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IEEE electron device letters, 2004-04, Vol.25 (4), p.191-193
2004
- Link zum Volltext
2012 Symposium on VLSI Technology (VLSIT), 2012, p.131-132
- Auth, C.
- Allen, C.
- Blattner, A.
- Bergstrom, D.
- Brazier, M.
- Bost, M.
- Buehler, M.
- Chikarmane, V.
- Ghani, T.
- Glassman, T.
- Grover, R.
- Han, W.
- Hanken, D.
- Hattendorf, M.
- Hentges, P.
- Heussner, R.
- Hicks, J.
- Ingerly, D.
- Jain, P.
- Jaloviar, S.
- James, R.
- Jones, D.
- Jopling, J.
- Joshi, S.
- Kenyon, C.
- Liu, H.
- McFadden, R.
- McIntyre, B.
- Neirynck, J.
- Parker, C.
- Pipes, L.
- Post, I.
- Pradhan, S.
- Prince, M.
- Ramey, S.
- Reynolds, T.
- Roesler, J.
- Sandford, J.
- Seiple, J.
- Smith, P.
- Thomas, C.
- Towner, D.
- Troeger, T.
- Weber, C.
- Yashar, P.
- Zawadzki, K.
- Mistry, K.
2012
- Link zum Volltext
IEEE transactions on electron devices, 2004-11, Vol.51 (11), p.1790-1797
2004
- Link zum Volltext
2013 IEEE International Reliability Physics Symposium (IRPS), 2013, p.4C.5.1-4C.5.5
2013
- Link zum Volltext
2020 IEEE International Reliability Physics Symposium (IRPS), 2020, p.1-4
2020
- Link zum Volltext
Physical review letters, 1998-11, Vol.81 (22), p.4831-4834
1998
Link zum Volltext
Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 2012, p.1-6
2012
- Link zum Volltext
2017 IEEE International Electron Devices Meeting (IEDM), 2017, p.29.1.1-29.1.4
- Auth, C.
- Aliyarukunju, A.
- Asoro, M.
- Bergstrom, D.
- Bhagwat, V.
- Birdsall, J.
- Bisnik, N.
- Buehler, M.
- Chikarmane, V.
- Ding, G.
- Fu, Q.
- Gomez, H.
- Han, W.
- Hanken, D.
- Haran, M.
- Hattendorf, M.
- Heussner, R.
- Hiramatsu, H.
- Ho, B.
- Jaloviar, S.
- Jin, I.
- Joshi, S.
- Kirby, S.
- Kosaraju, S.
- Kothari, H.
- Leatherman, G.
- Lee, K.
- Leib, J.
- Madhavan, A.
- Marla, K.
- Meyer, H.
- Mule, T.
- Parker, C.
- Parthasarathy, S.
- Pelto, C.
- Pipes, L.
- Post, I.
- Prince, M.
- Rahman, A.
- Rajamani, S.
- Saha, A.
- Santos, J. Dacuna
- Sharma, M.
- Sharma, V.
- Shin, J.
- Sinha, P.
- Smith, P.
- Sprinkle, M.
- St. Amour, A.
- Staus, C.
- Suri, R.
- Towner, D.
- Tripathi, A.
- Tura, A.
- Ward, C.
- Yeoh, A.
2017
- Link zum Volltext
Physical review letters, 1995-09, Vol.75 (12), p.2292-2295
1995
Link zum Volltext
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004, 2004, p.50-51
2004
- Link zum Volltext
Physical review letters, 1999-02, Vol.82 (5), p.1048-1051
1999
Link zum Volltext
Applied physics letters, 2004-12, Vol.85 (25), p.6188-6190
2004
Link zum Volltext
Physical review letters, 1993-09, Vol.71 (12), p.1939-1942
1993
Link zum Volltext
IEEE transactions on electron devices, 1998-11, Vol.45 (11), p.2381-2383
1998
- Link zum Volltext
Physical review letters, 2000-03, Vol.84 (10), p.2124-2127
2000
Link zum Volltext
Physical review letters, 1995-06, Vol.74 (26), p.5244-5247
1995
Link zum Volltext
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2003-12, Vol.212, p.45-50
2003
Link zum Volltext
2018 IEEE International Reliability Physics Symposium (IRPS), 2018, p.6E.3-1-6E.3-5
2018
- Link zum Volltext
Geophysical journal international, 1999-06, Vol.137 (3), p.793-804
1999
Link zum Volltext
Physical review letters, 1997-12, Vol.79 (22), p.4477-4480
1997
Link zum Volltext
2013 IEEE International Reliability Physics Symposium (IRPS), 2013, p.5D.1.1-5D.1.5
2013
- Link zum Volltext
Europhysics letters, 1998-02, Vol.41 (4), p.437-442
1998
Link zum Volltext
Physica scripta, 2001-01, Vol.2001 (1), p.35
2001
Link zum Volltext
2014 IEEE International Reliability Physics Symposium, 2014, p.6A.5.1-6A.5.7
2014
- Link zum Volltext
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004, 2004, p.118-119
2004
- Link zum Volltext
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