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CuO nanowires for inhibiting secondary electron emission

Journal of physics. D, Applied physics, 2013-04, Vol.46 (16), p.165104-1-6

2013

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Silver nanopillar coatings grown by glancing angle magnetron sputtering for reducing multipactor effect in spacecrafts

Applied surface science, 2020-10, Vol.526, p.146699, Article 146699

2020

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Multipactor prediction for on-board spacecraft RF equipment with the MEST software tool

IEEE transactions on plasma science, 2006-04, Vol.34 (2), p.476-484

2006

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Structural and optical evaluation of WOxNy films deposited by reactive magnetron sputtering

The Journal of physics and chemistry of solids, 2007-12, Vol.68 (12), p.2227-2232

2007

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Effect of surface reactions of low-energy carbon ions on the secondary electron emission of TiN:O thin films

Journal of applied physics, 2007-06, Vol.101 (11), p.113306-113306-6

2007

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Behavior of oxygen doped SiC thin films: An x-ray photoelectron spectroscopy study

Journal of applied physics, 2001-01, Vol.89 (1), p.212-216

2001

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Spectroscopic investigations of Cr, CrN and TiCr anti-multipactor coatings grown by cathodic-arc reactive evaporation

Applied surface science, 2007-07, Vol.253 (18), p.7627-7631

2007

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Photoelectron diffraction at the surface of amorphous carbon nitride

Applied physics letters, 2000-11, Vol.77 (21), p.3394-3396

2000

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Correlation of x-ray absorption and x-ray photoemission spectroscopies in amorphous carbon nitride

Physical review. B, Condensed matter, 1999-08, Vol.60 (6), p.R3705-R3708

1999

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Secondary electron emission and photoemission studies on surface films of carbon nitride

Journal of applied physics, 2006-02, Vol.99 (4), p.043513-043513-5

2006

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Carbon Incorporation during the Dielectric Breakdown Process of Silicon Oxide

Surface and interface analysis, 1997-02, Vol.25 (2), p.94-98

1997

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An XPS study of carbon nitride synthesized by ion beam nitridation of C 60 fullerene

Diamond and related materials, 1998-02, Vol.7 (2), p.402-406

1998

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Some considerations on the excitation mechanism in the inductively coupled argon plasma

Spectrochimica acta. Part B: Atomic spectroscopy, 1984, Vol.39 (4), p.537-550

de Galan, L.

1984

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Incorporation of OH radicals in anodic silicon oxide films studied by secondary-ion mass spectroscopy, X-ray photoelectron spectroscopy and ir analysis

Thin Solid Films, 1990, Vol.193 (1-2), p.325-332

1990

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A resonant photoemission study of the ZrO2 valence band

Surface science, 1994-04, Vol.307-309, p.848-853

1994

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Core level spectra of amorphous carbon nitride

The Journal of chemical physics, 2003-02, Vol.118 (8), p.3748-3755

2003

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Chemical shift resolved photoionization cross sections of amorphous carbon nitride

Physical review letters, 2000-09, Vol.85 (10), p.2132-2135

2000

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An XPS study of the interaction of oxygen with zirconium

Surface science, 1989-08, Vol.218 (2), p.331-345

1989

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X-ray photoelectron spectroscopy study of low-temperature molybdenum oxidation process

Journal of applied physics, 1999-06, Vol.85 (12), p.8415-8418

1999

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Effects of air exposure on amorphous carbon nitride surfaces

Journal of applied physics, 2002-07, Vol.92 (1), p.644-646

2002

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Disorder-induced vibration-mode coupling in SiO2 films observed under normal-incidence infrared radiation

Physical review. B, Condensed matter, 1994-08, Vol.50 (7), p.4881-4884

1994

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Influence of carbon on the electron stimulated desorption from titanium silicide surfaces

Surface science, 2003-03, Vol.528 (1), p.42-46

2003

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An X-ray photoelectron spectroscopy study of carbon nitride films grown by low energy ion implantation

Surface & coatings technology, 1996-09, Vol.83 (1), p.103-108

1996

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End-on observation of a horizontal low-flow inductively coupled plasma

Spectrochimica acta. Part B: Atomic spectroscopy, 1988, Vol.43 (6), p.773-781

1988

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Thermal oxidation of TiN studied by means of soft x-ray absorption spectroscopy

Journal of vacuum science & technology. A, Vacuum, surfaces, and films, 1993-01, Vol.11 (1), p.47-51

1993

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CuO nanowires for inhibiting secondary electron emission

Silver nanopillar coatings grown by glancing angle magnetron sputtering for reducing multipactor effect in spacecrafts

Multipactor prediction for on-board spacecraft RF equipment with the MEST software tool

Structural and optical evaluation of WOxNy films deposited by reactive magnetron sputtering

Effect of surface reactions of low-energy carbon ions on the secondary electron emission of TiN:O thin films

Behavior of oxygen doped SiC thin films: An x-ray photoelectron spectroscopy study

Spectroscopic investigations of Cr, CrN and TiCr anti-multipactor coatings grown by cathodic-arc reactive evaporation

Photoelectron diffraction at the surface of amorphous carbon nitride

Correlation of x-ray absorption and x-ray photoemission spectroscopies in amorphous carbon nitride

Secondary electron emission and photoemission studies on surface films of carbon nitride

Carbon Incorporation during the Dielectric Breakdown Process of Silicon Oxide

An XPS study of carbon nitride synthesized by ion beam nitridation of C 60 fullerene

Some considerations on the excitation mechanism in the inductively coupled argon plasma

Incorporation of OH radicals in anodic silicon oxide films studied by secondary-ion mass spectroscopy, X-ray photoelectron spectroscopy and ir analysis

A resonant photoemission study of the ZrO2 valence band

Core level spectra of amorphous carbon nitride

Chemical shift resolved photoionization cross sections of amorphous carbon nitride

An XPS study of the interaction of oxygen with zirconium

X-ray photoelectron spectroscopy study of low-temperature molybdenum oxidation process

Effects of air exposure on amorphous carbon nitride surfaces

Disorder-induced vibration-mode coupling in SiO2 films observed under normal-incidence infrared radiation

Influence of carbon on the electron stimulated desorption from titanium silicide surfaces

An X-ray photoelectron spectroscopy study of carbon nitride films grown by low energy ion implantation

End-on observation of a horizontal low-flow inductively coupled plasma

Thermal oxidation of TiN studied by means of soft x-ray absorption spectroscopy

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