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Specialized electron beam nanolithography for EUV and X-ray diffractive optics

IEEE journal of quantum electronics, 2006-01, Vol.42 (1), p.27-35

Anderson, E.H.

2006

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Sub-60-nm quasi-planar FinFETs fabricated using a simplified process

IEEE electron device letters, 2001-10, Vol.22 (10), p.487-489

2001

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Extreme ultraviolet lithography capabilities at the advanced light source using a 0.3-NA optic

IEEE journal of quantum electronics, 2006-01, Vol.42 (1), p.44-50

2006

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Simultaneous Piezoelectric Sensing/Actuation: Analysis And Application To Controlled Structures

Journal of sound and vibration, 1994-07, Vol.174 (5), p.617-639

1994

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Lensless X-ray imaging in reflection geometry

Nature photonics, 2011-04, Vol.5 (4), p.243-245

2011

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Nanomechanical oscillations in a single-C60 transistor

Nature (London), 2000-09, Vol.407 (6800), p.57-60

2000

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Ultrahigh-Resolution X-ray Tomography

Science (American Association for the Advancement of Science), 1994-11, Vol.266 (5188), p.1213-1215

1994

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A 10,000 groove/mm multilayer coated grating for EUV spectroscopy

Optics express, 2011-03, Vol.19 (7), p.6320-6325

2011

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Control of surface mobility for conformal deposition of Mo–Si multilayers on saw-tooth substrates

Applied surface science, 2013-11, Vol.284, p.575-580

2013

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Breaking the Phonon Bottleneck for Holes in Semiconductor Quantum Dots

Physical review letters, 2007-04, Vol.98 (17), Article 177403

2007

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State-resolved studies of biexcitons and surface trapping dynamics in semiconductor quantum dots

The Journal of chemical physics, 2008-08, Vol.129 (8), p.084701-084701

2008

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Unified picture of electron and hole relaxation pathways in semiconductor quantum dots

Physical review. B, Condensed matter and materials physics, 2007-06, Vol.75 (24), Article 245311

2007

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Glycocalyx-mimetic dextran-modified poly(vinyl amine) surfactant coating reduces platelet adhesion on medical-grade polycarbonate surface

Biomaterials, 2006-06, Vol.27 (16), p.3084-3095

2006

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Imaging of soft and hard materials using a Boersch phase plate in a transmission electron microscope

Ultramicroscopy, 2010-04, Vol.110 (5), p.563-570

2010

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Defect-free periodic structures using extreme ultraviolet Talbot lithography in a table-top system

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2013-11, Vol.31 (6), p.6

2013

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State-to-state exciton dynamics in semiconductor quantum dots

Physical review. B, Condensed matter and materials physics, 2006-12, Vol.74 (23), Article 235328

2006

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Nanoimaging with a compact extreme-ultraviolet laser

Optics letters, 2005-08, Vol.30 (16), p.2095

2005

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Calibration of the modulation transfer function of surface profilometers with binary pseudorandom test standards: expanding the application range to Fizeau interferometers and electron microscopes

Optical engineering, 2011-09, Vol.50 (9), p.93604

Anderson, Erik H.

2011

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Development of pseudorandom binary arrays for calibration of surface profile metrology tools

Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2009-11, Vol.27 (6), p.3213-3219

2009

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Characterization of electron microscopes with binary pseudo-random multilayer test samples

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2010-12, Vol.649 (1)

2010

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Stability of modulation transfer function calibration of surface profilometers using binary pseudo-random gratings and arrays with nonideal groove shapes

Optical engineering, 2010-05, Vol.49 (5), p.53606

Barber, Samuel K.

2010

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Magnetic soft X-ray microscopy: Imaging spin dynamics at the nanoscale

Journal of magnetism and magnetic materials, 2007-03, Vol.310 (2), p.2689-2692

2007

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Dynamical x-ray microscopy investigation of electromigration in passivated inlaid Cu interconnect structures

Applied physics letters, 2002-09, Vol.81 (14), p.2535-2537

2002

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Sub-pixel alignment for direct-write electron beam lithography

Microelectronic engineering, 2004-06, Vol.73, p.74-79

2004

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Noise analysis and noise reduction methods in kilohertz pump-probe experiments

Review of scientific instruments, 2007-07, Vol.78 (7), p.073101-073101

2007

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Specialized electron beam nanolithography for EUV and X-ray diffractive optics

Sub-60-nm quasi-planar FinFETs fabricated using a simplified process

Extreme ultraviolet lithography capabilities at the advanced light source using a 0.3-NA optic

Simultaneous Piezoelectric Sensing/Actuation: Analysis And Application To Controlled Structures

Lensless X-ray imaging in reflection geometry

Nanomechanical oscillations in a single-C60 transistor

Ultrahigh-Resolution X-ray Tomography

A 10,000 groove/mm multilayer coated grating for EUV spectroscopy

Control of surface mobility for conformal deposition of Mo–Si multilayers on saw-tooth substrates

Breaking the Phonon Bottleneck for Holes in Semiconductor Quantum Dots

State-resolved studies of biexcitons and surface trapping dynamics in semiconductor quantum dots

Unified picture of electron and hole relaxation pathways in semiconductor quantum dots

Glycocalyx-mimetic dextran-modified poly(vinyl amine) surfactant coating reduces platelet adhesion on medical-grade polycarbonate surface

Imaging of soft and hard materials using a Boersch phase plate in a transmission electron microscope

Defect-free periodic structures using extreme ultraviolet Talbot lithography in a table-top system

State-to-state exciton dynamics in semiconductor quantum dots

Nanoimaging with a compact extreme-ultraviolet laser

Calibration of the modulation transfer function of surface profilometers with binary pseudorandom test standards: expanding the application range to Fizeau interferometers and electron microscopes

Development of pseudorandom binary arrays for calibration of surface profile metrology tools

Characterization of electron microscopes with binary pseudo-random multilayer test samples

Stability of modulation transfer function calibration of surface profilometers using binary pseudo-random gratings and arrays with nonideal groove shapes

Magnetic soft X-ray microscopy: Imaging spin dynamics at the nanoscale

Dynamical x-ray microscopy investigation of electromigration in passivated inlaid Cu interconnect structures

Sub-pixel alignment for direct-write electron beam lithography

Noise analysis and noise reduction methods in kilohertz pump-probe experiments

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