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IEEE transactions on very large scale integration (VLSI) systems, 2014-09, Vol.22 (9), p.2004-2016
2014
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2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC), 2013, p.1-9
2013
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2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC), 2015, p.1-6
2015
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Design Automation Conference, 2010, p.865-870
2010
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Design Automation Conference, 2010, p.555-560
2010
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IEEE embedded systems letters, 2011-03, Vol.3 (1), p.42-45
2011
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2021 IEEE/ACM Symposium on Edge Computing (SEC), 2021, p.135-147
2021
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IEEE transactions on very large scale integration (VLSI) systems, 2007-06, Vol.15 (6), p.699-710
2007
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Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe; 16-20 Apr. 2007, 2007, p.33-38
2007
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31st Design Automation Conference, 1994, p.81-86
1994
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Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015, p.748-751
2015
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2013 Asilomar Conference on Signals, Systems and Computers, 2013, p.111-117
2013
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ACM transactions on architecture and code optimization, 2012-03, Vol.9 (1), p.1-30
2012
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IEEE transactions on computer-aided design of integrated circuits and systems, 1993-07, Vol.12 (7), p.1015-1028
1993
- Link zum Volltext
IEEE transactions on computer-aided design of integrated circuits and systems, 1999-06, Vol.18 (6), p.669-684
1999
- Link zum Volltext
ACM transactions on embedded computing systems, 2013-05, Vol.12 (2s), p.1-23
2013
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Journal of Information Science and Engineering, 2000-09, Vol.16 (5), p.673-686
2000
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IEEE transactions on computer-aided design of integrated circuits and systems, 1995-06, Vol.14 (6), p.728-739
1995
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Journal of electronic testing, 2000-10, Vol.16 (5), p.521
2000
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Journal of electronic testing, 1995-08, Vol.7 (1-2), p.105-114
1995
Link zum Volltext
2023 IEEE International Conference on Smart Computing (SMARTCOMP), 2023, p.98-107
2023
Link zum Volltext
Journal of electronic testing, 1995-08, Vol.7 (1-2), p.83-93
1995
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Test-Volume Reduction in Systems-on-a-Chip Using Heterogeneous and Multilevel Compression Techniques
2006
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IEEE transactions on very large scale integration (VLSI) systems, 1996-06, Vol.4 (2), p.254-263
1996
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Proceedings Design, Automation and Test in Europe Conference and Exhibition, 2004, Vol.2, p.1296-1301 Vol.2
2004
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- Ieee Transactions On Computer-Aided Design Of Integrated Circuits And Systems
- Journal Of Electronic Testing
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- Ieee Transactions On Very Large Scale Integration
- Acm Transactions On Architecture And Code Optimization
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