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Quantum-mechanical effects in trigate SOI MOSFETs

IEEE transactions on electron devices, 2006-05, Vol.53 (5), p.1131-1136

2006

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Low-temperature electron mobility in Trigate SOI MOSFETs

IEEE electron device letters, 2006-02, Vol.27 (2), p.120-122

2006

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Temperature effects on trigate SOI MOSFETs

IEEE electron device letters, 2006-03, Vol.27 (3), p.172-174

2006

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Physical origin of negative differential resistance in SOI transistors

Electronics letters, 1989-06, Vol.25 (13), p.827-828

1989

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Use of noise thermometry to study the effects of self-heating in submicrometer SOI MOSFETs

IEEE electron device letters, 1992-05, Vol.13 (5), p.279-281

1992

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Temperature dependence of threshold voltage in thin-film SOI MOSFETs

IEEE electron device letters, 1990-08, Vol.11 (8), p.329-331

1990

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Suppression of latch in SOI MOSFETs by silicidation of source

Electronics letters, 1991-05, Vol.27 (11), p.1003-1005

1991

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Experimental determination of magnitude of selfheating and its influence on breakdown in silicon-on-insulator transistors

Electronics letters, 1991-10, Vol.27 (22), p.2006

1991

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A simple technique for measuring the generation lifetime in SOI-substrate material using the principle of charge centroids

IEEE electron device letters, 1991-06, Vol.12 (6), p.318-320

1991

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Interpretation of capacitance-voltage characteristics on silicon-on-insulator (SOI) capacitors

Solid-state electronics, 1989, Vol.32 (1), p.65-68

1989

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Reduction of the latch effect in SOI MOSFETS by the silicidation of the source

ESSDERC '91: 21st European Solid State Device Research Conference, 1991, Vol.15 (1), p.203-206

1991

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Activation of Nbti Degradation in Soi Pmos by Self-Heating

1992 IEEE International SOI Conference, 1992, p.130-131

1992

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Optimization of oxygen-implanted silicon substrates for CMOS devices by electrical characterization

IEEE transactions on electron devices, 1986-03, Vol.33 (3), p.354-360

1986

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Explanation for the Negative Differential Resistance in SOI-MOSFETs

ESSDERC '89: 19th European Solid State Device Research Conference, 1989, p.885-888

1989

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Absolute measurements of island temperature in a SOI-MOSFET by noise thermometry

1991 IEEE International SOI Conference Proceedings, 1991, p.26-27

1991

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Electron trapping in buried oxides formed by oxygen implantation

1991 IEEE International SOI Conference Proceedings, 1991, p.6-7

1991

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Monitoring the temperature rise in SOI transistors by measurement of leakage current

1991 IEEE International SOI Conference Proceedings, 1991, p.28-29

1991

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Negative resistance in the output characteristics of SOI MOSFETs

IEEE SOS/SOI Technology Conference, 1989, p.33-34

1989

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A rapid assessment technique for SOI substrates

Proceedings. SOS/SOI Technology Workshop, 1988, p.28

1988

Volltextzugriff (PDF)

The influence of emitter efficiency on single transistor latch in silicon-on-insulator MOSFETs

1990 IEEE SOS/SOI Technology Conference. Proceedings, 1990, p.141-142

1990

Volltextzugriff (PDF)

The effect of high field stress on the capacitance/voltage characteristics of buried insulators formed by oxygen implantation

1990 IEEE SOS/SOI Technology Conference. Proceedings, 1990, p.160-161

1990

Volltextzugriff (PDF)

Modelling of breakdown voltage in sub-micron SOI transistors

1990 IEEE SOS/SOI Technology Conference. Proceedings, 1990, p.17-18

1990

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Determination of generation lifetime in silicon-on-insulator (SOI) substrates using a three-terminal capacitance-time response

1990 IEEE SOS/SOI Technology Conference. Proceedings, 1990, p.93-94

1990

Volltextzugriff (PDF)

A simple model to predict the holding voltage for SOI MOSFETs operating in the latch state

1990 IEEE SOS/SOI Technology Conference. Proceedings, 1990, p.19-20

1990

Volltextzugriff (PDF)

Development and validation of the Medication Regimen Simplification Guide for Residential Aged CarE (MRS GRACE)

Clinical interventions in aging, 2018-01, Vol.13, p.975-986

2018

Volltextzugriff (PDF)

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Quantum-mechanical effects in trigate SOI MOSFETs

Low-temperature electron mobility in Trigate SOI MOSFETs

Temperature effects on trigate SOI MOSFETs

Physical origin of negative differential resistance in SOI transistors

Use of noise thermometry to study the effects of self-heating in submicrometer SOI MOSFETs

Temperature dependence of threshold voltage in thin-film SOI MOSFETs

Suppression of latch in SOI MOSFETs by silicidation of source

Experimental determination of magnitude of selfheating and its influence on breakdown in silicon-on-insulator transistors

A simple technique for measuring the generation lifetime in SOI-substrate material using the principle of charge centroids

Interpretation of capacitance-voltage characteristics on silicon-on-insulator (SOI) capacitors

Reduction of the latch effect in SOI MOSFETS by the silicidation of the source

Activation of Nbti Degradation in Soi Pmos by Self-Heating

Optimization of oxygen-implanted silicon substrates for CMOS devices by electrical characterization

Explanation for the Negative Differential Resistance in SOI-MOSFETs

Absolute measurements of island temperature in a SOI-MOSFET by noise thermometry

Electron trapping in buried oxides formed by oxygen implantation

Monitoring the temperature rise in SOI transistors by measurement of leakage current

Negative resistance in the output characteristics of SOI MOSFETs

A rapid assessment technique for SOI substrates

The influence of emitter efficiency on single transistor latch in silicon-on-insulator MOSFETs

The effect of high field stress on the capacitance/voltage characteristics of buried insulators formed by oxygen implantation

Modelling of breakdown voltage in sub-micron SOI transistors

Determination of generation lifetime in silicon-on-insulator (SOI) substrates using a three-terminal capacitance-time response

A simple model to predict the holding voltage for SOI MOSFETs operating in the latch state

Development and validation of the Medication Regimen Simplification Guide for Residential Aged CarE (MRS GRACE)

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