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Spectroscopic ellipsometry — Past, present, and future

Thin solid films, 2014-11, Vol.571, p.334-344

Aspnes, D.E.

2014

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Classical Correlation Model of Resonance Raman Spectroscopy

The journal of physical chemistry. A, Molecules, spectroscopy, kinetics, environment, & general theory, 2020-11, Vol.124 (44), p.9177-9186

2020

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Critical Test of the Interaction of Surface Plasmon Resonances with Molecular Vibrational Transitions

The journal of physical chemistry. A, Molecules, spectroscopy, kinetics, environment, & general theory, 2020-03, Vol.124 (9), p.1744-1753

2020

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Classical Model of Surface Enhanced Infrared Absorption (SEIRA) Spectroscopy

The journal of physical chemistry. A, Molecules, spectroscopy, kinetics, environment, & general theory, 2022-01, Vol.126 (2), p.341-351

2022

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Plasmonics and effective-medium theories

Thin solid films, 2011-02, Vol.519 (9), p.2571-2574

Aspnes, D.E.

2011

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Eliminating white noise in spectra: A generalized maximum-entropy approach

Journal of applied physics, 2022-08, Vol.132 (7)

2022

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Spectroscopic ellipsometry—A perspective

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2013-09, Vol.31 (5)

Aspnes, D. E.

2013

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Combined direct- and reciprocal-space approach for converting spectra to energy scales with negligible loss of information

Thin solid films, 2014-11, Vol.571, p.506-508

2014

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Maximum-entropy revisited: Optimal filtering of spectra

Journal of applied physics, 2021-06, Vol.129 (22)

2021

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Shallow acceptor complexes in p-type ZnO

Applied physics letters, 2013-04, Vol.102 (15)

2013

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Dependence of plasmon polaritons on the thickness of indium tin oxide thin films

Journal of applied physics, 2008-05, Vol.103 (9), p.093108-093108-6

2008

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Extended Gaussian Filtering for Noise Reduction in Spectral Analysis

Journal of the Korean Physical Society, 2020, 77(10), , pp.819-823

2020

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The anisotropic bond model of nonlinear optics

Physica status solidi. A, Applications and materials science, 2008-04, Vol.205 (4), p.728-731

2008

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The nearly aligned rotating-monoplate compensator

Physica status solidi. A, Applications and materials science, 2008-04, Vol.205 (4), p.739-742

2008

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Bond models in linear and nonlinear optics

Physica status solidi. B. Basic research, 2010-08, Vol.247 (8), p.1873-1880

Aspnes, D. E.

2010

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Expanding horizons: new developments in ellipsometry and polarimetry

Thin solid films, 2004-05, Vol.455, p.3-13

Aspnes, D.E.

2004

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Real-time diagnostics for metalorganic vapor phase epitaxy

Physica Status Solidi (b), 2005-11, Vol.242 (13), p.2551-2560

Aspnes, D. E.

2005

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Analysis of interface layers by spectroscopic ellipsometry

Applied surface science, 2008-11, Vol.255 (3), p.640-642

2008

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Calculation of bulk third-harmonic generation from crystalline Si with the simplified bond hyperpolarizability model

Physical review. B, Condensed matter and materials physics, 2004-10, Vol.70 (16), p.165312.1-165312.8, Article 165312

2004

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Analytic representations of the dielectric functions of materials for device and structural modeling

Thin solid films, 1998-02, Vol.313 (1-2), p.132-136

1998

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Analytical solution of thickness variations in selective area growth by organometallic chemical vapor deposition

Applied physics letters, 2009-06, Vol.94 (25)

2009

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Nondestructive Measurement of a Glass Transition Temperature at Spin-Cast Semicrystalline Polymer Surfaces

Macromolecules, 2001-04, Vol.34 (8), p.2395-2397

2001

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Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters

Physica status solidi. A, Applications and materials science, 2008-04, Vol.205 (4), p.884-887

2008

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New developments in spectroellipsometry: the challenge of surfaces

Thin solid films, 1993-10, Vol.233 (1), p.1-8

Aspnes, D.E.

1993

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Analytic representation of the dielectric functions of InAsxSb1−x alloys in the parametric model

Thin solid films, 2013-11, Vol.547, p.276-279

2013

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Spectroscopic ellipsometry — Past, present, and future

Classical Correlation Model of Resonance Raman Spectroscopy

Critical Test of the Interaction of Surface Plasmon Resonances with Molecular Vibrational Transitions

Classical Model of Surface Enhanced Infrared Absorption (SEIRA) Spectroscopy

Plasmonics and effective-medium theories

Eliminating white noise in spectra: A generalized maximum-entropy approach

Spectroscopic ellipsometry—A perspective

Combined direct- and reciprocal-space approach for converting spectra to energy scales with negligible loss of information

Maximum-entropy revisited: Optimal filtering of spectra

Shallow acceptor complexes in p-type ZnO

Dependence of plasmon polaritons on the thickness of indium tin oxide thin films

Extended Gaussian Filtering for Noise Reduction in Spectral Analysis

The anisotropic bond model of nonlinear optics

The nearly aligned rotating-monoplate compensator

Bond models in linear and nonlinear optics

Expanding horizons: new developments in ellipsometry and polarimetry

Real-time diagnostics for metalorganic vapor phase epitaxy

Analysis of interface layers by spectroscopic ellipsometry

Calculation of bulk third-harmonic generation from crystalline Si with the simplified bond hyperpolarizability model

Analytic representations of the dielectric functions of materials for device and structural modeling

Analytical solution of thickness variations in selective area growth by organometallic chemical vapor deposition

Nondestructive Measurement of a Glass Transition Temperature at Spin-Cast Semicrystalline Polymer Surfaces

Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters

New developments in spectroellipsometry: the challenge of surfaces

Analytic representation of the dielectric functions of InAsxSb1−x alloys in the parametric model

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