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2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2017, p.3786-3795
2017
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Computer Vision – ECCV 2018, p.89-104
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2017 IEEE Winter Conference on Applications of Computer Vision (WACV), 2017, p.1206-1214
2017
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Computer Vision – ECCV 2016 Workshops, 2016, p.824-849
- Felsberg, Michael
- Kristan, Matej
- Matas, Jiři
- Leonardis, Aleš
- Pflugfelder, Roman
- Häger, Gustav
- Berg, Amanda
- Eldesokey, Abdelrahman
- Ahlberg, Jörgen
- Čehovin, Luka
- Vojír̃, Tomáš
- Lukežič, Alan
- Fernández, Gustavo
- Petrosino, Alfredo
- Garcia-Martin, Alvaro
- Montero, Andrés Solís
- Varfolomieiev, Anton
- Erdem, Aykut
- Han, Bohyung
- Chang, Chang-Ming
- Du, Dawei
- Erdem, Erkut
- Khan, Fahad Shahbaz
- Porikli, Fatih
- Zhao, Fei
- Bunyak, Filiz
- Battistone, Francesco
- Zhu, Gao
- Seetharaman, Guna
- Li, Hongdong
- Qi, Honggang
- Bischof, Horst
- Possegger, Horst
- Nam, Hyeonseob
- Valmadre, Jack
- Zhu, Jianke
- Feng, Jiayi
- Lang, Jochen
- Martinez, Jose M.
- Palaniappan, Kannappan
- Lebeda, Karel
- Gao, Ke
- Mikolajczyk, Krystian
- Wen, Longyin
- Bertinetto, Luca
- Poostchi, Mahdieh
- Maresca, Mario
- Danelljan, Martin
- Arens, Michael
- Tang, Ming
- Baek, Mooyeol
- Fan, Nana
- Al-Shakarji, Noor
- Miksik, Ondrej
- Akin, Osman
- Torr, Philip H. S.
- Huang, Qingming
- Martin-Nieto, Rafael
- Pelapur, Rengarajan
- Bowden, Richard
- Laganière, Robert
- Krah, Sebastian B.
- Li, Shengkun
- Yao, Shizeng
- Hadfield, Simon
- Lyu, Siwei
- Becker, Stefan
- Golodetz, Stuart
- Hu, Tao
- Mauthner, Thomas
- Santopietro, Vincenzo
- Li, Wenbo
- Hübner, Wolfgang
- Li, Xin
- Li, Yang
- Xu, Zhan
- He, Zhenyu
- Hua, Gang
- Jégou, Hervé
2016
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- Computer Science
- Computer Science, Artificial Intelligence
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- Technology
- Computer Science, Theory & Methods
- Engineering
- Engineering, Electrical & Electronic
- Computer Science, Information Systems
- Feature Extraction
- Image Quality
- Imaging Science & Photographic Technology
- Instance Embedding Loss
- Machine Learning
- Multi-Domain Learning
- Neural Networks
- Object Tracking
- Performance Evaluation
- Quality Assessment
- Robustness
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