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VAMAS Interlaboratory Study for Desorption Electrospray Ionization Mass Spectrometry (DESI MS) Intensity Repeatability and Constancy

Analytical chemistry (Washington), 2014-10, Vol.86 (19), p.9603-9611

2014

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Penetrating cardiac trauma caused by a nail-gun: A case report and narrative review

Trauma case reports, 2022-06, Vol.39, p.100649, Article 100649

2022

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Traumatic tricuspid valve regurgitation: A two case series

Trauma case reports, 2022-02, Vol.37, p.100593, Article 100593

2022

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Ultrathin SiO2 on Si II. Issues in quantification of the oxide thickness

Surface and interface analysis, 2002-08, Vol.33 (8), p.640-652

2002

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Attenuation lengths in organic materials

Surface and interface analysis, 2011-03, Vol.43 (3), p.744-751

2011

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Electron Flood Gun Damage Effects in 3D Secondary Ion Mass Spectrometry Imaging of Organics

Journal of the American Society for Mass Spectrometry, 2014-09, Vol.25 (9), p.1565-1571

2014

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Improved methods and uncertainty analysis in the calibration of the spring constant of an atomic force microscope cantilever using static experimental methods

Measurement science & technology, 2009-12, Vol.20 (12), p.125501-125501 (11)

2009

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Modelling of surface nanoparticle inclusions for nanomechanical measurements by an AFM or nanoindenter: spatial issues

Nanotechnology, 2012-04, Vol.23 (16), p.165704-1-7

2012

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VAMAS interlaboratory study on organic depth profiling

Surface and interface analysis, 2011-09, Vol.43 (9), p.1240-1250

2011

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Summary of ISO/TC 201 Standard: ISO 18115-1:2010 - surface chemical analysis - vocabulary - general terms and terms used in spectroscopy

Surface and interface analysis, 2012-05, Vol.44 (5), p.618-620

Seah, M P

2012

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Ultrathin SiO2 on Si IV. Intensity measurement in XPS and deduced thickness linearity

Surface and interface analysis, 2003-06, Vol.35 (6), p.515-524

2003

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Cluster Primary Ion Sputtering: Secondary Ion Intensities in Static SIMS of Organic Materials

Journal of physical chemistry. C, 2010-04, Vol.114 (12), p.5351-5359

2010

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Analysis of cluster ion sputtering yields: correlation with the thermal spike model and implications for static secondary ion mass spectrometry

Surface and interface analysis, 2007-07, Vol.39 (7), p.634-643

Seah, M. P.

2007

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Mass Spectrometry and Informatics: Distribution of Molecules in the PubChem Database and General Requirements for Mass Accuracy in Surface Analysis

Analytical chemistry (Washington), 2011-05, Vol.83 (9), p.3239-3243

2011

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Ultrathin SiO2 on Si. VI. Evaluation of uncertainties in thickness measurement using XPS

Surface and interface analysis, 2005-03, Vol.37 (3), p.300-309

Seah, M. P.

2005

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Simplified drift characterization in scanning probe microscopes using a simple two-point method

Measurement science & technology, 2009-09, Vol.20 (9), p.095103-095103 (8)

2009

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Developing Repeatable Measurements for Reliable Analysis of Molecules at Surfaces Using Desorption Electrospray Ionization

Analytical chemistry (Washington), 2009-03, Vol.81 (6), p.2286-2293

2009

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An accurate semi-empirical equation for sputtering yields I: for argon ions

Surface and interface analysis, 2005-05, Vol.37 (5), p.444-458

2005

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TOF-SIMS: Accurate Mass Scale Calibration

Journal of the American Society for Mass Spectrometry, 2006-04, Vol.17 (4), p.514-523

2006

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Cluster ion sputtering: molecular ion yield relationships for different cluster primary ions in static SIMS of organic materials

Surface and interface analysis, 2007-11, Vol.39 (11), p.890-897

Seah, M. P.

2007

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Accurate Thickness Measurements in Thin Films with Surface Analysis

Journal of surface analysis, 2022, Vol.28 (3), p.S22-S29

Seah, M. P.

2022

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AUGER ELECTRON SPECTROMETRY DATA BANK

Journal of surface analysis, 2022, Vol.28 (3), p.S47-S48

Seah, M. P.

2022

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CALIBRATION OF ELECTRON SPECTROMETER ENERGY SCALES FOR AES AND XPS

Journal of surface analysis, 2022, Vol.28 (3), p.S30-S32

Seah, M. P.

2022

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Recent Advances to Establish XPS as an Accurate Metrology Tool

Journal of surface analysis, 2022, Vol.28 (3), p.S16-S21

Seah, M. P.

2022

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ON DOCUMENTATION

Journal of surface analysis, 2022, Vol.28 (3), p.S3

Seah, M. P.

2022

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VAMAS Interlaboratory Study for Desorption Electrospray Ionization Mass Spectrometry (DESI MS) Intensity Repeatability and Constancy

Penetrating cardiac trauma caused by a nail-gun: A case report and narrative review

Traumatic tricuspid valve regurgitation: A two case series

Ultrathin SiO2 on Si II. Issues in quantification of the oxide thickness

Attenuation lengths in organic materials

Electron Flood Gun Damage Effects in 3D Secondary Ion Mass Spectrometry Imaging of Organics

Improved methods and uncertainty analysis in the calibration of the spring constant of an atomic force microscope cantilever using static experimental methods

Modelling of surface nanoparticle inclusions for nanomechanical measurements by an AFM or nanoindenter: spatial issues

VAMAS interlaboratory study on organic depth profiling

Summary of ISO/TC 201 Standard: ISO 18115-1:2010 - surface chemical analysis - vocabulary - general terms and terms used in spectroscopy

Ultrathin SiO2 on Si IV. Intensity measurement in XPS and deduced thickness linearity

Cluster Primary Ion Sputtering: Secondary Ion Intensities in Static SIMS of Organic Materials

Analysis of cluster ion sputtering yields: correlation with the thermal spike model and implications for static secondary ion mass spectrometry

Mass Spectrometry and Informatics: Distribution of Molecules in the PubChem Database and General Requirements for Mass Accuracy in Surface Analysis

Ultrathin SiO2 on Si. VI. Evaluation of uncertainties in thickness measurement using XPS

Simplified drift characterization in scanning probe microscopes using a simple two-point method

Developing Repeatable Measurements for Reliable Analysis of Molecules at Surfaces Using Desorption Electrospray Ionization

An accurate semi-empirical equation for sputtering yields I: for argon ions

TOF-SIMS: Accurate Mass Scale Calibration

Cluster ion sputtering: molecular ion yield relationships for different cluster primary ions in static SIMS of organic materials

Accurate Thickness Measurements in Thin Films with Surface Analysis

AUGER ELECTRON SPECTROMETRY DATA BANK

CALIBRATION OF ELECTRON SPECTROMETER ENERGY SCALES FOR AES AND XPS

Recent Advances to Establish XPS as an Accurate Metrology Tool

ON DOCUMENTATION

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