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Distribution of shallow NV centers in diamond revealed by photoluminescence spectroscopy and nanomachining

Carbon (New York), 2020-10, Vol.167, p.114-121

2020

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Radiation pressure excitation of a low temperature atomic force/magnetic force microscope for imaging in 4-300 K temperature range

Review of scientific instruments, 2017-01, Vol.88 (1)

2017

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Investigation of CVD graphene as-grown on Cu foil using simultaneous scanning tunneling/atomic force microscopy

Beilstein journal of nanotechnology, 2018, Vol.9 (1), p.2953-2959

2018

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Poly(glycidyl methacrylate) modified cellulose nanocrystals and their PBAT-based nanocomposites

International journal of biological macromolecules, 2023-12, Vol.253, p.126851, Article 126851

2023

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Local force gradients on Si(111) during simultaneous scanning tunneling/atomic force microscopy

Applied physics letters, 2007-03, Vol.90 (13)

2007

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Atomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force Microscopy

Ultramicroscopy, 2019-01, Vol.196, p.54-57

Özgür Özer, H.

2019

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Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope

Proceedings of the Royal Society. A, Mathematical, physical, and engineering sciences, 2001-05, Vol.457 (2009), p.1161-1174

2001

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Energy dissipation in atomic force microscopy and atomic loss processes

Physical review letters, 2001-12, Vol.87 (26), p.265502-265502, Article 265502

2001

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Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement

Applied surface science, 2009-12, Vol.256 (5), p.1299-1303

2009

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Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy

Applied physics letters, 2001-09, Vol.79 (12), p.1915-1917

2001

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Measurement of energy dissipation between tungsten tip and Si(1 0 0)-(2×1) using sub-Ångström oscillation amplitude non-contact atomic force microscope

Applied surface science, 2003-03, Vol.210 (1), p.12-17

2003

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Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2×1) with small oscillation amplitudes

Applied surface science, 2002-03, Vol.188 (3), p.301-305

2002

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Dissipation Imaging with Low Amplitude off-Resonance Atomic Force Microscopy

Japanese Journal of Applied Physics, 2005-07, Vol.44 (7S), p.5325

2005

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Densification of a polymer glass under high-pressure shear flow

Physical review. B, 2022-08, Vol.106 (6), Article L060103

2022

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Direct measurement of molecular stiffness and damping in confined water layers

Physical review. B, Condensed matter and materials physics, 2004-08, Vol.70 (5), p.054114.1-054114.8, Article 054114

2004

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Room Temperature Mechanical Thinning and Imprinting of Solid Films

Nano letters, 2007-02, Vol.7 (2), p.357-362

2007

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Local force gradients on Si(111) during simultaneous scanningtunneling/atomic force microscopy

Applied physics letters, 2007-03, Vol.90 (13), p.133110-133110-3

2007

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Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement

Applied surface science, 2010, Vol.256 (5), p.1299-1303

2010

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Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2 x 1): Festschrift in honour of Professor Salim Ciraci

Solid state communications, 2002, Vol.124 (12), p.469-472

2002

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Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2×1)

Solid state communications, 2002-12, Vol.124 (12), p.469-472

2002

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Multiparameter Imaging and Understanding the Role of the Tip - Atomic Resolution Images of Rutile TiO 2 (110)

MRS proceedings, 2011, Vol.1318, Article mrsf10-1318-vv09-01

2011

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Nanomechanics Using an Ultra-Small Amplitude AFM

MRS proceedings, 2000, Vol.649, Article Q9.2

2000

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Noncontact lateral-force gradient measurement on Si ( 111 ) - 7 × 7 surface with small-amplitude off-resonance atomic force microscopy

Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 2009-03, Vol.27 (2), p.1001-1005

2009

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Atomic Scale Investigation of Clean and Epi-Grown Si(001) Surfaces Using Scanning Tunneling Microscopy

Özer, H Özgür

1996

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Multiparameter Imaging and Understanding the Role of the Tip - Atomic Resolution Images of Rutile TiO2 (110)

MRS proceedings, 2011, Vol.1318 (1)

2011

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Distribution of shallow NV centers in diamond revealed by photoluminescence spectroscopy and nanomachining

Radiation pressure excitation of a low temperature atomic force/magnetic force microscope for imaging in 4-300 K temperature range

Investigation of CVD graphene as-grown on Cu foil using simultaneous scanning tunneling/atomic force microscopy

Poly(glycidyl methacrylate) modified cellulose nanocrystals and their PBAT-based nanocomposites

Local force gradients on Si(111) during simultaneous scanning tunneling/atomic force microscopy

Atomic resolution force imaging through the static deflection of the cantilever in simultaneous Scanning Tunneling/Atomic Force Microscopy

Direct measurement of interatomic force gradients using an ultra-low-amplitude atomic force microscope

Energy dissipation in atomic force microscopy and atomic loss processes

Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement

Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy

Measurement of energy dissipation between tungsten tip and Si(1 0 0)-(2×1) using sub-Ångström oscillation amplitude non-contact atomic force microscope

Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2×1) with small oscillation amplitudes

Dissipation Imaging with Low Amplitude off-Resonance Atomic Force Microscopy

Densification of a polymer glass under high-pressure shear flow

Direct measurement of molecular stiffness and damping in confined water layers

Room Temperature Mechanical Thinning and Imprinting of Solid Films

Local force gradients on Si(111) during simultaneous scanningtunneling/atomic force microscopy

Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement

Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2 x 1): Festschrift in honour of Professor Salim Ciraci

Ultra-small oscillation amplitude nc-AFM/STM imaging, force and dissipation spectroscopy of Si(100)(2×1)

Multiparameter Imaging and Understanding the Role of the Tip - Atomic Resolution Images of Rutile TiO 2 (110)

Nanomechanics Using an Ultra-Small Amplitude AFM

Noncontact lateral-force gradient measurement on Si ( 111 ) - 7 × 7 surface with small-amplitude off-resonance atomic force microscopy

Atomic Scale Investigation of Clean and Epi-Grown Si(001) Surfaces Using Scanning Tunneling Microscopy

Multiparameter Imaging and Understanding the Role of the Tip - Atomic Resolution Images of Rutile TiO2 (110)

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