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Determination of the Insulation Gap of Uranium Oxides by Spectroscopic Ellipsometry and Density Functional Theory

Journal of physical chemistry. C, 2013-08, Vol.117 (32), p.16540-16551

2013

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Oxide structure of air-passivated U-6Nb alloy thin films

Journal of nuclear materials, 2020-10, Vol.539 (C), p.152356, Article 152356

2020

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Tuning the index of refraction of a polyvinyl toluene and polystyrene copolymer toward a heterogenous, index‐matched neutron detector

Journal of applied polymer science, 2023-01, Vol.140 (2), p.n/a

2023

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Y 2 O 3 optical constants between 5 nm and 50 nm

Optics express, 2019-02, Vol.27 (3), p.3324

2019

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Formation of solid thorium monoxide at near-ambient conditions as observed by neutron reflectometry and interpreted by screened hybrid functional calculations

Journal of nuclear materials, 2017-04, Vol.487 (C), p.288-296

2017

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Y2O3 optical constants between 5 nm and 50 nm

Optics express, 2019-02, Vol.27 (3), p.3324-3336

2019

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Optical constants of evaporated amorphous zinc arsenide (Zn 3 As 2 ) via spectroscopic ellipsometry

Optical materials express, 2019-12, Vol.9 (12), p.4677

2019

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High-Aspect-Ratio Metal Microfabrication by Nickel Electroplating of Patterned Carbon Nanotube Forests

Journal of microelectromechanical systems, 2015-10, Vol.24 (5), p.1331-1337

2015

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Effect of iron catalyst thickness on vertically aligned carbon nanotube forest straightness for CNT-MEMS

Journal of micromechanics and microengineering, 2012-05, Vol.22 (5), p.55004-8

2012

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Measured optical constants of copper from 10 nm to 35 nm

Optics express, 2009-12, Vol.17 (26), p.23873-23879

2009

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Characterization of optical constants for uranium from 10 to 47 nm

Applied Optics, 2010-03, Vol.49 (9), p.1581

2010

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Determining indices of refraction for ThO2 thin films sputtered under different bias voltages from 1.2 to 6.5 eV by spectroscopic ellipsometry

Thin solid films, 2006-11, Vol.515 (3), p.847-853

2006

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Polymer molded templates for nanostructured amorphous silicon photovoltaics

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2011-03, Vol.29 (2), p.021017-021017-5

2011

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Photodegradation of self-immolating polymers as a potential solution to particulate contamination

Solar energy materials and solar cells, 2024-08, Vol.272, p.112902, Article 112902

2024

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Extreme-ultraviolet polarimeter utilizing laser-generated high-order harmonics

Review of scientific instruments, 2008-10, Vol.79 (10), p.103108-103108-7

2008

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Formation of solid thorium monoxide at near-ambient conditions as observed by neutron reflectometry and interpreted by screened hybrid functional calculations

Journal of nuclear materials, 2017-04, Vol.486, p.288

2017

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An inexpensive high-temperature optical fiber thermometer

Journal of quantitative spectroscopy & radiative transfer, 2017-01, Vol.187, p.358-363

2017

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What the Universe Means to People like Me

Dialogue (Salt Lake City, Utah), 2003-04, Vol.36 (1), p.109-125

Allred, David D.

2003

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Uranium Oxide as a Highly Reflective Coating from 100-400 eV

AIP conference proceedings, 2004, Vol.705 (1), p.796-799

2004

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The Extreme Ultraviolet Imager Investigation for the IMAGE Mission

Space science reviews, 2000-01, Vol.91 (1-2), p.197-242

2000

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Determining indices of refraction for ThO 2 thin films sputtered under different bias voltages from 1.2 to 6.5 eV by spectroscopic ellipsometry

Thin solid films, 2006, Vol.515 (3), p.847-853

2006

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Polymer molded templates for nanostructured amorphous silicon photovoltaicsa

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2011-03, Vol.29 (2)

2011

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Emitted current instability from silicon field emission emitters due to sputtering by residual gas ions

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1994-07, Vol.12 (4), p.2581-2585

1994

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Oxidation of aluminum thin films protected by ultrathin MgF 2 layers measured using spectroscopic ellipsometry and X-ray photoelectron spectroscopy

OSA continuum, 2021-03, Vol.4 (3), p.879

2021

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Thorium-Based Thin Films as Highly Reflective Mirrors in the EUV

MRS proceedings, 2005, Vol.893, Article 0893-JJ05-09

2005

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Determination of the Insulation Gap of Uranium Oxides by Spectroscopic Ellipsometry and Density Functional Theory

Oxide structure of air-passivated U-6Nb alloy thin films

Tuning the index of refraction of a polyvinyl toluene and polystyrene copolymer toward a heterogenous, index‐matched neutron detector

Y 2 O 3 optical constants between 5 nm and 50 nm

Formation of solid thorium monoxide at near-ambient conditions as observed by neutron reflectometry and interpreted by screened hybrid functional calculations

Y2O3 optical constants between 5 nm and 50 nm

Optical constants of evaporated amorphous zinc arsenide (Zn 3 As 2 ) via spectroscopic ellipsometry

High-Aspect-Ratio Metal Microfabrication by Nickel Electroplating of Patterned Carbon Nanotube Forests

Effect of iron catalyst thickness on vertically aligned carbon nanotube forest straightness for CNT-MEMS

Measured optical constants of copper from 10 nm to 35 nm

Characterization of optical constants for uranium from 10 to 47 nm

Determining indices of refraction for ThO2 thin films sputtered under different bias voltages from 1.2 to 6.5 eV by spectroscopic ellipsometry

Polymer molded templates for nanostructured amorphous silicon photovoltaics

Photodegradation of self-immolating polymers as a potential solution to particulate contamination

Extreme-ultraviolet polarimeter utilizing laser-generated high-order harmonics

Formation of solid thorium monoxide at near-ambient conditions as observed by neutron reflectometry and interpreted by screened hybrid functional calculations

An inexpensive high-temperature optical fiber thermometer

What the Universe Means to People like Me

Uranium Oxide as a Highly Reflective Coating from 100-400 eV

The Extreme Ultraviolet Imager Investigation for the IMAGE Mission

Determining indices of refraction for ThO 2 thin films sputtered under different bias voltages from 1.2 to 6.5 eV by spectroscopic ellipsometry

Polymer molded templates for nanostructured amorphous silicon photovoltaicsa

Emitted current instability from silicon field emission emitters due to sputtering by residual gas ions

Oxidation of aluminum thin films protected by ultrathin MgF 2 layers measured using spectroscopic ellipsometry and X-ray photoelectron spectroscopy

Thorium-Based Thin Films as Highly Reflective Mirrors in the EUV

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