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Origin of Open-Circuit Voltage Losses in Perovskite Solar Cells Investigated by Surface Photovoltage Measurement

ACS applied materials & interfaces, 2019-12, Vol.11 (50), p.46808-46817

2019

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Ambient pressure photoemission spectroscopy of metal surfaces

Applied surface science, 2014-12, Vol.323, p.45-53

2014

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Impact of Oxygen on the Electronic Structure of Triple-Cation Halide Perovskites

ACS materials letters, 2019-11, Vol.1 (5), p.506-510

2019

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Near ambient pressure photoemission spectroscopy of metal and semiconductor surfaces

Physica status solidi. C, 2015-03, Vol.12 (3), p.259-262

2015

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The role of sodium surface species on oxygen charge transfer in the Pt/YSZ system

Electrochimica acta, 2012-08, Vol.76, p.112-119

2012

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Effect of Annealing Treatment on the Properties of Stoichiometric Indium Zinc Tin Oxide (IZTO) Thin Films

Journal of nanoelectronics and optoelectronics, 2017-06, Vol.12 (6), p.611-616

2017

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Electrical Potential of Acupuncture Points: Use of a Noncontact Scanning Kelvin Probe

Evidence-based complementary and alternative medicine, 2012-01, Vol.2012 (2012), p.1-8

2012

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Work function engineering in low-temperature metals

Applied physics letters, 2009-03, Vol.94 (11), p.113504-113504-3

2009

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Dual Mode Kelvin Probe: Featuring Ambient Pressure Photoemission Spectroscopy and Contact Potential Difference

Energy procedia, 2014, Vol.60, p.48-56

2014

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Changes in surface roughness and work function of indium-tin-oxide due to KrF excimer laser irradiation

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2005-09, Vol.23 (5), p.1305-1308

2005

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Diamond Energy Levels and Photoemission Characteristics from 300 – 425 K

MRS advances, 2018-01, Vol.3 (33), p.1937-1942

2018

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Applying the Kelvin probe to biological tissues: theoretical and computational analyses

Physical review. E, Statistical, nonlinear, and soft matter physics, 2012-06, Vol.85 (6 Pt 1), p.061901-061901, Article 061901

2012

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Charge Density in Atmospheric Pressure Chemical Vapor Deposition TiO[sub 2] on SiO[sub 2]-Passivated Silicon

Journal of the Electrochemical Society, 2009, Vol.156 (11), p.G190

2009

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An Investigation of the Energy Levels within a Common Perovskite Solar Cell Device and a Comparison of DC/AC Surface Photovoltage Spectroscopy Kelvin Probe Measurements of Different MAPBI3 Perovskite Solar Cell Device Structures

MRS advances, 2017, Vol.2 (21-22), p.1195-1201

2017

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Surface Potential and Surface Photovoltage of Oxide and Nitride coated multicrystalline Silicon Solar Cells using a Scanning Kelvin Probe

MRS proceedings, 2004, Vol.808, Article A9.12

Baikie, Iain D.

2004

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A Novel Detection System for Defects and Chemical Contamination in Semiconductors Based Upon the Scanning Kelvin Probe

MRS proceedings, 1998-01, Vol.510, Article 619

1998

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A Novel Method for True Work Function Determination of Metal Surfaces by Combined Kelvin Probe and Photoelectric Effect Measurements

MRS proceedings, 2000, Vol.619, Article 73

2000

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A Novel Approach for True Work Function Determination of Electron-Emissive Materials by Combined Kelvin Probe and Photoelectric Effect Measurements

MRS proceedings, 2000, Vol.621, Article R3.5.1

2000

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Very Low Pressure Oxidation of Si and Ge Surfaces

MRS proceedings, 1990, Vol.204, Article 363

Baikie, Iain D.

1990

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Si Surface Preparation: The Effect of Small Amounts of Carbon Contamination and Sputter Induced Surface Roughness

MRS proceedings, 1992, Vol.259, Article 149

Baikie, Iain D.

1992

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Surface investigation by using a Scanning Kelvin Probe

2010 International Students and Young Scientists Workshop "Photonics and Microsystems", 2010, p.24-27

2010

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Characterization of Oxides and Thin Films

MRS proceedings, 1993, Vol.309, Article 35

1993

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Characterization of Surface Preparation Methods Using A Novel Scanning Kelvin Probe

MRS proceedings, 1993, Vol.315 (1), p.423-428

1993

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Application of Surface Photovoltage Spectroscopy in Surface Analysis

MRS proceedings, 1992, Vol.261, Article 149

1992

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Old principles... new techniques: a novel uhv Kelvin Probe and its application in the study of semiconductor surfaces

Baikie, Iain D

1960

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Origin of Open-Circuit Voltage Losses in Perovskite Solar Cells Investigated by Surface Photovoltage Measurement

Ambient pressure photoemission spectroscopy of metal surfaces

Impact of Oxygen on the Electronic Structure of Triple-Cation Halide Perovskites

Near ambient pressure photoemission spectroscopy of metal and semiconductor surfaces

The role of sodium surface species on oxygen charge transfer in the Pt/YSZ system

Effect of Annealing Treatment on the Properties of Stoichiometric Indium Zinc Tin Oxide (IZTO) Thin Films

Electrical Potential of Acupuncture Points: Use of a Noncontact Scanning Kelvin Probe

Work function engineering in low-temperature metals

Dual Mode Kelvin Probe: Featuring Ambient Pressure Photoemission Spectroscopy and Contact Potential Difference

Changes in surface roughness and work function of indium-tin-oxide due to KrF excimer laser irradiation

Diamond Energy Levels and Photoemission Characteristics from 300 – 425 K

Applying the Kelvin probe to biological tissues: theoretical and computational analyses

Charge Density in Atmospheric Pressure Chemical Vapor Deposition TiO[sub 2] on SiO[sub 2]-Passivated Silicon

An Investigation of the Energy Levels within a Common Perovskite Solar Cell Device and a Comparison of DC/AC Surface Photovoltage Spectroscopy Kelvin Probe Measurements of Different MAPBI3 Perovskite Solar Cell Device Structures

Surface Potential and Surface Photovoltage of Oxide and Nitride coated multicrystalline Silicon Solar Cells using a Scanning Kelvin Probe

A Novel Detection System for Defects and Chemical Contamination in Semiconductors Based Upon the Scanning Kelvin Probe

A Novel Method for True Work Function Determination of Metal Surfaces by Combined Kelvin Probe and Photoelectric Effect Measurements

A Novel Approach for True Work Function Determination of Electron-Emissive Materials by Combined Kelvin Probe and Photoelectric Effect Measurements

Very Low Pressure Oxidation of Si and Ge Surfaces

Si Surface Preparation: The Effect of Small Amounts of Carbon Contamination and Sputter Induced Surface Roughness

Surface investigation by using a Scanning Kelvin Probe

Characterization of Oxides and Thin Films

Characterization of Surface Preparation Methods Using A Novel Scanning Kelvin Probe

Application of Surface Photovoltage Spectroscopy in Surface Analysis

Old principles... new techniques: a novel uhv Kelvin Probe and its application in the study of semiconductor surfaces

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