UB Paderborn / Katalog / Suche / in CDI

Sortiert nach

Einfacher Volltextzugriff von (fast) überall

Installieren Sie die LibKey Nomad-Browsererweiterung und erhalten Sie von vielen Webseiten einfachen Zugriff auf lizenzierte Volltexte oder Open Access Publikationen. Mehr erfahren...

A Study of Degradation in High Power Multi-Mode InGaAs-AlGaAs Strained Quantum Well Lasers as Pump Lasers

MRS proceedings, 2009, Vol.1195 (1), p.71-77, Article 1195-B01-06

2009

Volltextzugriff (PDF)

Reliability of High-Temperature Operation for GaN-Based Operational Amplifiers

MRS proceedings, 2010, Vol.1195 (1), p.196-199

2010

Volltextzugriff (PDF)

Reliability and Performance of Pseudomorphic Ultraviolet Light Emitting Diodes on Bulk Aluminum Nitride Substrates

MRS proceedings, 2009, Vol.1195 (1), p.125-130, Article 1195-B03-04

2009

Volltextzugriff (PDF)

The Effect of Passivation SiON layer on the Data Retention Reliability of NAND Flash Memory

MRS proceedings, 2010, Vol.1195 (1), p.182-187

2010

Volltextzugriff (PDF)

Modifications of Defects Concentrations Induced by Ammonia Flow Rate and its Effects on Gallium Nitride Grown by MOCVD

MRS proceedings, 2010, Vol.1195 (1), p.131-136

2010

Volltextzugriff (PDF)

Reliability in Mechatronics Systems from TEM, SEM and SE Material Analysis

MRS proceedings, 2009, Vol.1195 (1), p.188-195, Article 1195-B07-04

2009

Volltextzugriff (PDF)

Catastrophic Optical-damage in High-power, Broad-area Laser-diodes

MRS proceedings, 2009, Vol.1195 (1), p.40-51, Article 1195-B01-01

2009

Volltextzugriff (PDF)

Recombination-enhanced Dislocation Glides—The Current Status of Knowledge

MRS proceedings, 2009, Vol.1195 (1), p.78-89, Article 1195-B02-01

Maeda, Koji

2009

Volltextzugriff (PDF)

Mechanism of Defect Reactions in Semiconductors

MRS proceedings, 2009, Vol.1195 (1), p.90-101, Article 1195-B02-02

Shinozuka, Yuzo

2009

Volltextzugriff (PDF)

Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs for Fiber Optical Communication

MRS proceedings, 2009, Vol.1195 (1), p.1-12, Article 1195-B01-02

2009

Volltextzugriff (PDF)

Density-Functional Analysis on Vacancy Orbital and its Elastic Response of Silicon

MRS proceedings, 2009, Vol.1195 (1), p.216-221, Article 1195-B08-11

2009

Volltextzugriff (PDF)

Distribution of Hydrogen- and Vacancy-Related Donor and Acceptor States in Helium-Implanted and Plasma-Hydrogenated Float-Zone Silicon

MRS proceedings, 2009, Vol.1195 (1), p.271-276, Article 1195-B11-02

2009

Volltextzugriff (PDF)

GaAs HEMT Reliability and Degradation Mechanisms after Long Term Stress Testing

MRS proceedings, 2009, Vol.1195 (1), p.161-167, Article 1195-B05-04

2009

Volltextzugriff (PDF)

Temperature Dependent Optical Band Gap Measurements of III-V Films by Low Temperature Photoluminescence Spectroscopy

MRS proceedings, 2009, Vol.1195 (1), p.20-24, Article 1195-B08-24

2009

Volltextzugriff (PDF)

Degradation Mechanism of GaN-based LEDs With Different Growth Parameters

MRS proceedings, 2009, Vol.1195 (1), p.210-215, Article 1195-B08-06

2009

Volltextzugriff (PDF)

Large Batch Etching of Gallium Nitride Using Inductively Coupled Plasma Tools as a Production Solution

MRS proceedings, 2009, Vol.1195 (1), p.137-142, Article 1195-B03-06

2009

Volltextzugriff (PDF)

Recombination-enhanced Dislocation Glides—The Current Status of Knowledge

MRS proceedings, 2009, Vol.1195 (1), p.102-113, Article 1195-B02-03

Maeda, Koji

2009

Volltextzugriff (PDF)

Structural Defects in GaN-based Materials and Their Relation to GaN-based Laser Diodes

MRS proceedings, 2009, Vol.1195 (1), p.62-70, Article 1195-B01-05

2009

Volltextzugriff (PDF)

Low Temperature Copper Deposition by PE-ALD

MRS proceedings, 2009, Vol.1195 (1), p.283-288, Article 1195-B12-05

2009

Volltextzugriff (PDF)

