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Addressing separation and edge passivation challenges for high efficiency shingle heterojunction solar cells

Solar energy materials and solar cells, 2023-01, Vol.250, p.112095, Article 112095

2023

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Improvement of silicon heterojunction module efficiency using fast illumination post-treatments

Solar energy materials and solar cells, 2023-08, Vol.257, p.112395, Article 112395

2023

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Attempt to correlate dislocations network and distribution to macroscale plane rotations in cast-mono ingots

Solar energy materials and solar cells, 2023-01, Vol.249, p.112022, Article 112022

2023

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Closing the gap between n‐ and p‐type silicon heterojunction solar cells: 24.47% efficiency on lightly doped Ga wafers

Progress in photovoltaics, 2023-12, Vol.31 (12), p.1235-1244

2023

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Edge passivation of shingled poly-Si/SiOx passivated contacts solar cells

EPJ Photovoltaics, 2023, Vol.14, p.22

2023

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In situ ultrasonic interface tracking for photovoltaic silicon directional solidification

Journal of crystal growth, 2023-07

2023

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Tracking Hydrogen During Poly-Si/SiOx Contact Fabrication: An Infrared Spectroscopy Analysis of Si–H Bonds Configurations

SiliconPV Conference Proceedings, 2024-02, Vol.1

2024

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Elimination of Oxidation‐Induced Stacking Faults in Silicon Single Crystals Using the Kyropoulos Crystal Growth Method

Physica status solidi. A, Applications and materials science, 2018-09, Vol.215 (17), p.n/a

2018

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In situ ultrasonic interface tracking for photovoltaic silicon directional solidification

Journal of crystal growth, 2023-11, Vol.621, p.127362, Article 127362

2023

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On the defect responsible for the carrier injection-induced degradation of uncompensated n-type Czochralski silicon

Energy procedia, 2017-09, Vol.124, p.657-664

2017

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Novel Way to Assess the Validity of Czochralski Growth Simulations

Physica status solidi. A, Applications and materials science, 2019-09, Vol.216 (17), p.n/a

2019

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Influence of extended crystallographic defects on the formation kinetics of oxygen-related thermal donors in multicrystalline silicon

Journal of crystal growth, 2019-03, Vol.510, p.23-27

2019

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Efficiency limiting crystal defects in monocrystalline silicon and their characterization in production

Solar energy materials and solar cells, 2018-11, Vol.186, p.217-226

2018

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Mechanical stirring: Novel engineering approach for in situ spectroscopic analysis of melt at high temperature

Heliyon, 2024-02, Vol.10 (4), p.e25626-e25626, Article e25626

2024

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Edge passivation of shingled poly-Si/SiO x passivated contacts solar cells

EPJ Photovoltaics, 2023, Vol.14, p.22

2023

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Mechanical Stirring: Novel Engineering Approach for In Situ Spectroscopic Analysis of Melt at High Temperature

SSRN Electronic Journal

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Present‐Day Deformations of the Jura Arc Inferred by GPS Surveying and Earthquake Focal Mechanisms

Tectonics (Washington, D.C.), 2018-10, Vol.37 (10), p.3782-3804

2018

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Addressing separation and edge passivation challenges for high efficiency shingle heterojunction solar cells

Improvement of silicon heterojunction module efficiency using fast illumination post-treatments

Attempt to correlate dislocations network and distribution to macroscale plane rotations in cast-mono ingots

Closing the gap between n‐ and p‐type silicon heterojunction solar cells: 24.47% efficiency on lightly doped Ga wafers

Edge passivation of shingled poly-Si/SiOx passivated contacts solar cells

In situ ultrasonic interface tracking for photovoltaic silicon directional solidification

Tracking Hydrogen During Poly-Si/SiOx Contact Fabrication: An Infrared Spectroscopy Analysis of Si–H Bonds Configurations

Elimination of Oxidation‐Induced Stacking Faults in Silicon Single Crystals Using the Kyropoulos Crystal Growth Method

In situ ultrasonic interface tracking for photovoltaic silicon directional solidification

On the defect responsible for the carrier injection-induced degradation of uncompensated n-type Czochralski silicon

Novel Way to Assess the Validity of Czochralski Growth Simulations

Influence of extended crystallographic defects on the formation kinetics of oxygen-related thermal donors in multicrystalline silicon

Efficiency limiting crystal defects in monocrystalline silicon and their characterization in production

Mechanical stirring: Novel engineering approach for in situ spectroscopic analysis of melt at high temperature

Edge passivation of shingled poly-Si/SiO x passivated contacts solar cells

Mechanical Stirring: Novel Engineering Approach for In Situ Spectroscopic Analysis of Melt at High Temperature

Present‐Day Deformations of the Jura Arc Inferred by GPS Surveying and Earthquake Focal Mechanisms

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