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Characterization of the uppermost layer of plasma-treated carbon nanotubes

Diamond and related materials, 2003-03, Vol.12 (3), p.811-815

2003

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Basic analytical investigation of plasma-chemically modified carbon fibers

Spectrochimica acta. Part B: Atomic spectroscopy, 2002-10, Vol.57 (10), p.1601-1610

2002

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Surface modification of carbon nanofibres in low temperature plasmas

Diamond and related materials, 2004-04, Vol.13 (4), p.1177-1181

2004

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Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications

Gernot Friedbacher, Henning Bubert, Gernot Friedbacher, Henning Bubert

2nd ed., 2011

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Composition of Ge+ and Si+ implanted SiO2/Si layers: Role of oxides in nanocluster formation

Journal of non-crystalline solids, 2008-10, Vol.354 (35-39), p.4363-4366

2008

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Depth profiles of a shallow implanted layer in a Si wafer determined by different methods of thin-layer analysis

Spectrochimica acta. Part B: Atomic spectroscopy, 2002-10, Vol.57 (10), p.1593-1599

2002

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Analytical investigation of plasma-treated carbon fibres

Analytical and bioanalytical chemistry, 2002-12, Vol.374 (7-8), p.1237-1241

2002

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Brillouin scattering and x-ray photoelectron studies of germanium nanoclusters synthesized in SiO2 by ion implantation

Journal of applied physics, 2004-11, Vol.96 (9), p.4952-4959

2004

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Surface functionalisation of carbon nano-fibres in fluidised bed plasma

Surface & coatings technology, 2003-09, Vol.174, p.831-834

2003

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DETECTION OF NEAR-SURFACE SILVER ENRICHMENT ON ROMAN IMPERIAL SILVER COINS BY X-RAY SPECTRAL ANALYSIS

Archaeometry, 1999-08, Vol.41 (2), p.311-320

1999

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Structural and elemental investigations of isolated aquatic humic substances using X-ray photoelectron spectroscopy

Fresenius' journal of analytical chemistry, 2000-09, Vol.368 (2-3), p.274-280

2000

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Composition of Ge super(+) and Si super(+) implanted SiO sub(2)/Si layers: Role of oxides in nanocluster formation

Journal of non-crystalline solids, 2008-10, Vol.354 (35-39), p.4363-4366

2008

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Beitrag zur quantitativen Bestimmung von Legierungsbestandteilen in Stahl mittels Auger-Elektronenspektroskopie

Fresenius' Zeitschrift für analytische Chemie, 1983, Vol.314 (3), p.237-241

BUBERT, H

1983

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Continuous Decomposition of Sporopollenin from Pollen of Typha angustifolia L. by Acidic Methanolysis

Zeitschrift für Naturforschung C. A journal of biosciences, 2002-12, Vol.57 (11), p.1035-1041

2002

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Atomic fluorescence spectrometry with a Grimm-type glow discharge lamp

Spectrochimica acta. Part B: Atomic spectroscopy, 1984, Vol.39 (9), p.1377-1387

Bubert, H.

1984

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Characterization of SiOxNyHz and SiNyHz using RBS, ERDA and NRA In memoriam Priv.-Doz. Dr. Rainer P.H. Garten

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1996-04, Vol.111 (1-2), p.115-125

1996

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Examinations on the morphology of tarnish layers grown on stainless 18-10 chromium nickel steels

Fresenius' journal of analytical chemistry, 1999-09, Vol.365 (1-3), p.236-243

1999

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Quantitative depth profiling of nitrogen-implanted titanium by use of Auger electron spectroscopy and subsequent target factor analysis

Surface and interface analysis, 1992-06, Vol.19 (1-12), p.187-191

1992

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Analysis of functional groups on the surface of plasma-treated carbon nanofibers

Analytical and bioanalytical chemistry, 2003-04, Vol.375 (7), p.875-883

2003

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Comparative investigation on copper oxides by depth profiling using XPS, RBS and GDOES

