UB Paderborn / Katalog / Suche / in CDI

1 – 25 von 26

Sortiert nach

Damage in electron cryomicroscopy: Lessons from biology for materials science

MRS bulletin, 2019-12, Vol.44 (12), p.935-941

2019

Volltextzugriff (PDF)

Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Egerton, R. F

1, 2010

Volltextzugriff (PDF)

Optical and transient photoconductive properties of pentacene and functionalized pentacene thin films: Dependence on film morphology

Journal of applied physics, 2005-08, Vol.98 (3)

2005

Volltextzugriff (PDF)

Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imaging

Ultramicroscopy, 2001-04, Vol.87 (3), p.135-145

2001

Volltextzugriff (PDF)

Measurement of local thickness by electron energy-loss spectroscopy

Ultramicroscopy, 1987, Vol.21 (3), p.231-244

1987

Volltextzugriff (PDF)

Improved background-fitting algorithms for ionization edges in electron energy-loss spectra

Ultramicroscopy, 2002-07, Vol.92 (2), p.47-56

2002

Volltextzugriff (PDF)

Preparation and characterization of carbon nitride thin films

Thin solid films, 1996-06, Vol.279 (1), p.34-42

1996

Volltextzugriff (PDF)

Dose-rate dependence of electron-induced mass loss from organic specimens

Ultramicroscopy, 1999-12, Vol.80 (4), p.247-254

1999

Volltextzugriff (PDF)

Some practical consequences of the Lorentzian angular distribution of inelastic scattering

Ultramicroscopy, 1995-07, Vol.59 (1), p.169-180

1995

Volltextzugriff (PDF)

Oscillator-strength parameterization of inner-shell cross sections

Ultramicroscopy, 1993-05, Vol.50 (1), p.13-28

Egerton, R.F.

1993

Volltextzugriff (PDF)

Characterization of an analytical electron microscope with a NiO test specimen

Ultramicroscopy, 1994-07, Vol.55 (1), p.43-54

1994

Volltextzugriff (PDF)

Electronic structure of tin oxides by electron energy loss spectroscopy and real-space multiple scattering calculations

Physical review. B, Condensed matter and materials physics, 2005-01, Vol.71 (3), p.035103.1-035103.6, Article 035103

2005

Volltextzugriff (PDF)

Fabrication of SnxGe1-x thin films with non-equilibrium composition

Vacuum, 1996-12, Vol.47 (12), p.1419-1422

1996

Volltextzugriff (PDF)

Characterization and use of the Gatan 666 parallel-recording electron energy-loss spectrometer

Ultramicroscopy, 1993-03, Vol.48 (3), p.239-250

1993

Volltextzugriff (PDF)

EELS of “thick” specimens

Ultramicroscopy, 1991-12, Vol.38 (3), p.349-352

1991

Volltextzugriff (PDF)

Elemental analysis of thick amorphous specimens by EELS

Micron (Oxford, England : 1993), 1993, Vol.24 (3), p.251-256

1993

Volltextzugriff (PDF)

Absolute determination of surface atomic concentration by Reflection Electron Energy-Loss Spectroscopy (REELS)

Surface science, 1988-10, Vol.205 (1), p.25-37

1988

Volltextzugriff (PDF)

Assessment of electron irradiation damage to biomolecules by electron diffraction and electron energy-loss spectroscopy

Ultramicroscopy, 1984, Vol.15 (4), p.337-344

1984

Volltextzugriff (PDF)

Mass-thickness determination by Bethe-sum-rule normalization of the electron energy-loss spectrum

Ultramicroscopy, 1989, Vol.27 (1), p.9-18

1989

Volltextzugriff (PDF)

Surface free energies of lead telluride

Surface science, 1971-01, Vol.24 (2), p.647-650

Egerton, R.F.

1971

Volltextzugriff (PDF)

Corrections to the impulse approximation for use in electron compton scattering experiments

Chemical physics letters, 1982-01, Vol.88 (1), p.95-97

1982

Volltextzugriff (PDF)

Use of the field effect to determine the energy dependence of localized state density in amorphous semiconductors

Solid state communications, 1972-06, Vol.10 (11), p.1081-1083

Egerton, R.F.

1972

Volltextzugriff (PDF)

Epitaxial growth of KCl on mica

Thin solid films, 1970-01, Vol.5 (4), p.R41-R43

Egerton, R.F.

1970

Volltextzugriff (PDF)

The effect of oxygen on epitaxial PbTe, PbSe and PbS films

Thin solid films, 1969-01, Vol.4 (4), p.239-253

1969

Volltextzugriff (PDF)

The electrical effect of atomic hydrogen on lead telluride

Surface science, 1971-01, Vol.27 (1), p.117-124

1971

Volltextzugriff (PDF)

1 – 25 von 26

Suche als RSS-Feed

Aktive Filter

ThemaPhysics

Suchergebnisse filtern

Filter anzeigen

Nur zeigen

Geprüft (Peer-Review)
(24)
Mit Volltextzugriff
(26)

Publikationsform

Artikel
(25)
Bücher
(1)

Sprache

Erscheinungsjahr

n.n

Zeitschrift / Serie

5 weitere anzeigen...

Weniger anzeigen...

Menü

Weitere Dienste

Einstellungen

Damage in electron cryomicroscopy: Lessons from biology for materials science

Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Optical and transient photoconductive properties of pentacene and functionalized pentacene thin films: Dependence on film morphology

Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imaging

Measurement of local thickness by electron energy-loss spectroscopy

Improved background-fitting algorithms for ionization edges in electron energy-loss spectra

Preparation and characterization of carbon nitride thin films

Dose-rate dependence of electron-induced mass loss from organic specimens

Some practical consequences of the Lorentzian angular distribution of inelastic scattering

Oscillator-strength parameterization of inner-shell cross sections

Characterization of an analytical electron microscope with a NiO test specimen

Electronic structure of tin oxides by electron energy loss spectroscopy and real-space multiple scattering calculations

Fabrication of SnxGe1-x thin films with non-equilibrium composition

Characterization and use of the Gatan 666 parallel-recording electron energy-loss spectrometer

EELS of “thick” specimens

Elemental analysis of thick amorphous specimens by EELS

Absolute determination of surface atomic concentration by Reflection Electron Energy-Loss Spectroscopy (REELS)

Assessment of electron irradiation damage to biomolecules by electron diffraction and electron energy-loss spectroscopy

Mass-thickness determination by Bethe-sum-rule normalization of the electron energy-loss spectrum

Surface free energies of lead telluride

Corrections to the impulse approximation for use in electron compton scattering experiments

Use of the field effect to determine the energy dependence of localized state density in amorphous semiconductors

Epitaxial growth of KCl on mica

The effect of oxygen on epitaxial PbTe, PbSe and PbS films

The electrical effect of atomic hydrogen on lead telluride

Aktive Filter

Suchergebnisse filtern