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Digital-Based Solution for the Generation of FM/pm Test Stimuli

IEEE transactions on computer-aided design of integrated circuits and systems, 2024, p.1-1

2024

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Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition

IEEE transactions on computer-aided design of integrated circuits and systems, 2021-11, Vol.40 (11), p.2400-2410

2021

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MIRID: Mixed-Mode IR-Drop Induced Delay Simulator

2013 22nd Asian Test Symposium, 2013, p.177-182

2013

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On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits

Journal of electronic testing, 2023-04, Vol.39 (2), p.155-170

2023

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Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC

IET computers & digital techniques, 2007-05, Vol.1 (3), p.146-153

2007

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EVM measurement of RF ZigBee transceivers using standard digital ATE

2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2020, p.1-6

2020

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A new multi-finger SCR-based structure for efficient on-chip ESD protection

Microelectronics and reliability, 2005-02, Vol.45 (2), p.233-243

2005

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Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit

Journal of electronic testing, 2021-04, Vol.37 (2), p.225-242

2021

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Sensor testing through bias superposition

Sensors and actuators. A. Physical., 2007-05, Vol.136 (1), p.441-455

2007

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Electro-thermal Stimuli for MEMS Testing in FSBM Technology

Journal of electronic testing, 2006-04, Vol.22 (2), p.189-198

2006

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ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator

VLSI Design, 2008-01, Vol.2008 (1), p.141-148

2008

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Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE

2009 Asian Test Symposium, 2009, p.261-266

2009

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Automated Diagnosis and Probing Flow for Fast Fault Localization in IC

Microelectronics and reliability, 2004-09, Vol.44 (9), p.1553-1558

2004

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Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE

2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), 2018, p.17-22

2018

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A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs

Journal of electronic testing, 2001-04, Vol.17 (2), p.139

2001

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Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short

Journal of electronic testing, 2003-08, Vol.19 (4), p.377-386

2003

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On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST

Journal of electronic testing, 2003-08, Vol.19 (4), p.469-479

2003

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Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors

Journal of electronic testing, 2004-06, Vol.20 (3), p.257-267

2004

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On-chip electro-thermal stimulus generation for a MEMS-based magnetic field sensor

23rd IEEE VLSI Test Symposium (VTS'05), 2005, p.213-218

2005

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Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure

Journal of electronic testing, 2004-08, Vol.20 (4), p.375-387

2004

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A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters

Journal of electronic testing, 2005-02, Vol.21 (1), p.9-16

2005

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Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST

Journal of electronic testing, 2001-06, Vol.17 (3-4), p.255

2001

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An approach to the built-in self-test of field programmable analog arrays

22nd IEEE VLSI Test Symposium, 2004. Proceedings, 2004, p.383-388

2004

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Delay Testing Viability of Gate Oxide Short Defects

Journal of computer science and technology, 2005-03, Vol.20 (2), p.195-200

2005

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Digital-Based Solution for the Generation of FM/pm Test Stimuli

Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition

MIRID: Mixed-Mode IR-Drop Induced Delay Simulator

On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits

L‐DOPA‐induced dyskinesias, motor fluctuations and health‐related quality of life: the COPARK survey

Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC

EVM measurement of RF ZigBee transceivers using standard digital ATE

A new multi-finger SCR-based structure for efficient on-chip ESD protection

Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit

Sensor testing through bias superposition

Electro-thermal Stimuli for MEMS Testing in FSBM Technology

ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator

Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE

Automated Diagnosis and Probing Flow for Fast Fault Localization in IC

Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE

A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs

Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short

On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST

Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors

On-chip electro-thermal stimulus generation for a MEMS-based magnetic field sensor

Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure

A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters

Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST

An approach to the built-in self-test of field programmable analog arrays

Delay Testing Viability of Gate Oxide Short Defects

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