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Scientific reports, 2021-09, Vol.11 (1), p.18036-18036, Article 18036
2021
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Journal of non-crystalline solids, 2002-05, Vol.303 (1), p.17-23
2002
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2022-04, Vol.516, p.15-22
2022
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Physical review letters, 2002-12, Vol.89 (25), p.256102-256102, Article 256102
2002
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Applied physics. A, Materials science & processing, 2006-05, Vol.83 (2), p.289-293
2006
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2004-06, Vol.219, p.856-861
2004
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2004-06, Vol.219, p.914-918
2004
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Applied physics letters, 1996-04, Vol.68 (17), p.2366-2368
1996
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Journal of applied physics, 1997-06, Vol.81 (12), p.8109-8111
1997
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Applied surface science, 2003-05, Vol.212-213, p.570-574
2003
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Applied physics letters, 1996-10, Vol.69 (16), p.2385-2387
1996
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High resolution depth profiling in silicon oxynitride films using narrow nuclear reaction resonances
1998
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1996-09, Vol.118 (1-4), p.499-504
1996
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1994-03, Vol.85 (1-4), p.248-254
1994
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1995-05, Vol.99 (1), p.462-467
1995
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Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 1995-03, Vol.96 (1), p.92-98
1995
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Applied surface science, 2003, Vol.212-13, p.570-574
2003
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