

Ionic migrations during poling process in lanthanum aluminate investigated by time of flight-secondary ions mass spectrometry and piezoresponse force microscopy combined methodology

M-Plane Core–Shell InGaN/GaN Multiple-Quantum-Wells on GaN Wires for Electroluminescent Devices

Suppression of self-organized surface nanopatterning on GaSb/InAs multilayers induced by low energy oxygen ion bombardment by using simultaneously sample rotation and oxygen flooding

Combined ToF-SIMS and AFM protocol for accurate 3D chemical analysis and data visualization

Combining plasma profiling TOFMS with TOF-SIMS depth profiling for microelectronic applications

Preparation and Analysis of Atom Probe Tips by Xenon Focused Ion Beam Milling

Nanofibrillated cellulose surface grafting in ionic liquid

Impact of growth conditions on AlN/GaN heterostructures with in-situ SiN capping layer

VAMAS TWA2 interlaboratory comparison: Surface analysis of TiO2 nanoparticles using ToF-SIMS

Bright and efficient inverted organic light-emitting diodes with improved solution-processed electron-transport interlayers

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