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Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...Microelectronics and reliability, 2010-09, Vol.50 (9), p.1720-1724
2010
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Microelectronics and reliability, 2020-11, Vol.114, p.113737, Article 113737
2020
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2019
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IEEE transactions on nuclear science, 2015-02, Vol.62 (1), p.202-209, Article 202
2015
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Journal of instrumentation, 2012-03, Vol.7 (3), p.1-15
2012
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2020
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Microelectronics and reliability, 2020-10, Vol.113, p.113937, Article 113937
2020
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Journal of instrumentation, 2011-06, Vol.6 (6), p.P06005-17
2011
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2020
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Microelectronics and reliability, 2015-08, Vol.55 (9-10), p.2036-2040
2015
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Microelectronics and reliability, 2020-11, Vol.114, p.113789, Article 113789
2020
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2018
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Microelectronics and reliability, 2016-03, Vol.58, p.126-132
2016
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Microelectronics and reliability, 2007-04, Vol.47 (4), p.682-685
2007
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Physical review. D, 2023-06, Vol.107 (11), Article 112012
- Abed Abud, A.
- Abi, B.
- Acciarri, R.
- Acero, M. A.
- Adames, M. R.
- Adamov, G.
- Adamowski, M.
- Adams, D.
- Adinolfi, M.
- Adriano, C.
- Aduszkiewicz, A.
- Aguilar, J.
- Ahmad, Z.
- Ahmed, J.
- Aimard, B.
- Akbar, F.
- Allison, K.
- Alonso Monsalve, S.
- Alrashed, M.
- Alton, A.
- Alvarez, R.
- Amedo, P.
- Anderson, J.
- Andrade, D. A.
- Andreopoulos, C.
- Andreotti, M.
- Andrews, M. P.
- Andrianala, F.
- Andringa, S.
- Anfimov, N.
- Anicézio Campanelli, W. L.
- Ankowski, A.
- Antoniassi, M.
- Antonova, M.
- Antoshkin, A.
- Aranda-Fernandez, A.
- Arellano, L.
- Arnold, L. O.
- Arroyave, M. A.
- Asaadi, J.
- Ashkenazi, A.
- Asquith, L.
- Atkin, E.
- Auguste, D.
- Aurisano, A.
- Aushev, V.
- Autiero, D.
- Ayala-Torres, M.
- Azfar, F.
- Back, A.
- Back, H.
- Back, J. J.
- Bagaturia, I.
- Bagby, L.
- Balashov, N.
- Balasubramanian, S.
- Baldi, P.
- Baldini, W.
- Baller, B.
- Bambah, B.
- Banerjee, R.
- Barao, F.
- Barenboim, G.
- Barham Alzás, P.
- Barker, G. J.
- Barkhouse, W.
- Barnes, C.
- Barr, G.
- Barranco Monarca, J.
- Barros, A.
- Barros, N.
- Barrow, J. L.
- Basharina-Freshville, A.
- Bashyal, A.
- Basque, V.
- Batchelor, C.
- Battat, J. B. R.
- Battisti, F.
- Bay, F.
- Bazetto, M. C. Q.
- Bazo Alba, J. L. L.
- Beacom, J. F.
- Bechetoille, E.
- Behera, B.
- Belchior, E.
- Bell, G.
- Bellantoni, L.
- Bellettini, G.
- Bellini, V.
- Beltramello, O.
- Benekos, N.
- Benitez Montiel, C.
- Benjamin, D.
- Bento Neves, F.
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- Berkman, S.
- Bernardini, P.
- Berner, R. M.
- Bersani, A.
- Bertolucci, S.
2023
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The European physical journal. C, Particles and fields, 2022-07, Vol.82 (7), p.618-29, Article 618
- Alion, T.
- Andrews, M.
- Antoniassi, M.
- Antoshkin, A.
- Back, A.
- Barenboim, G.
- Bechetoille, E.
- Bhattacharjee, M.
- Bitadze, A.
- Bolton, T.
- Calvo, E.
- Carroll, T.
- Cattadori, C.
- Cavallaro, G.
- Chi, C.
- Church, E.
- Conley, R.
- Densham, C.
- Douglas, D.
- Fowler, J.
- Furic, I. K.
- Galymov, V.
- Fajardo, L. S. Gomez
- Goodman, M. C.
- Guerard, E.
- Guglielmi, A.
- Gwon, S.
- Herner, K.
- Hoff, J.
- Itay, R.
- Jena, D.
