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Energy-dependent excitation cross section measurements of the diagnostic lines of Fe XVII

Physical review letters, 2006-06, Vol.96 (25), p.253201-253201, Article 253201

2006

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Observation of a multiply ionized plasma with index of refraction greater than one

Physical review letters, 2005-01, Vol.94 (3), p.035005.1-035005.4, Article 035005

2005

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X-ray-line diagnostic of magnetic field strength for high-temperature plasmas

Physical review letters, 2003-06, Vol.90 (23), p.235003-235003, Article 235003

2003

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Sputtered molybdenum bilayer back contact for copper indium diselenide-based polycrystalline thin-film solar cells

Thin solid films, 1995-05, Vol.260 (1), p.26-31

1995

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Observation of interference between dielectronic recombination and radiative recombination in highly charged uranium ions

Physical review letters, 1995-01, Vol.74 (1), p.54-57

1995

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Reproducible technique for fabrication of thin films of high transition temperature superconductors

Applied physics letters, 1987-11, Vol.51 (21), p.1753-1755

1987

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ac method for measuring low‐frequency resistance fluctuation spectra

Review of scientific instruments, 1987-06, Vol.58 (6), p.985-993

Scofield, John H.

1987

Volltextzugriff (PDF)

Reconciliation of different gate-voltage dependencies of 1/f noise in n-MOS and p-MOS transistors

IEEE transactions on electron devices, 1994-11, Vol.41 (11), p.1946-1952

1994

Volltextzugriff (PDF)

Simulating a Maxwellian plasma using an electron beam ion trap

Review of scientific instruments, 2000-09, Vol.71 (9), p.3362-3372

2000

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Demonstration of a soft X-ray amplifier

Physical review letters, 1985-01, Vol.54 (2), p.110-113

1985

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X-ray attenuation cross sections for energies 100 eV to 100 keV and elements Z = 1 to Z = 92

Atomic data and nuclear data tables, 1988, Vol.38 (1), p.1-196

1988

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Demonstration of X-ray amplifiers near the carbon K edge

Physical review letters, 1990-07, Vol.65 (4), p.420-423

1990

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1/f noise and radiation effects in MOS devices

IEEE transactions on electron devices, 1994-11, Vol.41 (11), p.1953-1964

1994

Volltextzugriff (PDF)

Energies of nickel-like 4d to 4p laser lines

Physica scripta, 1992-10, Vol.46 (4), p.361-364

1992

Volltextzugriff (PDF)

Physical basis for nondestructive tests of MOS radiation hardness

IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), 1991-12, Vol.38 (6), p.1567-1577

1991

Volltextzugriff (PDF)

Demonstration of soft x-ray amplification in nickel-like ions

Physical review letters, 1987-11, Vol.59 (19), p.2157-2160

1987

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Observation of soft x-ray amplification in neonlike molybdenum

Journal of applied physics, 1987-06, Vol.61 (12), p.5243-5248

1987

Volltextzugriff (PDF)

Dielectronic recombination of heliumlike nickel

Physical review letters, 1989-05, Vol.62 (18), p.2104-2107

1989

Volltextzugriff (PDF)

Measurement of electron impact collisional excitation cross sections of Ni to Ga-Like Gold

Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2005-07, Vol.235 (1-4), p.231-234

2005

Volltextzugriff (PDF)

Effects of series resistance and inductance on solar cell admittance measurements

Solar energy materials and solar cells, 1995, Vol.37 (2), p.217-233

Scofield, John H.

1995

Volltextzugriff (PDF)

Atomic physics and ionization balance of high-Z Ions: Critical ingredients for characterizing and understanding high-temperature plasmas

High energy density physics, 2012-09, Vol.8 (3), p.271-283

2012

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Measurement and interpretation of the polarization of the x-ray line emission of heliumlike Fe XXV excited by an electron beam

Physical review. A, Atomic, molecular, and optical physics, 1996-06, Vol.53 (6), p.3974-3981

1996

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Simulations of a Maxwellian Plasma using an Electron Beam Ion Trap

Physica scripta, 1999-01, Vol.1999 (B), p.312

1999

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Evidence that similar point defects cause 1/f noise and radiation-induced-hole trapping in metal-oxide-semiconductor transistors

Physical review letters, 1990-01, Vol.64 (5), p.579-582

1990

Volltextzugriff (PDF)

Measurement of electron impact collisional excitation cross sections of Ni to Ge-like gold

AIP conference proceedings, 2017, Vol.1811 (1)

2017

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Energy-dependent excitation cross section measurements of the diagnostic lines of Fe XVII

Observation of a multiply ionized plasma with index of refraction greater than one

X-ray-line diagnostic of magnetic field strength for high-temperature plasmas

Sputtered molybdenum bilayer back contact for copper indium diselenide-based polycrystalline thin-film solar cells

Observation of interference between dielectronic recombination and radiative recombination in highly charged uranium ions

Reproducible technique for fabrication of thin films of high transition temperature superconductors

ac method for measuring low‐frequency resistance fluctuation spectra

Reconciliation of different gate-voltage dependencies of 1/f noise in n-MOS and p-MOS transistors

Simulating a Maxwellian plasma using an electron beam ion trap

Demonstration of a soft X-ray amplifier

X-ray attenuation cross sections for energies 100 eV to 100 keV and elements Z = 1 to Z = 92

Demonstration of X-ray amplifiers near the carbon K edge

1/f noise and radiation effects in MOS devices

Energies of nickel-like 4d to 4p laser lines

Physical basis for nondestructive tests of MOS radiation hardness

Demonstration of soft x-ray amplification in nickel-like ions

Observation of soft x-ray amplification in neonlike molybdenum

Dielectronic recombination of heliumlike nickel

Measurement of electron impact collisional excitation cross sections of Ni to Ga-Like Gold

Effects of series resistance and inductance on solar cell admittance measurements

Atomic physics and ionization balance of high-Z Ions: Critical ingredients for characterizing and understanding high-temperature plasmas

Measurement and interpretation of the polarization of the x-ray line emission of heliumlike Fe XXV excited by an electron beam

Simulations of a Maxwellian Plasma using an Electron Beam Ion Trap

Evidence that similar point defects cause 1/f noise and radiation-induced-hole trapping in metal-oxide-semiconductor transistors

Measurement of electron impact collisional excitation cross sections of Ni to Ge-like gold

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