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The measurement of responsivity of infrared photodetectors using a cavity blackbody

Journal of semiconductors, 2023-10, Vol.44 (10), p.102301-63

2023

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Impurity band conduction in Mn-doped p type InAs single crystal

Materials science in semiconductor processing, 2018-09, Vol.84, p.115-118

2018

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Evaluation of four inch diameter VGF-Ge substrates used for manufacturing multi-junction solar cell

Journal of semiconductors, 2016-06, Vol.37 (6), p.21-26

曹可慰刘彤刘京明谢辉陶东言赵有文董志远惠峰

2016

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Performance improvement of c-Si solar cell by a combination of SiNx/SiOx passivation and double P-diffusion gettering treatment

半导体学报：英文版, 2017-11, Vol.38 (11), p.60-65

2017

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Carbon agent chemical vapor transport growth of Ga2O3 crystal

半导体学报：英文版, 2016-10 (10), p.47-51

苏杰刘彤刘京明杨俊沈桂英白永彪董志远赵有文

2016

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Impurities related micro-defects in GaSb crystal grown by LEC method

Journal of crystal growth, 2024-03, Vol.630, p.127585, Article 127585

2024

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Investigation of Comet-Shaped Defects in an EPI-InP Layer Grown on S-Doped and Fe-Doped InP Substrates

Journal of electronic materials, 2023-08, Vol.52 (8), p.5047-5052

2023

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Oxidation related particles on GaSb (100) substrate surfaces

Journal of crystal growth, 2022-03, Vol.581, p.126499, Article 126499

2022

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Evaluation of polishing induced subsurface damage in InAs substrates by an acid solution etching method

Materials science in semiconductor processing, 2023-11, Vol.167, p.107770, Article 107770

2023

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Wet etching generation of dislocation pits with clear facets in LEC-InAs single crystals

Journal of crystal growth, 2019-11, Vol.526, p.125237, Article 125237

2019

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HCl-H2SO4-H2O solution etching behavior of InAs (100) surface

Journal of crystal growth, 2020-10, Vol.547, p.125800, Article 125800

2020

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Evaluation of residual stress in InP and InAs (100) substrates obtained from single crystals grown by LEC and VGF methods

Materials science in semiconductor processing, 2021-01, Vol.121, p.105460, Article 105460

2021

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A Comparison of Defects Between InAs Single Crystals Grown by LEC and VGF Methods

Journal of electronic materials, 2020-09, Vol.49 (9), p.5104-5109

2020

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Residual stress distribution and flatness of dislocation-free Te-GaSb (100) substrate

Japanese Journal of Applied Physics, 2021-03, Vol.60 (3), p.35510

2021

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LVM Spectroscopy Investigation of Complex Defects in InAs Single Crystals Grown by the LEC Method

Journal of electronic materials, 2018-09, Vol.47 (9), p.4998-5001

2018

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Mechanism of free electron concentration saturation phenomenon in Te-GaSb single crystal

Chinese physics B, 2019-05, Vol.28 (5), p.57102

2019

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Photoluminescene study acceptor defects in lightly doped n type GaSb single crystals

Journal of semiconductors, 2019-04, Vol.40 (4), p.42101

2019

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Improved surface and electrical properties of passivated GaSb with less alkaline sulfide solution

Materials science in semiconductor processing, 2015-12, Vol.40, p.685-689

2015

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Vibration damage mechanism analysis on rotor of diesel generating set with rigid coupling

Journal of physics. Conference series, 2015-07, Vol.628 (1), p.12071

2015

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Electrical and optical property of annealed Te-doped GaSb

Journal of semiconductors, 2017-04, Vol.38 (4), p.43001

2017

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Improvement of the surface quality of semi-insulating InP substrates through a novel etching and cleaning method

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 2013-05, Vol.31 (3)

2013

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Spatial and temporal variations of forest LAI in China during 2000-2010

Chinese science bulletin, 2012-08, Vol.57 (22), p.2846-2856

2012

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Dual Function of the Third Component in Ternary Organic Solar Cells: Broaden the Spectrum and Optimize the Morphology

Small (Weinheim an der Bergstrasse, Germany), 2024-06, Vol.20 (24), p.e2308863-n/a

2024

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High‐Performance Fluorinated Fused‐Ring Electron Acceptor with 3D Stacking and Exciton/Charge Transport

Advanced materials (Weinheim), 2020-05, Vol.32 (21), p.e2000645-n/a

2020

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LF-YOLO: A Lighter and Faster YOLO for Weld Defect Detection of X-ray Image

IEEE sensors journal, 2023-04, Vol.23 (7), p.1-1

2023

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The measurement of responsivity of infrared photodetectors using a cavity blackbody

Impurity band conduction in Mn-doped p type InAs single crystal

Evaluation of four inch diameter VGF-Ge substrates used for manufacturing multi-junction solar cell

Performance improvement of c-Si solar cell by a combination of SiNx/SiOx passivation and double P-diffusion gettering treatment

Carbon agent chemical vapor transport growth of Ga2O3 crystal

Impurities related micro-defects in GaSb crystal grown by LEC method

Investigation of Comet-Shaped Defects in an EPI-InP Layer Grown on S-Doped and Fe-Doped InP Substrates

Oxidation related particles on GaSb (100) substrate surfaces

Evaluation of polishing induced subsurface damage in InAs substrates by an acid solution etching method

Wet etching generation of dislocation pits with clear facets in LEC-InAs single crystals

HCl-H2SO4-H2O solution etching behavior of InAs (100) surface

Evaluation of residual stress in InP and InAs (100) substrates obtained from single crystals grown by LEC and VGF methods

A Comparison of Defects Between InAs Single Crystals Grown by LEC and VGF Methods

Residual stress distribution and flatness of dislocation-free Te-GaSb (100) substrate

LVM Spectroscopy Investigation of Complex Defects in InAs Single Crystals Grown by the LEC Method

Mechanism of free electron concentration saturation phenomenon in Te-GaSb single crystal

Photoluminescene study acceptor defects in lightly doped n type GaSb single crystals

Improved surface and electrical properties of passivated GaSb with less alkaline sulfide solution

Vibration damage mechanism analysis on rotor of diesel generating set with rigid coupling

Electrical and optical property of annealed Te-doped GaSb

Improvement of the surface quality of semi-insulating InP substrates through a novel etching and cleaning method

Spatial and temporal variations of forest LAI in China during 2000-2010

Dual Function of the Third Component in Ternary Organic Solar Cells: Broaden the Spectrum and Optimize the Morphology

High‐Performance Fluorinated Fused‐Ring Electron Acceptor with 3D Stacking and Exciton/Charge Transport

LF-YOLO: A Lighter and Faster YOLO for Weld Defect Detection of X-ray Image

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