A Comprehensive Approach to HEMT Reliability Testing

MRS proceedings, 2009, Vol.1195 (1), p.13-19, Article 1195-B05-03

2009

Volltextzugriff (PDF)

Sub Surface Material Characterization using High Frequency Eddy Current Spectroscopy

MRS proceedings, 2009, Vol.1195 (1), p.239-244, Article 1195-B09-02

2009

Volltextzugriff (PDF)

Plasma Spray of Nano Composite Ceramics Using Solution Precursors and Combustion Synthesized Nano Powders

MRS proceedings, 2009, Vol.1195 (1), p.277-282, Article 1195-B12-03

2009

Volltextzugriff (PDF)

Dependency of Indium Concentration on Structural Defects in MOVPE-grown InGaN/GaN Heterostructures

MRS proceedings, 2009, Vol.1195 (1), p.233-238, Article 1195-B08-27

2009

Volltextzugriff (PDF)

Pre-applied Inter Chip Fill Material and Process for Advanced 3D Chip Stack

MRS proceedings, 2009, Vol.1195 (1), p.301-306, Article 1195-B13-05

2009

Volltextzugriff (PDF)

A MHz Modulable Si-based LED Afforded by Engineering Light-emitting Defects in Si

MRS proceedings, 2009, Vol.1195 (1), p.120-124, Article 1195-B03-03

2009

Volltextzugriff (PDF)

1 – 25 von 80

Suche als RSS-Feed

Aktive Filter

ThemaScience & Technology

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(31)
Mit Volltextzugriff
(37)

Publikationsform

Sprache

Englisch
(80)

Erscheinungsjahr

n.n

Thema

Physical Sciences
(69)
Technology
(61)
Optics
(49)
Engineering
(48)
Engineering, Electrical & Electronic
(47)
Materials Science
(47)
Materials Science, Multidisciplinary
(47)
Applied And Technical Physics
(42)
Characterization And Evaluation Of Materials
(42)
Inorganic Chemistry
(42)
Materials Engineering
(42)
Nanotechnology
(42)
Physics
(25)
Physics, Multidisciplinary
(10)
Computer Science
(9)
Computer Science, Theory & Methods
(8)
Physics, Applied
(7)
Physics, Atomic, Molecular & Chemical
(6)
Tensors
(6)

14 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

A Study of Degradation in High Power Multi-Mode InGaAs-AlGaAs Strained Quantum Well Lasers as Pump Lasers

Reliability of High-Temperature Operation for GaN-Based Operational Amplifiers

Reliability and Performance of Pseudomorphic Ultraviolet Light Emitting Diodes on Bulk Aluminum Nitride Substrates

The Effect of Passivation SiON layer on the Data Retention Reliability of NAND Flash Memory

Modifications of Defects Concentrations Induced by Ammonia Flow Rate and its Effects on Gallium Nitride Grown by MOCVD

Reliability in Mechatronics Systems from TEM, SEM and SE Material Analysis

Catastrophic Optical-damage in High-power, Broad-area Laser-diodes

Recombination-enhanced Dislocation Glides—The Current Status of Knowledge

Mechanism of Defect Reactions in Semiconductors

Failure Analysis Using Optical Evaluation Technique (OBIC) of LDs for Fiber Optical Communication

Density-Functional Analysis on Vacancy Orbital and its Elastic Response of Silicon

Distribution of Hydrogen- and Vacancy-Related Donor and Acceptor States in Helium-Implanted and Plasma-Hydrogenated Float-Zone Silicon

GaAs HEMT Reliability and Degradation Mechanisms after Long Term Stress Testing

Temperature Dependent Optical Band Gap Measurements of III-V Films by Low Temperature Photoluminescence Spectroscopy

Degradation Mechanism of GaN-based LEDs With Different Growth Parameters

Large Batch Etching of Gallium Nitride Using Inductively Coupled Plasma Tools as a Production Solution

Recombination-enhanced Dislocation Glides—The Current Status of Knowledge

Structural Defects in GaN-based Materials and Their Relation to GaN-based Laser Diodes

Low Temperature Copper Deposition by PE-ALD

A Comprehensive Approach to HEMT Reliability Testing

Sub Surface Material Characterization using High Frequency Eddy Current Spectroscopy

Plasma Spray of Nano Composite Ceramics Using Solution Precursors and Combustion Synthesized Nano Powders

Dependency of Indium Concentration on Structural Defects in MOVPE-grown InGaN/GaN Heterostructures

Pre-applied Inter Chip Fill Material and Process for Advanced 3D Chip Stack

A MHz Modulable Si-based LED Afforded by Engineering Light-emitting Defects in Si

Aktive Filter

Suchergebnisse filtern