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Linear-to-circular polarization transformation upon reflection by a transparent thin film on a transparent substrate: analytical determination of principal angles and principal azimuths

Applied optics (2004), 2018-11, Vol.57 (32), p.9529-9532

Azzam, R M A

2018

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The intertwined history of polarimetry and ellipsometry

Thin solid films, 2011-02, Vol.519 (9), p.2584-2588

Azzam, R.M.A.

2011

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Infrared Brewster-angle polarizing beam splitter using a high-index prism with a small wedge angle

Applied Optics, 2017-04, Vol.56 (11), p.3020-3021

Azzam, R M A

2017

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Brewster-angle 50%-50% beam splitter for p-polarized infrared light using a high-index quarter-wave layer deposited on a low-index prism

Applied optics (2004), 2017-08, Vol.56 (23), p.6583-6586

Azzam, R M A

2017

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Interfaces with fractional optical constants and linear reflectance versus angle of incidence for incident unpolarized or circularly polarized light

Applied Optics, 2017-06, Vol.56 (16), p.4882-4885

Azzam, R M A

2017

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Tilted parallel dielectric slab as a multilevel attenuator for incident p- or s-polarized light

Applied Optics, 2009-01, Vol.48 (2), p.425-428

Azzam, R M A

2009

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Bare and thin-film-coated substrates with null reflection for p- and s-polarized light at the same angle of incidence: reflectance and ellipsometric parameters as functions of substrate refractive index and film thickness

Applied Optics, 2016-10, Vol.55 (30), p.8464

Azzam, R M A

2016

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Surface roughness and optical contact characterization of transparent prisms using frustrated total internal reflection tunneling ellipsometry

Thin solid films, 2014-11, Vol.571, p.666-668

Azzam, R.M.A.

2014

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Maximum reflectance difference for incident p- and s-polarized light at air-dielectric interfaces: erratum

Applied optics (2004), 2015-03, Vol.54 (9), p.2218-2218

Azzam, R M A

2015

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Beam splitters for p-polarized light using a high-index quarter-wave layer embedded in a low-index cube prism

Applied Optics, 2015-12, Vol.54 (36), p.10575-10578

Azzam, R M A

2015

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Polarization optics of interfaces and thin films

Physica status solidi. A, Applications and materials science, 2008-04, Vol.205 (4), p.709-714

Azzam, R. M. A.

2008

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Angle of incidence of minimum reflectance of a dielectric-conductor interface for incident unpolarized or circularly polarized light

Applied Optics, 2014-11, Vol.53 (33), p.7885-7890

2014

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Difference between the Brewster angle and angle of minimum reflectance for incident unpolarized or circularly polarized light at interfaces between transparent media

Journal of the Optical Society of America. A, Optics, image science, and vision, 2015-06, Vol.32 (6), p.1180

Azzam, R M A

2015

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Maximum reflectance difference for incident p- and s-polarized light at air-dielectric interfaces

Applied optics (2004), 2014-09, Vol.53 (27), p.6212-6215

Azzam, R M A

2014

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Chiral thin solid films : method of deposition and applications

Applied physics letters, 1992-12, Vol.61 (26), p.3118-3120

AZZAM, R. M. A

1992

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Circular and near-circular polarization states of evanescent monochromatic light fields in total internal reflection

Applied Optics, 2011-11, Vol.50 (33), p.6272-6276

Azzam, R M A

2011

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Simplified design of thin-film polarizing beam splitter using embedded symmetric trilayer stack

Applied Optics, 2011-07, Vol.50 (19), p.3316-3320

Azzam, R M A

2011

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Polarization and angle-of-incidence dependence of the Goos-Hänchen shift in total internal reflection at a planar dielectric-dielectric interface

Journal of modern optics, 2011-08, Vol.58 (14), p.1220-1223

Azzam, R.M.A.

2011

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Broadband IR polarizing beam splitter using a subwavelength-structured one-dimensional photonic-crystal layer embedded in a high-index prism

Applied Optics, 2009-09, Vol.48 (27), p.5121-5126

2009

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Return-path, multiple-principal-angle, internal-reflection ellipsometer for measuring IR optical properties of aqueous solutions

Applied Optics, 2010-09, Vol.49 (25), p.4710-4714

Azzam, R M A

2010

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Polarization, thin-film optics, ellipsometry, and polarimetry: Retrospective

Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, 2019-11, Vol.37 (6)

Azzam, R. M. A.

2019

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Multiple determination of the optical constants of thin-film coating materials

Applied Optics, 1984-10, Vol.23 (20), p.3571-3571

1984

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Quasi index matching for minimum reflectance at a dielectric-conductor interface for obliquely incident p- and s-polarized light

Applied Optics, 2008-06, Vol.47 (17), p.3211-3215

2008

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Wide-angle, high-extinction-ratio, infrared polarizing beam splitters using frustrated total internal reflection by an embedded centrosymmetric multilayer

Applied Optics, 2007-07, Vol.46 (21), p.4604-4612

2007

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In-line broadband 270 degrees (3lambda/4) chevron four-reflection wave retarders

Applied optics. Optical technology and biomedical optics, 2008-09, Vol.47 (27), p.4878

2008

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Linear-to-circular polarization transformation upon reflection by a transparent thin film on a transparent substrate: analytical determination of principal angles and principal azimuths

The intertwined history of polarimetry and ellipsometry

Infrared Brewster-angle polarizing beam splitter using a high-index prism with a small wedge angle

Brewster-angle 50%-50% beam splitter for p-polarized infrared light using a high-index quarter-wave layer deposited on a low-index prism

Interfaces with fractional optical constants and linear reflectance versus angle of incidence for incident unpolarized or circularly polarized light

Tilted parallel dielectric slab as a multilevel attenuator for incident p- or s-polarized light

Bare and thin-film-coated substrates with null reflection for p- and s-polarized light at the same angle of incidence: reflectance and ellipsometric parameters as functions of substrate refractive index and film thickness

Surface roughness and optical contact characterization of transparent prisms using frustrated total internal reflection tunneling ellipsometry

Maximum reflectance difference for incident p- and s-polarized light at air-dielectric interfaces: erratum

Beam splitters for p-polarized light using a high-index quarter-wave layer embedded in a low-index cube prism

Polarization optics of interfaces and thin films

Angle of incidence of minimum reflectance of a dielectric-conductor interface for incident unpolarized or circularly polarized light

Difference between the Brewster angle and angle of minimum reflectance for incident unpolarized or circularly polarized light at interfaces between transparent media

Maximum reflectance difference for incident p- and s-polarized light at air-dielectric interfaces

Chiral thin solid films : method of deposition and applications

Circular and near-circular polarization states of evanescent monochromatic light fields in total internal reflection

Simplified design of thin-film polarizing beam splitter using embedded symmetric trilayer stack

Polarization and angle-of-incidence dependence of the Goos-Hänchen shift in total internal reflection at a planar dielectric-dielectric interface

Broadband IR polarizing beam splitter using a subwavelength-structured one-dimensional photonic-crystal layer embedded in a high-index prism

Return-path, multiple-principal-angle, internal-reflection ellipsometer for measuring IR optical properties of aqueous solutions

Polarization, thin-film optics, ellipsometry, and polarimetry: Retrospective

Multiple determination of the optical constants of thin-film coating materials

Quasi index matching for minimum reflectance at a dielectric-conductor interface for obliquely incident p- and s-polarized light

Wide-angle, high-extinction-ratio, infrared polarizing beam splitters using frustrated total internal reflection by an embedded centrosymmetric multilayer

In-line broadband 270 degrees (3lambda/4) chevron four-reflection wave retarders

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