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Atomic scale investigation of Cr precipitation in copper

Acta materialia, 2012-06, Vol.60 (11), p.4575-4585

2012

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Uphill phosphorus diffusion in carbon co-implanted silicon

Journal of applied physics, 2022-03, Vol.131 (11)

2022

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Investigation of dopant clustering and segregation to defects in semiconductors using atom probe tomography

Journal of applied physics, 2016-05, Vol.119 (18)

2016

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Atom probe tomography quantification of carbon in silicon

Ultramicroscopy, 2021-01, Vol.220, p.113153-113153, Article 113153

2021

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Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography

Journal of physical chemistry. C, 2018-07, Vol.122 (29), p.16704-16714

2018

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Modeling of precipitation kinetics in multicomponent systems: Application to model superalloys

Acta materialia, 2015-11, Vol.100, p.169-177

2015

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Advance in multi-hit detection and quantization in atom probe tomography

Review of scientific instruments, 2012-12, Vol.83 (12), p.123709-123709

2012

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Influence of plastic deformation on the precipitation of Cr in copper

Journal of materials science, 2014-09, Vol.49 (18), p.6240-6247

2014

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Phase transformations and γ′ phase stability in model CoAlW superalloys

Journal of alloys and compounds, 2019-08, Vol.798, p.832-845

2019

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Design of a femtosecond laser assisted tomographic atom probe

Review of scientific instruments, 2006-04, Vol.77 (4), p.043705-043705-8

2006

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Trajectory overlaps and local magnification in three-dimensional atom probe

Applied physics letters, 2000-05, Vol.76 (21), p.3127-3129

2000

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Minimum free-energy pathway of nucleation

The Journal of chemical physics, 2011-10, Vol.135 (13), p.134508-134508-4

2011

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Detecting Dissociation Dynamics of Phosphorus Molecular Ions by Atom Probe Tomography

The journal of physical chemistry. A, Molecules, spectroscopy, kinetics, environment, & general theory, 2020-12, Vol.124 (52), p.10977-10988

2020

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Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques

Applied physics letters, 2015-05, Vol.106 (21)

2015

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3D atomic-scale investigation of carbon segregation in phosphorus co-implanted silicon

Applied physics letters, 2019-09, Vol.115 (13)

2019

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Low temperature carbon co-implantation in silicon: Defects suppression and diffusion modeling

Journal of applied physics, 2021-05, Vol.129 (19)

2021

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Kinetic theory of diffusion-limited nucleation

The Journal of chemical physics, 2016-05, Vol.144 (20), p.204501-204501

2016

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Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N

Journal of applied physics, 2016-03, Vol.119 (10)

2016

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Critical nucleus composition in a multicomponent system

The Journal of chemical physics, 2014-09, Vol.141 (12), p.124306-124306

2014

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Compositional accuracy in atom probe tomography analyses performed on III-N light emitting diodes

Journal of applied physics, 2019-09, Vol.126 (12)

2019

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An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials

Ultramicroscopy, 2015-12, Vol.159, p.195-201

2015

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Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation events

Ultramicroscopy, 2018-04, Vol.187, p.126-134

2018

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3D atom probe study of solute atoms clustering during natural ageing and pre-ageing of an Al-Mg-Si alloy

Philosophical magazine letters, 2006-04, Vol.86 (4), p.227-234

2006

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A photonic atom probe coupling 3D atomic scale analysis with in situ photoluminescence spectroscopy

Review of scientific instruments, 2020-08, Vol.91 (8)

2020

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Atomic-scale imaging and analysis of single layer GP zones in a model steel

Journal of materials science, 2012-02, Vol.47 (3), p.1567-1571

2012

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Atomic scale investigation of Cr precipitation in copper

Uphill phosphorus diffusion in carbon co-implanted silicon

Investigation of dopant clustering and segregation to defects in semiconductors using atom probe tomography

Atom probe tomography quantification of carbon in silicon

Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography

Modeling of precipitation kinetics in multicomponent systems: Application to model superalloys

Advance in multi-hit detection and quantization in atom probe tomography

Influence of plastic deformation on the precipitation of Cr in copper

Phase transformations and γ′ phase stability in model CoAlW superalloys

Design of a femtosecond laser assisted tomographic atom probe

Trajectory overlaps and local magnification in three-dimensional atom probe

Minimum free-energy pathway of nucleation

Detecting Dissociation Dynamics of Phosphorus Molecular Ions by Atom Probe Tomography

Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques

3D atomic-scale investigation of carbon segregation in phosphorus co-implanted silicon

Low temperature carbon co-implantation in silicon: Defects suppression and diffusion modeling

Kinetic theory of diffusion-limited nucleation

Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N

Critical nucleus composition in a multicomponent system

Compositional accuracy in atom probe tomography analyses performed on III-N light emitting diodes

An analytical model accounting for tip shape evolution during atom probe analysis of heterogeneous materials

Compositional accuracy of atom probe tomography measurements in GaN: Impact of experimental parameters and multiple evaporation events

3D atom probe study of solute atoms clustering during natural ageing and pre-ageing of an Al-Mg-Si alloy

A photonic atom probe coupling 3D atomic scale analysis with in situ photoluminescence spectroscopy

Atomic-scale imaging and analysis of single layer GP zones in a model steel

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