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On-Chip Thermal Testing Using MOSFETs in Weak Inversion

IEEE transactions on instrumentation and measurement, 2015-02, Vol.64 (2), p.524-532

2015

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Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging

IEEE transactions on instrumentation and measurement, 2019-08, Vol.68 (8), p.2861-2870

2019

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Single-MOSFET DC thermal sensor for RF-amplifier central frequency extraction

Sensors and actuators. A. Physical., 2017-09, Vol.264, p.157-164

2017

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Differential temperature sensor with high sensitivity, wide dynamic range and digital offset calibration

Sensors and actuators. A. Physical., 2017-08, Vol.263, p.373-379

2017

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MOSFET dynamic thermal sensor for IC testing applications

Sensors and actuators. A. Physical., 2016-05, Vol.242, p.195-202

2016

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Thermal phase lag heterodyne infrared imaging for current tracking in radio frequency integrated circuits

Applied physics letters, 2017-02, Vol.110 (9)

2017

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Spatially and frequency-resolved monitoring of intradie capacitive coupling by heterodyne excitation infrared lock-in thermography

Applied physics letters, 2013-02, Vol.102 (5)

2013

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Efficiency determination of RF linear power amplifiers by steady-state temperature monitoring using built-in sensors

Sensors and actuators. A. Physical., 2013-04, Vol.192, p.49-57

2013

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Study of heat sources interacting in integrated circuits by laser mirage effect

Applied physics letters, 2014-08, Vol.105 (8)

2014

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DC Temperature Measurements to Characterize the Central Frequency and 3 dB Bandwidth in mmW Power Amplifiers

IEEE microwave and wireless components letters, 2015-11, Vol.25 (11), p.745-747

2015

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Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

Measurement science & technology, 2010-07, Vol.21 (7), p.075104

2010

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On the Use of Static Temperature Measurements as Process Variation Observable

Journal of electronic testing, 2012-10, Vol.28 (5), p.685-695

2012

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Characterization of MOSFET Temperature Sensors for On-chip Dynamic Thermal Measurements

Procedia engineering, 2015, Vol.120, p.836-839

2015

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Defect-oriented non-intrusive RF test using on-chip temperature sensors

2013 IEEE 31st VLSI Test Symposium (VTS), 2013, p.1-6

2013

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Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations

Journal of electronic testing, 2011-06, Vol.27 (3), p.225-240

2011

Volltextzugriff (PDF)

DC temperature measurements for power gain monitoring in RF power amplifiers

2012 IEEE International Test Conference, 2012, p.1-8

2012

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Non-invasive monitoring of CMOS power amplifiers operating at RF and mmW Frequencies using an on-chip thermal sensor

2011 IEEE Radio Frequency Integrated Circuits Symposium, 2011, p.1-4

2011

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Temperature sensors to measure the central frequency and 3 dB bandwidth in mm W power amplifiers

2014-04

Volltextzugriff (PDF)

Electro-thermal coupling analysis methodology for RF circuits

Microelectronics, 2012-09, Vol.43 (9), p.633-641

2012

Volltextzugriff (PDF)

Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers

Microelectronics, 2014-05, Vol.45 (5), p.484-490

2014

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Temperature sensors and measurements to test analogue circuits: questions and answers

2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW), 2016, p.1-5

2016

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Advanced failure detection techniques in deep submicron CMOS integrated circuits

Microelectronics and reliability, 1999, Vol.39 (6), p.909-918

1999

Volltextzugriff (PDF)

Monitor strategies for variability reduction considering correlation between power and timing variability

2011 IEEE International SOC Conference, 2011, p.225-230

2011

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Testing RF circuits with true non-intrusive built-in sensors

2012

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Four different approaches for the measurement of IC surface temperature: Application to thermal testing

2002

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On-Chip Thermal Testing Using MOSFETs in Weak Inversion

Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging

Single-MOSFET DC thermal sensor for RF-amplifier central frequency extraction

Differential temperature sensor with high sensitivity, wide dynamic range and digital offset calibration

MOSFET dynamic thermal sensor for IC testing applications

Thermal phase lag heterodyne infrared imaging for current tracking in radio frequency integrated circuits

Spatially and frequency-resolved monitoring of intradie capacitive coupling by heterodyne excitation infrared lock-in thermography

Efficiency determination of RF linear power amplifiers by steady-state temperature monitoring using built-in sensors

Study of heat sources interacting in integrated circuits by laser mirage effect

DC Temperature Measurements to Characterize the Central Frequency and 3 dB Bandwidth in mmW Power Amplifiers

Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

On the Use of Static Temperature Measurements as Process Variation Observable

Characterization of MOSFET Temperature Sensors for On-chip Dynamic Thermal Measurements

Defect-oriented non-intrusive RF test using on-chip temperature sensors

Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations

DC temperature measurements for power gain monitoring in RF power amplifiers

Non-invasive monitoring of CMOS power amplifiers operating at RF and mmW Frequencies using an on-chip thermal sensor

Temperature sensors to measure the central frequency and 3 dB bandwidth in mm W power amplifiers

Electro-thermal coupling analysis methodology for RF circuits

Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers

Temperature sensors and measurements to test analogue circuits: questions and answers

Advanced failure detection techniques in deep submicron CMOS integrated circuits

Monitor strategies for variability reduction considering correlation between power and timing variability

Testing RF circuits with true non-intrusive built-in sensors

Four different approaches for the measurement of IC surface temperature: Application to thermal testing

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