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Scaling of high-kappa/metal-gate TriGate SOI nanowire transistors down to 10 nm width

Solid-state electronics, 2013-10, Vol.88, p.32-36

2013

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Mother-to-Child Transmission of HIV-2 Infection from 1986 to 2007 in the ANRS French Perinatal Cohort EPF-CO1

Clinical infectious diseases, 2010-10, Vol.51 (7), p.833-843

2010

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Modeling of the programming window distribution in multinanocrystals memories

IEEE transactions on nanotechnology, 2003-12, Vol.2 (4), p.277-284

2003

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Performance of Localized-SOI MOS Devices on (110) Substrates: Impact of Channel Direction

IEEE electron device letters, 2011-08, Vol.32 (8), p.996-998

2011

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Incidence of cancer in children perinatally exposed to nucleoside reverse transcriptase inhibitors

AIDS (London), 2008-10, Vol.22 (16), p.2165-2177

2008

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The importance of the spacer region to explain short channels mobility collapse in 28nm Bulk and FDSOI technologies

2014 44th European Solid State Device Research Conference (ESSDERC), 2014, p.254-257

2014

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High performance low temperature activated devices and optimization guidelines for 3D VLSI integration of FD, TriGate, FinFET on insulator

2015 Symposium on VLSI Technology (VLSI Technology), 2015, p.T50-T51

2015

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Impact of a HTO/Al2O3 bi-layer blocking oxide in nitride-trap non-volatile memories

Solid-state electronics, 2009-07, Vol.53 (7), p.786-791

2009

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Tuning the dipole at the High-κ/SiO2 interface in advanced metal gate stacks

Microelectronic engineering, 2009-07, Vol.86 (7-9), p.1740-1742

2009

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Physical understanding of low frequency degradation of NMOS TDDB in High-k metal gate stack-based technology. Implication on lifetime assessment

2015 IEEE International Reliability Physics Symposium, 2015, p.5A.5.1-5A.5.5

2015

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Scaling of Ω-gate SOI nanowire N- and P-FET down to 10nm gate length: Size- and orientation-dependent strain effects

2013 Symposium on VLSI Technology, 2013, p.T230-T231

2013

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Modified space-charge limited conduction in tantalum pentoxide MIM capacitors

Microelectronic engineering, 2007-09, Vol.84 (9), p.2310-2313

2007

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Scaling of high-Io/metal-gate TriGate SOI nanowire transistors down to 10 nm width

Solid-state electronics, 2013-10, Vol.88, p.32-36

2013

Volltextzugriff (PDF)

Scaling of high-κ/metal-gate TriGate SOI nanowire transistors down to 10nm width

Solid-state electronics, 2013-10, Vol.88, p.32-36

2013

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Evaluation of HfAlO high- k materials for control dielectric applications in non-volatile memories

Microelectronic engineering, 2008-12, Vol.85 (12), p.2393-2399

2008

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Performance and Modeling of Si-Nanocrystal Double-Layer Memory Devices With High- [Formula Omitted] Control Dielectrics

IEEE transactions on electron devices, 2012-04, Vol.59 (4), p.933

2012

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Previous antiretroviral therapy for prevention of mother-to-child transmission of HIV does not hamper the initial response to PI-based multitherapy during subsequent pregnancy

Journal of acquired immune deficiency syndromes (1999), 2011-06, Vol.57 (2), p.126

2011

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Analysis of the SET and RESET states drift of phase-change memories by low frequency noise measurements

2015 IEEE International Reliability Physics Symposium, 2015, p.MY.1.1-MY.1.5

2015

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Scaling of high-κ/metal-gate TriGate SOI nanowire transistors down to 10 nm width: Selected extended papers from ULIS 2012 conference

Solid-state electronics, 2013, Vol.88, p.32-36

2013

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Tuning the dipole at the High-[kappa]/SiO@@d2@ interface in advanced metal gate stacks

Microelectronic engineering, 2009-09, Vol.86 (7-9), p.1740-1742

2009

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A new gate pattern measurement for evaluating the BTI degradation in circuit conditions

2014 IEEE International Reliability Physics Symposium, 2014, p.5D.1.1-5D.1.5

2014

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Measurement of Dipoles/Roll-Off /Work functions by coupling CV and IPE and study of their dependence on fabrication process

IEEE transactions on electron devices, 2010, Vol.57, p.1819-1819

2010

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Impact of Oxygen Vacancies Profile and Fringe Effect on Leakage Current Instability of Tantalum Pentoxide Metal-Insulator-Metal (MIM) Capacitors

2008 IEEE International Integrated Reliability Workshop Final Report, 2008, p.21-24

2008

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Tuning the dipole at the High-κ/SiO 2 interface in advanced metal gate stacks

Microelectronic engineering, 2009, Vol.86 (7), p.1740-1742

2009

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Tuning the dipole at the High-/SiO2 interface in advanced metal gate stacks

Microelectronic engineering, 2009, Vol.86, p.1740-1742

2009

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Scaling of high-kappa/metal-gate TriGate SOI nanowire transistors down to 10 nm width

Mother-to-Child Transmission of HIV-2 Infection from 1986 to 2007 in the ANRS French Perinatal Cohort EPF-CO1

Modeling of the programming window distribution in multinanocrystals memories

Performance of Localized-SOI MOS Devices on (110) Substrates: Impact of Channel Direction

Incidence of cancer in children perinatally exposed to nucleoside reverse transcriptase inhibitors

The importance of the spacer region to explain short channels mobility collapse in 28nm Bulk and FDSOI technologies

High performance low temperature activated devices and optimization guidelines for 3D VLSI integration of FD, TriGate, FinFET on insulator

Impact of a HTO/Al2O3 bi-layer blocking oxide in nitride-trap non-volatile memories

Tuning the dipole at the High-κ/SiO2 interface in advanced metal gate stacks

Physical understanding of low frequency degradation of NMOS TDDB in High-k metal gate stack-based technology. Implication on lifetime assessment

Scaling of Ω-gate SOI nanowire N- and P-FET down to 10nm gate length: Size- and orientation-dependent strain effects

Modified space-charge limited conduction in tantalum pentoxide MIM capacitors

Scaling of high-Io/metal-gate TriGate SOI nanowire transistors down to 10 nm width

Scaling of high-κ/metal-gate TriGate SOI nanowire transistors down to 10nm width

Evaluation of HfAlO high- k materials for control dielectric applications in non-volatile memories

Performance and Modeling of Si-Nanocrystal Double-Layer Memory Devices With High- [Formula Omitted] Control Dielectrics

Previous antiretroviral therapy for prevention of mother-to-child transmission of HIV does not hamper the initial response to PI-based multitherapy during subsequent pregnancy

Analysis of the SET and RESET states drift of phase-change memories by low frequency noise measurements

Scaling of high-κ/metal-gate TriGate SOI nanowire transistors down to 10 nm width: Selected extended papers from ULIS 2012 conference

Tuning the dipole at the High-[kappa]/SiO@@d2@ interface in advanced metal gate stacks

A new gate pattern measurement for evaluating the BTI degradation in circuit conditions

Measurement of Dipoles/Roll-Off /Work functions by coupling CV and IPE and study of their dependence on fabrication process

Impact of Oxygen Vacancies Profile and Fringe Effect on Leakage Current Instability of Tantalum Pentoxide Metal-Insulator-Metal (MIM) Capacitors

Tuning the dipole at the High-κ/SiO 2 interface in advanced metal gate stacks

Tuning the dipole at the High-/SiO2 interface in advanced metal gate stacks

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