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Freestanding single crystal AlN layers grown using the SiC substrate evaporation method

CrystEngComm, 2017, Vol.19 (23), p.3192-3197

2017

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Microstructure and strength of AlN–SiC interface studied by synchrotron X-rays

Journal of materials science, 2017-04, Vol.52 (8), p.4244-4252

2017

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Third International Conference “Physics for Life Sciences” Study of Dentin Structural Features by Computed Microtomography and Transmission Electron Microscopy

Technical physics, 2020-09, Vol.65 (9), p.1391-1402

2020

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A New Method for Synchrotron Radiation X-Ray Imaging of Micro-Objects using Nanofocusing Optics and Tomography

Technical physics letters, 2023-12, Vol.49 (Suppl 4), p.S315-S318

2023

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Structural transformation of lattice defects in free-spreading growth of bulk SiC crystals

CrystEngComm, 2014-01, Vol.16 (37), p.8917-8923

2014

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Quantitative hard x-ray phase contrast imaging of micropipes in SiC

AIP advances, 2013-12, Vol.3 (12), p.122109-122109-11

2013

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Capsule-like voids in SiC single crystal: Phase contrast imaging and computer simulations

AIP advances, 2014-09, Vol.4 (9), p.097134-097134-7

2014

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Study of micropores in single crystals by in-line phase contrast imaging with synchrotron radiation

Physics Uspekhi, 2019-06, Vol.62 (6), p.602-616

2019

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Section Methods of X-Ray Diffraction Topography

Technical physics, 2023-12, Vol.68 (12), p.778-798

2023

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The misfit stresses of dilatation line in semiconductor nanoheterostructures with angular boundaries

Journal of physics. Conference series, 2020-12, Vol.1695 (1), p.12014

2020

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Study of Structural Defects in Sapphire Ribbons using X-Ray Topography and Coherent Imaging in Synchrotron Radiation

Surface investigation, x-ray, synchrotron and neutron techniques, 2023-12, Vol.17 (Suppl 1), p.S20-S27

2023

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Nondestructive 3D-evaluation of human dentin by microtomography using synchrotron radiation

Journal of physics. Conference series, 2019-12, Vol.1410 (1), p.12066

2019

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Computer simulations of X‐ray phase‐contrast images and microtomographic observation of tubules in dentin

Journal of synchrotron radiation, 2020-03, Vol.27 (2), p.462-467

2020

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A Model of Microcrack Development in Human Tooth Dentin Using Data of Microtomography

Technical physics letters, 2020-05, Vol.46 (5), p.505-509

2020

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Far-field x-ray phase contrast imaging has no detailed information on the object

Journal of physics. D, Applied physics, 2010-11, Vol.43 (44), p.442002-442002

2010

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Study of a macrodefect in a silicon carbid single crystal by means of X-ray phase contrast

Crystallography reports, 2016-11, Vol.61 (6), p.914-917

2016

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Analytic determination of the three-dimensional distribution of dislocations using synchrotron X-ray topography

Journal of applied crystallography, 2006-02, Vol.39 (1), p.106-108

2006

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Imaging of micro-steps on as-grown surface of sapphire with X-ray phase contrast technique

Physics letters. A, 2024-11, Vol.525, p.129901, Article 129901

2024

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Synchrotron radiography and x-ray topography studies of hexagonal habitus SiC bulk crystals

Journal of materials research, 2002-10, Vol.17 (10), p.2705-2711

2002

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X-ray imaging study of lattice defects related to diffusion of helium in quartz

Journal of physics. D, Applied physics, 2003-05, Vol.36 (10A), p.A12-A16

2003

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Detection of dislocations in strongly absorbing crystals by projection X-ray topography in back reflection

Journal of physics. D, Applied physics, 1995-04, Vol.28 (4A), p.A47-A49

1995

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Investigation of dislocations in Czochralski grown Si1−xGex single crystals

Journal of physics. D, Applied physics, 2009-04, Vol.42, p.085404

2009

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Structural Transformation of Dislocated Micropipes in Silicon Carbide

Materials science forum, 2004-01, Vol.457-460, p.367-370

2004

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X-ray diffractometry and topography of lattice plane curvature in thermally deformed Si wafer

Journal of synchrotron radiation, 2008-01, Vol.15 (1), p.96-99

2008

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X-Ray Imaging and TEM Study of Micropipes Related to their Propagation through Porous SiC Layer/SiC Epilayer Interface

Materials science forum, 2004-01, Vol.457-460, p.363-366

2004

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Freestanding single crystal AlN layers grown using the SiC substrate evaporation method

Microstructure and strength of AlN–SiC interface studied by synchrotron X-rays

Third International Conference “Physics for Life Sciences” Study of Dentin Structural Features by Computed Microtomography and Transmission Electron Microscopy

A New Method for Synchrotron Radiation X-Ray Imaging of Micro-Objects using Nanofocusing Optics and Tomography

Structural transformation of lattice defects in free-spreading growth of bulk SiC crystals

Quantitative hard x-ray phase contrast imaging of micropipes in SiC

Capsule-like voids in SiC single crystal: Phase contrast imaging and computer simulations

Study of micropores in single crystals by in-line phase contrast imaging with synchrotron radiation

Section Methods of X-Ray Diffraction Topography

The misfit stresses of dilatation line in semiconductor nanoheterostructures with angular boundaries

Study of Structural Defects in Sapphire Ribbons using X-Ray Topography and Coherent Imaging in Synchrotron Radiation

Nondestructive 3D-evaluation of human dentin by microtomography using synchrotron radiation

Computer simulations of X‐ray phase‐contrast images and microtomographic observation of tubules in dentin

A Model of Microcrack Development in Human Tooth Dentin Using Data of Microtomography

Far-field x-ray phase contrast imaging has no detailed information on the object

Study of a macrodefect in a silicon carbid single crystal by means of X-ray phase contrast

Analytic determination of the three-dimensional distribution of dislocations using synchrotron X-ray topography

Imaging of micro-steps on as-grown surface of sapphire with X-ray phase contrast technique

Synchrotron radiography and x-ray topography studies of hexagonal habitus SiC bulk crystals

X-ray imaging study of lattice defects related to diffusion of helium in quartz

Detection of dislocations in strongly absorbing crystals by projection X-ray topography in back reflection

Investigation of dislocations in Czochralski grown Si1−xGex single crystals

Structural Transformation of Dislocated Micropipes in Silicon Carbide

X-ray diffractometry and topography of lattice plane curvature in thermally deformed Si wafer

X-Ray Imaging and TEM Study of Micropipes Related to their Propagation through Porous SiC Layer/SiC Epilayer Interface

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