Analytical and bioanalytical chemistry, 1995-10, Vol.353 (3-4), p.456-463

1995

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The Nature of Oxygen in Sporopollenin from the Pollen of Typha angustifolia L

Zeitschrift für Naturforschung C. A journal of biosciences, 2000-03, Vol.55 (3), p.129-136

2000

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Erratum: “Brillouin scattering and x-ray photoelectron studies of germanium nanoclusters synthesized in SiO2 by ion implantation” [J. Appl. Phys. 96, 4952 (2004)]

Journal of applied physics, 2005-04, Vol.97 (8)

2005

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Erratum: "Brillouin scattering and x-ray photoelectron studies of germanium nanoclusters synthesized in Si O 2 by ion implantation" [ J. Appl. Phys. 96 , 4952 ( 2004 ) ]

Journal of applied physics, 2005-03, Vol.97 (8), p.089901-089901-1

2005

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Determination of the heavy-metal ion-dose after implantation in silicon-wafers by total reflection X-ray fluorescence analysis

Spectrochimica acta. Part B : Atomic spectroscopy, 1991, Vol.46 (10), p.1379-1383

1991

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Neutron activation analysis for reference determination of the implantation dose of cobalt ions

Analytical chemistry (Washington), 1992-05, Vol.64 (10), p.1100-1105

1992

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Characterization of the uppermost layer of plasma-treated carbon nanotubes

Basic analytical investigation of plasma-chemically modified carbon fibers

Surface modification of carbon nanofibres in low temperature plasmas

Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications

Composition of Ge+ and Si+ implanted SiO2/Si layers: Role of oxides in nanocluster formation

Depth profiles of a shallow implanted layer in a Si wafer determined by different methods of thin-layer analysis

Analytical investigation of plasma-treated carbon fibres

Brillouin scattering and x-ray photoelectron studies of germanium nanoclusters synthesized in SiO2 by ion implantation

Surface functionalisation of carbon nano-fibres in fluidised bed plasma

DETECTION OF NEAR-SURFACE SILVER ENRICHMENT ON ROMAN IMPERIAL SILVER COINS BY X-RAY SPECTRAL ANALYSIS

Structural and elemental investigations of isolated aquatic humic substances using X-ray photoelectron spectroscopy

Composition of Ge super(+) and Si super(+) implanted SiO sub(2)/Si layers: Role of oxides in nanocluster formation

Beitrag zur quantitativen Bestimmung von Legierungsbestandteilen in Stahl mittels Auger-Elektronenspektroskopie

Continuous Decomposition of Sporopollenin from Pollen of Typha angustifolia L. by Acidic Methanolysis

Atomic fluorescence spectrometry with a Grimm-type glow discharge lamp

Characterization of SiOxNyHz and SiNyHz using RBS, ERDA and NRA In memoriam Priv.-Doz. Dr. Rainer P.H. Garten

Examinations on the morphology of tarnish layers grown on stainless 18-10 chromium nickel steels

Quantitative depth profiling of nitrogen-implanted titanium by use of Auger electron spectroscopy and subsequent target factor analysis

Analysis of functional groups on the surface of plasma-treated carbon nanofibers

Comparative investigation on copper oxides by depth profiling using XPS, RBS and GDOES

The Nature of Oxygen in Sporopollenin from the Pollen of Typha angustifolia L

Erratum: “Brillouin scattering and x-ray photoelectron studies of germanium nanoclusters synthesized in SiO2 by ion implantation” [J. Appl. Phys. 96, 4952 (2004)]

Erratum: "Brillouin scattering and x-ray photoelectron studies of germanium nanoclusters synthesized in Si O 2 by ion implantation" [ J. Appl. Phys. 96 , 4952 ( 2004 ) ]

Determination of the heavy-metal ion-dose after implantation in silicon-wafers by total reflection X-ray fluorescence analysis

Neutron activation analysis for reference determination of the implantation dose of cobalt ions

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