- Karagiorgi, G.
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- Kelly, K. J.
- Kothekar, K.
- Kumar, J.
- Kumar, P.
- Larkin, J.
- Lee, S. Y.
- Leitner, M.
- Lokajicek, M.
- Manenti, L.
- Marchionni, A.
- Marshak, M.
- Martynenko, S.
- Matthews, J.
- Mawby, I.
- Mendez, H.
- Mewes, M.
- Mikola, V.
- Mokhov, N.
- Montanari, D.
- Motuk, E.
- Mufson, S.
- Naples, D.
- Norrick, A.
- Northrop, R.
- Paramesvaran, S.
- Parsa, Z.
- Patton, S. J.
- Penzo, A.
- Petta, C.
- Radeka, V.
- Rademacker, J.
- Razakamiandra, R. F.
- Rea, E. M.
- Rebel, B.
- Renshaw, A.
- Rescia, S.
- Rigaut, Y.
- Bonilla, E. Rodriguez
- Scarff, A.
- Schefke, T.
- Selyunin, A.
- Shooltz, D.
- Singh, L.
- Sipos, R.
- Sirri, G.
- Smith, E.
- Snowden-Ifft, D.
- Solomey, N.
- Spanu, M.
- Stancari, M.
- Stokes, T.
- Tayloe, R.
- Terao, K.
- Ternes, C. A.
- Terranova, F.
- Uchida, M. A.
- Usher, T.
- Vagins, M. R.
- Watson, A.
- Whittington, D.
- Wilking, M. J.
- Wu, W.
- Yu, H.
- Zani, A.
- Zhao, M.
- Zwaska, R.
2022
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The European physical journal. C, Particles and fields, 2023-07, Vol.83 (7), p.618-25, Article 618
- Monsalve, S. Alonso
- Andreotti, M.
- Arnold, L. O.
- Aurisano, A.
- Autiero, D.
- Azfar, F.
- Bellantoni, L.
- Bhattacharjee, M.
- Bitadze, A.
- Bolton, T.
- Bonini, F.
- Branca, A.
- Calvez, S.
- Castromonte, C.
- Church, E.
- Dalager, O.
- Delbart, A.
- Dennis, S.
- Dias, M.
- Díaz, F.
- Di Giulio, L.
- Donon, Y.
- Edmunds, D.
- Fiorini, M.
- Gilligan, S.
- Gonzalez-Lopez, M.
- Gran, R.
- Green, S.
- Groh, M.
- Grudzinski, J.
- Gu, W.
- Guzowski, P.
- Haenni, R.
- Hazen, E.
- Herner, K.
- Itay, R.
- Jiang, J.
- Karaman, G.
- Keener, P.
- Ketchum, W.
- Kettell, S. H.
- Khotjantsev, A.
- Kostelecky, V.
- Kroupova, T.
- Kudenko, Y.
- Kuruppu, C.
- Liao, H.
- Mandujano, R. C.
- Manrique Plata, M.
- Marchionni, A.
- Mastbaum, A.
- Méndez, D. P.
- Meyer, H.
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- Miller, W.
- Mooney, M.
- Mouster, G.
- Mulhearn, M.
- Nebot-Guinot, M.
- Nessi, M.
- Newcomer, M.
- Norrick, A.
- Panduro Vazquez, W.
- Petta, C.
- Plows, K.
- Plunkett, R.
- Potekhin, M.
- Raaf, J.
- Rafique, A.
- Rigamonti, A.
- Rivera, D.
- Savage, G.
- Scholberg, K.
- Selyunin, A.
- Sheshukov, A.
- Singh, J.
- Smith, E.
- Snowden-Ifft, D.
- Solomey, N.
- Stancari, M.
- Steiner, H.
- Stokes, T.
- Suter, L.
- Tayloe, R.
- Terao, K.
- Ternes, C. A.
- Tomassetti, L.
- Tonazzo, A.
- Vrba, T.
- Watson, A.
- Worcester, M.
- Wu, W.
- Yoon, Y.
- Yu, H.
- Yu, J.
- Yu, Y.
- Yuan, W.
- Zeller, G.
- Zhang, S.
- Zhang, Y.
2023
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Microelectronics and reliability, 2005-09, Vol.45 (9), p.1605-1610
2005
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Microelectronics and reliability, 2016-09, Vol.64, p.507-512
2016
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Microelectronics and reliability, 2017-09, Vol.76-77, p.277-281
2017
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The European physical journal. C, Particles and fields, 2022-10, Vol.82 (10), p.1-19, Article 903
- Alion, T.
