UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 94

Sortiert nach

Charge separation behaviors of novel AgI/BiOI heterostructures with enhanced solar-photocatalytic performance

Current Applied Physics, 2017, 17(9), , pp.1202-1207

2017

Volltextzugriff (PDF)

Fabrication of a novel pyramidal 3D MoS2/2D PbTiO3 nanocomposites and the efficient photocatalytic removal of organic pollutants: Effects of the PbTiO3 internal electric field and S-scheme heterojunction formation

Applied surface science, 2023-04, Vol.616, p.156431, Article 156431

2023

Volltextzugriff (PDF)

Research on Performance Metrics and Environmental Conditions for 5G MIMO OTA

Electronics (Basel), 2022-03, Vol.11 (5), p.747

2022

Volltextzugriff (PDF)

Research on Evaluation Index of Automotive Antenna Testing

Electronics (Basel), 2021-02, Vol.10 (4), p.515

2021

Volltextzugriff (PDF)

Repetitive Unclamped-Inductive-Switching-Induced Electrical Parameters Degradations and Simulation Optimizations for 4H-SiC MOSFETs

IEEE transactions on electron devices, 2016-11, Vol.63 (11), p.4331-4338

2016

Volltextzugriff (PDF)

Design and Fabrication of a Monolithic Optoelectronic Integrated Si CMOS LED Based on Hot-Carrier Effect

IEEE journal of selected topics in quantum electronics, 2016-11, Vol.22 (6), p.70-77

2016

Volltextzugriff (PDF)

Effect of Ultrafine Cement (UFC) on the Corrosion Resistance of Cement Soil in Peat Soil Environment

Materials, 2023-08, Vol.16 (16), p.5520

2023

Volltextzugriff (PDF)

Understanding Short-Circuit Failure Mechanism of Double-Trench SiC Power MOSFETs

IEEE transactions on electron devices, 2020-12, Vol.67 (12), p.5593-5599

2020

Volltextzugriff (PDF)

Complete Avalanche Process and Failure Mechanism of Trench-Gate FS-IGBT Under Unclamped Inductive Switching by Using Infrared Visualization Method

IEEE transactions on electron devices, 2020-09, Vol.67 (9), p.1-4

2020

Volltextzugriff (PDF)

Electrical and Small-Signal Characteristics Degradation of RF GaN HEMTs Under Repetitive ESD Stresses

IEEE transactions on electron devices, 2024-08, Vol.71 (8), p.4535-4542

2024

Volltextzugriff (PDF)

High-Voltage a-IGZO TFTs With the Stair Gate-Dielectric Structure

IEEE transactions on electron devices, 2021-09, Vol.68 (9), p.4462-4466

2021

Volltextzugriff (PDF)

In situ self-assembled NiS2 nanoparticles on MXene nanosheets as multifunctional separators: Regulating shuttling effect and boosting redox reaction kinetics of lithium polysulfides

Applied surface science, 2024-02, Vol.645, p.158859, Article 158859

2024

Volltextzugriff (PDF)

Comprehensive Analysis of Electrical Parameters Degradations for SiC Power MOSFETs Under Repetitive Short-Circuit Stress

IEEE transactions on electron devices, 2018-12, Vol.65 (12), p.5440-5447, Article 5440

2018

Volltextzugriff (PDF)

Rapid calculation of atmospheric molecular absorption characteristics in the terahertz band based on wideband K-distribution method

Infrared physics & technology, 2023-11, Vol.134, p.104911, Article 104911

2023

Volltextzugriff (PDF)

Hot-Carrier-Induced Degradations Investigations for 600 V SOI-LIGBT by an Improved Charge Pumping Solution

IEEE transactions on electron devices, 2017-02, Vol.64 (2), p.634-637

2017

Volltextzugriff (PDF)

A Novel Lateral DMOS Transistor With H-Shape Shallow-Trench-Isolation Structure

IEEE transactions on electron devices, 2018-11, Vol.65 (11), p.5218-5221

2018

Volltextzugriff (PDF)

Low-Loss SOI-LIGBT With Triple Deep-Oxide Trenches

IEEE transactions on electron devices, 2017-09, Vol.64 (9), p.3756-3761

2017

Volltextzugriff (PDF)

Hot-Carrier-Induced Degradations and Optimizations for Lateral DMOS Transistor With Multiple Floating Poly-Gate Field Plates

IEEE transactions on electron devices, 2017-08, Vol.64 (8), p.3275-3281

2017

Volltextzugriff (PDF)

New Failure Mechanism Induced by Current Limit for Superjunction MOSFET Under Single-Pulse UIS Stress

IEEE transactions on electron devices, 2021-07, Vol.68 (7), p.3483-3489

2021

Volltextzugriff (PDF)

Single Pulse Unclamped-Inductive-Switching Induced Failure and Analysis for 650 V p-GaN HEMT

IEEE transactions on power electronics, 2020-11, Vol.35 (11), p.11328-11331

2020

Volltextzugriff (PDF)

Comprehensive Investigation on Electrical Properties of Split-Gate Trench Power MOSFETs Under Mechanical Strains

