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New aspects on the mechanism of the solid state polyamidation of PA 6,6 salt

Polymer (Guilford), 2006-02, Vol.47 (4), p.1020-1027

2006

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Preparation of polyhexamethyleneadipamide prepolymer by a low-temperature process

Journal of applied polymer science, 2004-04, Vol.92 (1), p.301-306

2004

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New process for the production of dry hexamethylenediammonium adipate

Journal of applied polymer science, 2003-05, Vol.88 (5), p.1252-1257

2003

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High-resolution TOF-SIMS studies of substituted polystyrenes

Macromolecules, 1992-12, Vol.25 (25), p.6970-6976

1992

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Molecular weight distributions of polymers using time-of-flight secondary-ion mass spectrometry

Analytical chemistry (Washington), 1991-09, Vol.63 (18), p.1953-1960

1991

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Time-of-flight secondary ion mass spectrometry of polymers in the mass range 500-10 000

Macromolecules, 1987-03, Vol.20 (2), p.407-413

1987

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Time-of-flight secondary ion mass spectrometry of perfluorinated polyethers

Analytical chemistry (Washington), 1990-07, Vol.62 (13), p.1275-1284

1990

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Time-of-flight secondary ion mass spectrometry of nylons: detection of high mass fragments

Analytical chemistry (Washington), 1985-10, Vol.57 (12), p.2384-2388

1985

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Characterization of a Perfluorotetradecahydrophenanthrene Oligomer

Analytical chemistry (Washington), 1995-07, Vol.67 (13), p.1955-1962

1995

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Structural characterization of model polyester polyurethanes using time-of-flight secondary ion mass spectrometry

Macromolecules, 1990-09, Vol.23 (18), p.4157-4163

1990

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Structural characterization of model polyurethanes using time-of-flight secondary ion mass spectrometry

Analytical chemistry (Washington), 1989-10, Vol.61 (19), p.2142-2149

1989

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Structural Characterization of Model Polyester Polyurethanes Using Time-of-Flight Secondary Ion Mass Spectrometry

Macromolecules, 1989-09, Vol.23 (18), p.4157-4163

1989

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Time-of-flight secondary ion mass spectrometry of polymers in the mass range 500-10000

Macromolecules, 1987-02, Vol.20 (2), p.407-413

1987

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Characterization of coatings of poly(hexamethylene adipamide) deposited on carbon fibers by interfacial polymerization techniques

Journal of applied polymer science, 1995-02, Vol.55 (7), p.1101-1110

1995

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Time-of-flight secondary ion mass spectrometry: detection of fragments from thick polymer films in the range m/z .ltoreq. 4500

Analytical chemistry (Washington), 1988-05, Vol.60 (9), p.938-944

1988

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Time-of-flight secondary ion mass spectrometry: detection of fragments from thick polymer films in the range m/z≤4500

Analytical chemistry (Washington), 1988-05, Vol.60 (9), p.938-944

1988

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New aspects on the mechanism of the solid state polyamidation of PA 6,6 salt

Preparation of polyhexamethyleneadipamide prepolymer by a low-temperature process

New process for the production of dry hexamethylenediammonium adipate

High-resolution TOF-SIMS studies of substituted polystyrenes

Molecular weight distributions of polymers using time-of-flight secondary-ion mass spectrometry

Time-of-flight secondary ion mass spectrometry of polymers in the mass range 500-10 000

Time-of-flight secondary ion mass spectrometry of perfluorinated polyethers

Time-of-flight secondary ion mass spectrometry of nylons: detection of high mass fragments

Characterization of a Perfluorotetradecahydrophenanthrene Oligomer

Structural characterization of model polyester polyurethanes using time-of-flight secondary ion mass spectrometry

Structural characterization of model polyurethanes using time-of-flight secondary ion mass spectrometry

Structural Characterization of Model Polyester Polyurethanes Using Time-of-Flight Secondary Ion Mass Spectrometry

Time-of-flight secondary ion mass spectrometry of polymers in the mass range 500-10000

Characterization of coatings of poly(hexamethylene adipamide) deposited on carbon fibers by interfacial polymerization techniques

Time-of-flight secondary ion mass spectrometry: detection of fragments from thick polymer films in the range m/z .ltoreq. 4500

Time-of-flight secondary ion mass spectrometry: detection of fragments from thick polymer films in the range m/z≤4500

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