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IEEE transactions on electron devices, 2016-06, Vol.63 (6), p.2563-2569
2016
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IEEE transactions on electron devices, 2016-03, Vol.63 (3), p.1034-1040
2016
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IEEE electron device letters, 2014-12, Vol.35 (12), p.1221-1223
2014
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Physical review. B, 2023-06, Vol.107 (24), Article 245423
- Aghaee, Morteza
- Akkala, Arun
- Ali, Rizwan
- Andrzejczuk, Mariusz
- Antipov, Andrey E.
- Astafev, Mikhail
- Bauer, Bela
- Becker, Jonathan
- Boddapati, Srini
- Boekhout, Frenk
- Bommer, Jouri
- Bosma, Tom
- Boutin, Samuel
- Caroff, Philippe
- Casparis, Lucas
- Cassidy, Maja
- Chatoor, Sohail
- Christensen, Anna Wulf
- Cole, William S.
- Cui, Ajuan
- Dalampiras, Paschalis
- Dokania, Anand
- de Lange, Gijs
- Fallahi, Saeed
- Gamble, John
- Govender, Deshan
- Griggio, Flavio
- Grigoryan, Ruben
- Gronin, Sergei
- Gukelberger, Jan
- Hansen, Esben Bork
- Heedt, Sebastian
- Herranz Zamorano, Jesús
- Ho, Samantha
- Holgaard, Ulrik Laurens
- Ingerslev, Henrik
- Johansson, Linda
- Jones, Jeffrey
- Kallaher, Ray
- Kloster, Maren Elisabeth
- Knapp, Christina
- Kocon, Dariusz
- Koski, Jonne
- Krogstrup, Peter
- Kumar, Mahesh
- Laeven, Tom
- Larsen, Thorvald
- Lindemann, Tyler
- Lutchyn, Roman
- Manfra, Michael
- McNeil, Robert
- Mullally, Andrew
- Nayak, Chetan
- Nielsen, Jens
- Nielsen, William Hvidtfelt Padkær
- Nijholt, Bas
- Nurmohamed, Anne
- O'Farrell, Eoin
- Otani, Keita
- Pauka, Sebastian
- Petersson, Karl
- Petit, Luca
- Quintero-Perez, Marina
- Rajpalke, Mohana
- Razmadze, Davydas
- Reentila, Outi
- Reilly, David
- Rouse, Richard
- Sadovskyy, Ivan
- Schreppler, Sydney
- Sidorkin, Vadim
- Singh, Amrita
- Singh, Shilpi
- Sinha, Sarat
- Sohr, Patrick
- Stankevič, Tomaš
- Stek, Lieuwe
- Suominen, Henri
- Suter, Judith
- Teicher, Sam
- Temuerhan, Mine
- Thiyagarajah, Nivetha
- Tholapi, Raj
- Thomas, Mason
- Toomey, Emily
- Upadhyay, Shivendra
- Urban, Ivan
- Vaitiekėnas, Saulius
- Van Hoogdalem, Kevin
- Van Woerkom, David
- Viazmitinov, Dmitrii V.
- Vogel, Dominik
- Waddy, Steven
- Watson, John
- Weston, Joseph
- Winkler, Georg W.
- Yang, Chung Kai
- Yi, Daniel
- Webster, Alex
- Zeisel, Roland
2023
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- Engineering
- Engineering, Electrical & Electronic
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- Double-Gate
- Electrical Engineering
- Finfet
- Finfets
- Heterojunction Tfet
- Logic Gates
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- Random Access Memory
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