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- Antoniassi, M.
- Barranco Monarca, J.
- Bechetoille, E.
- Bhattacharjee, M.
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- Bolton, T.
- Calvo, E.
- Carroll, T.
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- Cavallaro, G.
- Chi, C.
- Church, E.
- Conley, R.
- De, S.
- Densham, C.
- Douglas, D.
- Edmunds, D.
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- Furic, I. K.
- Galymov, V.
- Goodman, M. C.
- Grant, C.
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- Guglielmi, A.
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- Herner, K.
- Hoff, J.
- Itay, R.
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- Karaman, G.
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- Kothekar, K.
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- Kumar, P.
- Kutter, T.
- Larkin, J.
- Leigui de Oliveira, M.
- Leitner, M.
- Lokajicek, M.
- Luk, K.
- Manenti, L.
- Marchionni, A.
- Marshak, M.
- Martynenko, S.
- Matthews, J.
- Mawby, I.
- Mendez, H.
- Mewes, M.
- Mikola, V.
- Mokhov, N.
- Montanari, D.
- Motuk, E.
- Mufson, S.
- Naples, D.
- Nicolas-Arnaldos, F.
- Norrick, A.
- Northrop, R.
- Paramesvaran, S.
- Parsa, Z.
- Patton, S.
- Penzo, A.
- Petta, C.
- Radeka, V.
- Rademacker, J.
- Rea, E.
- Rebel, B.
- Renshaw, A.
- Rescia, S.
- Rubbia, C.
- Scarff, A.
- Schefke, T.
- Schukraft, A.
- Shooltz, D.
- Singh, L.
- Singh, V.
- Sipos, R.
- Sirri, G.
- Smith, E.
- Snowden-Ifft, D.
- Solomey, N.
- Spanu, M.
- Stancari, M.
- Strigari, L.
- Sutera, C.
- Tenti, M.
- Thea, A.
- Thompson, J. L.
- Urheim, J.
- Vasina, S.
- Vicenzi, M.
- Watson, A.
- Worcester, M.
- Wu, W.
- Yershov, N.
- Yu, B.
- Zwaska, R.
2022
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Microelectronics and reliability, 2017-09, Vol.76-77, p.277-281
2017
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The European physical journal. C, Particles and fields, 2021-11, Vol.81 (11), p.1-15, Article 1011
- Andreotti, M.
- Bernardini, P.
- Bersani, A.
- Bertolucci, S.
- Biagi, S.
- Branca, A.
- Brizzolari, C.
- Brunetti, G.
- Cagnoli, I.
- Calabrese, R.
- Caminata, A.
- Campani, A.
- Carniti, P.
- Cataldo, R.
- Cattadori, C.
- Cherubini, S.
- Cicero, V.
- Citterio, M.
- Copello, S.
- Cova, P.
- Cristaldo Morales, E.
- Davini, S.
- Delmonte, N.
- De Matteis, G.
- Domizio, S. Di
- Noto, L. Di
- Distefano, C.
- Giammaria, T.
- Guarise, M.
- Falcone, A.
- Ferraro, F.
- Fiorini, M.
- Gallice, N.
- Gotti, C.
- Guerzoni, M.
- Iliescu, M. A.
- Ingratta, G.
- Lazzaroni, M.
- Lax, I.
- Laurenti, G.
- Leaci, A.
- Luppi, E.
- Martina, L.
- Mauri, N.
- Minotti, A.
- Moggi, N.
- Montagna, E.
- Montanari, A.
- Montanino, D.
- Pallavicini, M.
- Panareo, M.
- Parozzi, E. G.
- Pasqualini, L.
- Patrizii, L.
- Pessina, G.
- Poppi, F.
- Pozzato, M.
- Pia, V.
- Riboldi, S.
- Riccobene, G.
- Sala, P.
- Sapienza, P.
- Schifano, F.
- Sirri, G.
- Spanu, M.
- Stanco, L.
- Surdo, A.
- Taibi, A.
- Tenti, M.
- Terranova, F.
- Testera, G.
- Tomassetti, L.
- Torti, M.
- Tosi, N.
- Travaglini, R.
- Uboldi, L.
- Vicenzi, M.
- Zani, A.
- Zucchelli, S.
2021
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Microelectronics and reliability, 2004-09, Vol.44 (9), p.1381-1385
2004
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