IEEE transactions on electron devices, 2022-03, Vol.69 (3), p.1191-1195

2022

Volltextzugriff (PDF)

Investigation on Self-Adjust Conductivity Modulation SOI-LIGBT Structure (SCM-LIGBT) for Monolithic High-Voltage IC

IEEE transactions on electron devices, 2017-09, Vol.64 (9), p.3762-3767

2017

Volltextzugriff (PDF)

Repetitive ESD-Induced Electrical Degradation and Optimization for High-Voltage SOI-LIGBT as Output Device

IEEE transactions on electron devices, 2023-09, Vol.70 (9), p.4547-4553

2023

Volltextzugriff (PDF)

Synergistic adsorption and photocatalytic degradation of persist synthetic dyes by capsule-like porphyrin-based MOFs

Nanotechnology, 2021-11, Vol.32 (46), p.465705

2021

Volltextzugriff (PDF)

Switch-OFF Avalanche-Breakdown-Induced Electrical Degradations of RF-LDMOS Transistor for SMPAs Applications

IEEE transactions on electron devices, 2018-10, Vol.65 (10), p.4719-4723

2018

Volltextzugriff (PDF)

1 – 25 von 94

Suche als RSS-Feed

Aktive Filter

ThemaPhysics

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(89)
Mit Volltextzugriff
(94)

Publikationsform

Sprache

Erscheinungsjahr

n.n

Thema

Science & Technology
(93)
Physical Sciences
(91)
Technology
(82)
Physics, Applied
(80)
Engineering
(71)
Engineering, Electrical & Electronic
(70)
Logic Gates
(38)
Degradation
(27)
Physics, Condensed Matter
(27)
Stress
(25)
Transistors
(17)
Electric Fields
(14)
Materials Science
(14)
Semiconductor Devices
(14)
Electric Potential
(12)
Hot Carriers
(12)
Silicon
(12)
Materials Science, Multidisciplinary
(11)
Optimization
(11)

14 weitere anzeigen...

Weniger anzeigen...

Neu hinzugefügt

... seit 90 Tagen
(2)

Menü

Weitere Dienste

Einstellungen

Charge separation behaviors of novel AgI/BiOI heterostructures with enhanced solar-photocatalytic performance

Fabrication of a novel pyramidal 3D MoS2/2D PbTiO3 nanocomposites and the efficient photocatalytic removal of organic pollutants: Effects of the PbTiO3 internal electric field and S-scheme heterojunction formation

Research on Performance Metrics and Environmental Conditions for 5G MIMO OTA

Research on Evaluation Index of Automotive Antenna Testing

Repetitive Unclamped-Inductive-Switching-Induced Electrical Parameters Degradations and Simulation Optimizations for 4H-SiC MOSFETs

Design and Fabrication of a Monolithic Optoelectronic Integrated Si CMOS LED Based on Hot-Carrier Effect

Effect of Ultrafine Cement (UFC) on the Corrosion Resistance of Cement Soil in Peat Soil Environment

Understanding Short-Circuit Failure Mechanism of Double-Trench SiC Power MOSFETs

Complete Avalanche Process and Failure Mechanism of Trench-Gate FS-IGBT Under Unclamped Inductive Switching by Using Infrared Visualization Method

Electrical and Small-Signal Characteristics Degradation of RF GaN HEMTs Under Repetitive ESD Stresses

High-Voltage a-IGZO TFTs With the Stair Gate-Dielectric Structure

In situ self-assembled NiS2 nanoparticles on MXene nanosheets as multifunctional separators: Regulating shuttling effect and boosting redox reaction kinetics of lithium polysulfides

Comprehensive Analysis of Electrical Parameters Degradations for SiC Power MOSFETs Under Repetitive Short-Circuit Stress

Rapid calculation of atmospheric molecular absorption characteristics in the terahertz band based on wideband K-distribution method

Hot-Carrier-Induced Degradations Investigations for 600 V SOI-LIGBT by an Improved Charge Pumping Solution

A Novel Lateral DMOS Transistor With H-Shape Shallow-Trench-Isolation Structure

Low-Loss SOI-LIGBT With Triple Deep-Oxide Trenches

Hot-Carrier-Induced Degradations and Optimizations for Lateral DMOS Transistor With Multiple Floating Poly-Gate Field Plates

New Failure Mechanism Induced by Current Limit for Superjunction MOSFET Under Single-Pulse UIS Stress

Single Pulse Unclamped-Inductive-Switching Induced Failure and Analysis for 650 V p-GaN HEMT

Comprehensive Investigation on Electrical Properties of Split-Gate Trench Power MOSFETs Under Mechanical Strains

Investigation on Self-Adjust Conductivity Modulation SOI-LIGBT Structure (SCM-LIGBT) for Monolithic High-Voltage IC

Repetitive ESD-Induced Electrical Degradation and Optimization for High-Voltage SOI-LIGBT as Output Device

Synergistic adsorption and photocatalytic degradation of persist synthetic dyes by capsule-like porphyrin-based MOFs

Switch-OFF Avalanche-Breakdown-Induced Electrical Degradations of RF-LDMOS Transistor for SMPAs Applications

Aktive Filter

Suchergebnisse filtern