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Human papilloma virus genotyping by surface-enhanced Raman scattering

Analytical methods, 2014-01, Vol.6 (5), p.1288-1290

2014

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Room-Temperature Fabrication of Anodic Tantalum Pentoxide for Low-Voltage Electrowetting on Dielectric (EWOD)

Journal of microelectromechanical systems, 2008-12, Vol.17 (6), p.1481-1488

2008

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Mucopolysaccharide glands in the isopod crustacean Armadillidium vulgare

Transactions of the American Microscopical Society, 1967-01, Vol.86 (1), p.50

1967

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Evaporated lithium surface coatings in NSTX

Journal of nuclear materials, 2009-06, Vol.390, p.1000-1004

2009

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A dynamical systems analysis of assisted and unassisted anterior and posterior hand-held load carriage

Ergonomics, 2015-03, Vol.58 (3), p.480-491

2015

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On-mask CD and overlay test structures for alternating aperture phase shift lithography

IEEE transactions on semiconductor manufacturing, 2005-05, Vol.18 (2), p.238-245

2005

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Electrical characterization of platinum deposited by focused ion beam

IEEE transactions on semiconductor manufacturing, 2003-05, Vol.16 (2), p.199-206

2003

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Evaluation of sheet resistance and electrical linewidth measurement techniques for copper damascene interconnect

IEEE transactions on semiconductor manufacturing, 2002-05, Vol.15 (2), p.214-222

2002

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EMAP and EMAGE: a framework for understanding spatially organized data

Neuroinformatics (Totowa, N.J.), 2003, Vol.1 (4), p.309-326

2003

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Extraction of Sheet Resistance and Line Width From All-Copper ECD Test Structures Fabricated From Silicon Preforms

IEEE transactions on semiconductor manufacturing, 2008-11, Vol.21 (4), p.495-503

2008

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An illustration of the physical robustness of silica monolithic rod columns

Analytical methods, 2010, Vol.2 (1), p.93-95

2010

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Noncollinear antiferromagnetic structure of the molecule-based magnet Mn[N(CN){sub 2}]{sub 2}

Physical review. B, Condensed matter and materials physics, 2000-09, Vol.62 (9)

2000

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Quad-core radiation-hardened system-on-chip power architecture processor

2015 IEEE Aerospace Conference, 2015, p.1-12

2015

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Educational virtuality: cognitive benefits, design processes and new frontiers

Proceedings of the 30th Australian Conference on Computer-Human Interaction, 2018, p.620-622

2018

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Extraction of Sheet Resistance and Linewidth from All-Copper ECD Test Structures Fabricated from Silicon Preforms

2007 IEEE International Conference on Microelectronic Test Structures, 2007, p.14-19

2007

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Silicon hot-electron bolometers with single-electron transistor readout

Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2006-04, Vol.559 (2), p.591-593

2006

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Understanding the challenges and needs of knee arthroscopy surgeons to inform the design of surgical robots

Proceedings of the 30th Australian Conference on Computer-Human Interaction, 2018, p.458-462

2018

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Array Based Test Structure for Optical-Electrical Overlay Calibration

2007 IEEE International Conference on Microelectronic Test Structures, 2007, p.165-170

2007

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Design and fabrication of a copper test structure for use as an electrical critical dimension reference

2006 IEEE International Conference on Microelectronic Test Structures, 2006, p.124-129

2006

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Design considerations for a Gaudi test structure which can be used to determine the optimum focus

IEEE transactions on semiconductor manufacturing, 1994-08, Vol.7 (3), p.272-278

1994

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Improved structure for optimisation of focus and exposure for IC production

Electronics letters, 1993, Vol.29 (17), p.1573-1574

1993

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Fabrication of 200 nm field effect transistor by X-ray lithography with a laser-plasma X-ray source

Electronics letters, 1995-12, Vol.31 (25), p.2218-2219, Article 2218

1995

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180nm X-ray lithography with a high repetition rate laser-plasma source

Microelectronic engineering, 1995-02, Vol.27 (1), p.295-298

1995

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Reconfigurable MEMS Antennas

2008 NASA/ESA Conference on Adaptive Hardware and Systems, 2008, p.147-154

2008

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Test structures for CD and overlay metrology on alternating aperture phase-shifting masks

Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516), 2004, p.29-34

2004

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Human papilloma virus genotyping by surface-enhanced Raman scattering

Room-Temperature Fabrication of Anodic Tantalum Pentoxide for Low-Voltage Electrowetting on Dielectric (EWOD)

Mucopolysaccharide glands in the isopod crustacean Armadillidium vulgare

Evaporated lithium surface coatings in NSTX

A dynamical systems analysis of assisted and unassisted anterior and posterior hand-held load carriage

On-mask CD and overlay test structures for alternating aperture phase shift lithography

Electrical characterization of platinum deposited by focused ion beam

Evaluation of sheet resistance and electrical linewidth measurement techniques for copper damascene interconnect

EMAP and EMAGE: a framework for understanding spatially organized data

Extraction of Sheet Resistance and Line Width From All-Copper ECD Test Structures Fabricated From Silicon Preforms

An illustration of the physical robustness of silica monolithic rod columns

Noncollinear antiferromagnetic structure of the molecule-based magnet Mn[N(CN){sub 2}]{sub 2}

Quad-core radiation-hardened system-on-chip power architecture processor

Educational virtuality: cognitive benefits, design processes and new frontiers

Extraction of Sheet Resistance and Linewidth from All-Copper ECD Test Structures Fabricated from Silicon Preforms

Silicon hot-electron bolometers with single-electron transistor readout

Understanding the challenges and needs of knee arthroscopy surgeons to inform the design of surgical robots

Array Based Test Structure for Optical-Electrical Overlay Calibration

Design and fabrication of a copper test structure for use as an electrical critical dimension reference

Design considerations for a Gaudi test structure which can be used to determine the optimum focus

Improved structure for optimisation of focus and exposure for IC production

Fabrication of 200 nm field effect transistor by X-ray lithography with a laser-plasma X-ray source

180nm X-ray lithography with a high repetition rate laser-plasma source

Reconfigurable MEMS Antennas

Test structures for CD and overlay metrology on alternating aperture phase-shifting masks

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