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Evolution of anisotropic microstructure and residual stress in sputtered Cr films

Journal of applied physics, 2002-12, Vol.92 (12), p.7183-7192

2002

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Controlling strength and toughness of multilayer films : a new multiscalar approach

Journal of applied physics, 1993-07, Vol.74 (2), p.1015-1021

1993

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Depth-sensitive strain analysis of a W–Ta–W trilayer

Thin solid films, 1997-06, Vol.301 (1), p.55-61

1997

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Residual stress, atomic structure, and growth morphology in B4C/SiC multilayer coatings

Surface & coatings technology, 1996-12, Vol.86-87 (1-3), p.237-242

1996

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Temperature Profiling Femtosecond Laser Induced Modifications Through Transmission Electron Micrscopy

Microscopy and microanalysis, 2006-08, Vol.12 (S02), p.636-637

2006

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Evolution of in-plane texture in reactively sputtered CrN films

Journal of applied physics, 2005-01, Vol.97 (2), p.023525-023525-9

2005

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Single-crystal growth of CoSi2(110) on Si(110)

Applied physics letters, 1989-11, Vol.55 (20), p.2075-2077

1989

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Analysis of thin film stress measurement techniques

Thin solid films, 1997-06, Vol.301 (1), p.45-54

1997

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Nanodot formation induced by femtosecond laser irradiation

Applied physics letters, 2014-10, Vol.105 (16)

2014

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In situ x-ray diffraction observation of multiple texture turnovers in sputtered Cr films

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2004-11, Vol.22 (6), p.2365-2372

2004

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Stresses in Multilayered Thin Films

MRS bulletin, 1999-02, Vol.24 (2), p.34-38

1999

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Multilayer relaxations of Ni(110): New medium energy ion scattering results

Surface science, 1986-05, Vol.171 (2), p.400-414

1986

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Interfacial and surface energetics of CoSi2

Journal of applied physics, 1994-11, Vol.76 (9), p.5190-5194

1994

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Real-time/ in situ diffraction study of phase and microstructural evolution in sputtered β-Ta/Ta2O5 films

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2001-11, Vol.19 (6), p.2910-2919

2001

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Depth-profiling study of a thermal barrier coated superalloy using femtosecond laser-induced breakdown spectroscopy

Spectrochimica acta. Part B: Atomic spectroscopy, 2008, Vol.63 (1), p.27-36

2008

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Depth dependence of residual strains in polycrystalline Mo thin films using high-resolution x-ray diffraction

Journal of applied physics, 1996-05, Vol.79 (9), p.6872-6879

1996

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CoSi2 heteroepitaxy on patterned Si(100) substrates

Journal of applied physics, 1996-12, Vol.80 (11), p.6211-6218

1996

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Combined transmission electron microscopy and x-ray study of the microstructure and texture in sputtered Mo films

Journal of applied physics, 1994-10, Vol.76 (8), p.4610-4617

1994

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Femtosecond pulsed laser direct write production of nano- and microfluidic channels

Applied physics letters, 2006-05, Vol.88 (18)

2006

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Low-temperature homoepitaxial growth on nonplanar Si substrates

Journal of applied physics, 1994-11, Vol.76 (9), p.5185-5189

1994

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Pulsed laser ignition of reactive multilayer films

Applied physics letters, 2006-04, Vol.88 (14), p.144102-144102-3

2006

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Mechanical properties of tough multiscalar microlaminates

Acta metallurgica et materialia, 1995-02, Vol.43 (2), p.427-437

1995

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Surface and grain boundary segregation in relation to intergranular fracture: boron and sulfur in Ni3Al

Scripta metallurgica, 1984-12, Vol.18 (12), p.1417-1420

1984

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Stress anisotropy and stress gradient in magnetron sputtered filmswith different deposition geometries

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2006-02, Vol.24 (2), p.195-201

2006

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Deposition Kinetics and Microstructural Evolution in Sputtered TA Films: a Real-Time/In-Situ Study

MRS proceedings, 1999, Vol.562, Article 141

1999

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Evolution of anisotropic microstructure and residual stress in sputtered Cr films

Controlling strength and toughness of multilayer films : a new multiscalar approach

Depth-sensitive strain analysis of a W–Ta–W trilayer

Residual stress, atomic structure, and growth morphology in B4C/SiC multilayer coatings

Temperature Profiling Femtosecond Laser Induced Modifications Through Transmission Electron Micrscopy

Evolution of in-plane texture in reactively sputtered CrN films

Single-crystal growth of CoSi2(110) on Si(110)

Analysis of thin film stress measurement techniques

Nanodot formation induced by femtosecond laser irradiation

In situ x-ray diffraction observation of multiple texture turnovers in sputtered Cr films

Stresses in Multilayered Thin Films

Multilayer relaxations of Ni(110): New medium energy ion scattering results

Interfacial and surface energetics of CoSi2

Real-time/ in situ diffraction study of phase and microstructural evolution in sputtered β-Ta/Ta2O5 films

Depth-profiling study of a thermal barrier coated superalloy using femtosecond laser-induced breakdown spectroscopy

Depth dependence of residual strains in polycrystalline Mo thin films using high-resolution x-ray diffraction

CoSi2 heteroepitaxy on patterned Si(100) substrates

Combined transmission electron microscopy and x-ray study of the microstructure and texture in sputtered Mo films

Femtosecond pulsed laser direct write production of nano- and microfluidic channels

Low-temperature homoepitaxial growth on nonplanar Si substrates

Pulsed laser ignition of reactive multilayer films

Mechanical properties of tough multiscalar microlaminates

Surface and grain boundary segregation in relation to intergranular fracture: boron and sulfur in Ni3Al

Stress anisotropy and stress gradient in magnetron sputtered filmswith different deposition geometries

Deposition Kinetics and Microstructural Evolution in Sputtered TA Films: a Real-Time/In-Situ Study

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