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Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2016-11, Vol.34 (6)
2016
Link zum Volltext
2016 IEEE Symposium on VLSI Technology, 2016, p.1-2
- Brunet, L.
- Batude, P.
- Fenouillet-Beranger, C.
- Besombes, P.
- Hortemel, L.
- Ponthenier, F.
- Previtali, B.
- Tabone, C.
- Royer, A.
- Agraffeil, C.
- Euvrard-Colnat, C.
- Seignard, A.
- Morales, C.
- Fournel, F.
- Benaissa, L.
- Signamarcheix, T.
- Besson, P.
- Jourdan, M.
- Kachtouli, R.
- Benevent, V.
- Hartmann, J.-M
- Comboroure, C.
- Allouti, N.
- Posseme, N.
- Vizioz, C.
- Arvet, C.
- Barnola, S.
- Kerdiles, S.
- Baud, L.
- Pasini, L.
- Lu, C.-M V.
- Deprat, F.
- Toffoli, A.
- Romano, G.
- Guedj, C.
- Delaye, V.
- Boeuf, F.
- Faynot, O.
- Vinet, M.
2016
Link zum Volltext
Solid-state electronics, 2010-09, Vol.54 (9), p.849-854
- Fenouillet-Beranger, C.
- Perreau, P.
- Denorme, S.
- Tosti, L.
- Andrieu, F.
- Weber, O.
- Monfray, S.
- Barnola, S.
- Arvet, C.
- Campidelli, Y.
- Haendler, S.
- Beneyton, R.
- Perrot, C.
- de Buttet, C.
- Gros, P.
- Pham-Nguyen, L.
- Leverd, F.
- Gouraud, P.
- Abbate, F.
- Baron, F.
- Torres, A.
- Laviron, C.
- Pinzelli, L.
- Vetier, J.
- Borowiak, C.
- Margain, A.
- Delprat, D.
- Boedt, F.
- Bourdelle, K.
- Nguyen, B.-Y.
- Faynot, O.
- Skotnicki, T.
2010
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Solid-state electronics, 2011-05, Vol.59 (1), p.2-7
2011
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Solid-state electronics, 2010-02, Vol.54 (2), p.90-96
2010
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Microelectronic engineering, 2004-06, Vol.73, p.301-305
2004
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Semiconductor science and technology, 2010-04, Vol.25 (4), p.045014-045014
2010
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Microelectronic engineering, 2004-06, Vol.73-74, p.301-305
2004
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IEEE electron device letters, 2009-07, Vol.30 (7), p.748-750
2009
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IEEE electron device letters, 2011-08, Vol.32 (8), p.996-998
2011
- Link zum Volltext
Japanese Journal of Applied Physics, 2005-07, Vol.44 (7S), p.5795
2005
Link zum Volltext
Solid-state electronics, 2010-09, Vol.54 (9), p.849-854
- Fenouillet-Beranger, C.
- Perreau, P.
- Denorme, S.
- Tosti, L.
- Andrieu, F.
- Weber, O.
- Monfray, S.
- Barnola, S.
- Arvet, C.
- Campidelli, Y.
- Haendler, S.
- Beneyton, R.
- Perrot, C.
- de Buttet, C.
- Gros, P.
- Pham-Nguyen, L.
- Leverd, F.
- Gouraud, P.
- Abbate, F.
- Baron, F.
- Torres, A.
- Laviron, C.
- Pinzelli, L.
- Vetier, J.
- Borowiak, C.
- Margain, A.
- Delprat, D.
- Boedt, F.
- Bourdelle, K.
- Nguyen, B.-Y.
- Faynot, O.
- Skotnicki, T.
2010
Link zum Volltext
2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2013, p.1-2
2013
- Link zum Volltext
2016 IEEE International Electron Devices Meeting (IEDM), 2016, p.17.6.1-17.6.4
- Barraud, S.
- Lapras, V.
- Samson, M. P.
- Gaben, L.
- Grenouillet, L.
- Maffini-Alvaro, V.
- Morand, Y.
- Daranlot, J.
- Rambal, N.
- Previtalli, B.
- Reboh, S.
- Tabone, C.
- Coquand, R.
- Augendre, E.
- Rozeau, O.
- Hartmann, J. M.
- Vizioz, C.
- Arvet, C.
- Pimenta-Barros, P.
- Posseme, N.
- Loup, V.
- Comboroure, C.
- Euvrard, C.
- Balan, V.
- Tinti, I.
- Audoit, G.
- Bernier, N.
- Cooper, D.
- Saghi, Z.
- Allain, F.
- Toffoli, A.
- Faynot, O.
- Vinet, M.
2016
- Link zum Volltext
2010 Proceedings of the European Solid State Device Research Conference, 2010, p.368-371
2010
- Link zum Volltext
Microelectronic engineering, 2001-09, Vol.57, p.621-627
2001
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2010 Symposium on VLSI Technology, 2010, p.59-60
2010
- Link zum Volltext
Microelectronic engineering, 2000-06, Vol.53 (1), p.381-384
2000
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2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2015, p.1-3
2015
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Japanese Journal of Applied Physics, 2004-06, Vol.43 (6S), p.3964
2004
Link zum Volltext
IEEE electron device letters, 2009-07, Vol.30 (7), p.748
2009
Link zum Volltext
2010 International Electron Devices Meeting, 2010, p.3.4.1-3.4.4
- Weber, O
- Andrieu, F
- Mazurier, J
- Cassé, M
- Garros, X
- Leroux, C
- Martin, F
- Perreau, P
- Fenouillet-Béranger, C
- Barnola, S
- Gassilloud, R
- Arvet, C
- Thomas, O
- Noel, J.-P
- Rozeau, O
- Jaud, M.-A
- Poiroux, T
- Lafond, D
- Toffoli, A
- Allain, F
- Tabone, C
- Tosti, L
- Brévard, L
- Lehnen, P
- Weber, U
- Baumann, P K
- Boissiere, O
- Schwarzenbach, W
- Bourdelle, K
- Nguyen, B.-Y
- Boeuf, F
- Skotnicki, T
- Faynot, O
2010
- Link zum Volltext
Solid-state electronics, 2010, Vol.54 (2), p.90-96
2010
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Proceedings of 2010 International Symposium on VLSI Technology, System and Application, 2010, p.40-41
2010
- Link zum Volltext
Localized ultra-thin GeOI: An innovative approach to germanium channel MOSFETs on bulk Si substrates
2008
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- Japanese Journal Of Applied Physics
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- Japanese Journal Of Applied Physics, Part 1: Regular Papers And Short Notes And Review Papers
- Japanese Journal Of Applied Physics. Part. 1, Regular Papers, Brief Communications & Review Papers
- Journal Of Vacuum Science & Technology A: Vacuum, Surfaces, And Films
- Journal Of Vacuum Science & Technology. A, Vacuum, Surfaces, And Films